ES2135551T3 - Dispositivo compacto y portatil para medir el coeficiente de reflexion de una estructura, cuando esta estructura se expone a una radiacion de hiperfrecuencia. - Google Patents

Dispositivo compacto y portatil para medir el coeficiente de reflexion de una estructura, cuando esta estructura se expone a una radiacion de hiperfrecuencia.

Info

Publication number
ES2135551T3
ES2135551T3 ES94402387T ES94402387T ES2135551T3 ES 2135551 T3 ES2135551 T3 ES 2135551T3 ES 94402387 T ES94402387 T ES 94402387T ES 94402387 T ES94402387 T ES 94402387T ES 2135551 T3 ES2135551 T3 ES 2135551T3
Authority
ES
Spain
Prior art keywords
hyperfrequency
low frequency
signals
reflection coefficient
generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES94402387T
Other languages
English (en)
Spanish (es)
Inventor
Gerard Pascal Piau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Group SAS
Original Assignee
Airbus Group SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Airbus Group SAS filed Critical Airbus Group SAS
Application granted granted Critical
Publication of ES2135551T3 publication Critical patent/ES2135551T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Radar Systems Or Details Thereof (AREA)
ES94402387T 1993-10-25 1994-10-24 Dispositivo compacto y portatil para medir el coeficiente de reflexion de una estructura, cuando esta estructura se expone a una radiacion de hiperfrecuencia. Expired - Lifetime ES2135551T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9312685A FR2711798B1 (fr) 1993-10-25 1993-10-25 Dispositif compact et portable pour mesurer le coefficient de réflexion d'une structure exposée à un rayonnement hyperfréquence.

Publications (1)

Publication Number Publication Date
ES2135551T3 true ES2135551T3 (es) 1999-11-01

Family

ID=9452171

Family Applications (1)

Application Number Title Priority Date Filing Date
ES94402387T Expired - Lifetime ES2135551T3 (es) 1993-10-25 1994-10-24 Dispositivo compacto y portatil para medir el coeficiente de reflexion de una estructura, cuando esta estructura se expone a una radiacion de hiperfrecuencia.

Country Status (6)

Country Link
US (1) US5502394A (fr)
EP (1) EP0650046B1 (fr)
CA (1) CA2134165C (fr)
DE (1) DE69419380T2 (fr)
ES (1) ES2135551T3 (fr)
FR (1) FR2711798B1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5886534A (en) * 1995-10-27 1999-03-23 The University Of Chicago Millimeter wave sensor for on-line inspection of thin sheet dielectrics
US5859535A (en) * 1997-02-12 1999-01-12 The United States Of America As Represented By The Secretary Of The Navy System for determining size and location of defects in material by use of microwave radiation
IL122273A (en) 1997-11-21 2001-07-24 Sela Semiconductor Eng Laboratories Remote resistivity measurement
US6172510B1 (en) 1998-12-30 2001-01-09 The United Sates Of America As Represented By The Secretary Of The Navy System for detection of flaws by use of microwave radiation
DE19926454C2 (de) * 1999-06-10 2002-02-28 Rohde & Schwarz Vektorieller Netzwerkanalysator
US7606592B2 (en) 2005-09-19 2009-10-20 Becker Charles D Waveguide-based wireless distribution system and method of operation
US8882759B2 (en) * 2009-12-18 2014-11-11 Covidien Lp Microwave ablation system with dielectric temperature probe
US8568404B2 (en) 2010-02-19 2013-10-29 Covidien Lp Bipolar electrode probe for ablation monitoring
US9488601B2 (en) * 2014-03-26 2016-11-08 Paneratech, Inc. Material erosion monitoring system and method
US9880110B2 (en) 2014-03-26 2018-01-30 Paneratech, Inc. Material erosion monitoring system and method
RU2757357C1 (ru) * 2020-05-12 2021-10-14 Российская Федерация, от имени которой выступает Министерство обороны Российской Федерации Способ измерения коэффициента отражения материала рефлектора
CN114965513B (zh) * 2022-05-26 2024-12-13 嘉兴市特种设备检验检测院 一种碳纤维缠绕ⅲ型储氢气瓶缺陷检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3025463A (en) * 1957-11-22 1962-03-13 Eino J Luoma Apparatus for measurement of complex reflection coefficient
US3562642A (en) * 1968-12-02 1971-02-09 Richard Hochschild Apparatus and method for measuring properties of materials by sensing signals responsive to both amplitude and phase changes in transmitted or reflected microwave energy
US3936736A (en) * 1974-08-28 1976-02-03 Lockheed Aircraft Corporation Radome test instrument
US4097796A (en) * 1977-02-18 1978-06-27 The Boeing Company Method for testing radomes
AT397584B (de) * 1989-12-29 1994-05-25 Pritzl Werner Dipl Ing Vorrichtung und verfahren zur bestimmung von amplituden- und phasengrössen in reflektometrischen messverfahren
US5233306A (en) * 1991-02-13 1993-08-03 The Board Of Regents Of The University Of Wisconsin System Method and apparatus for measuring the permittivity of materials
US5384543A (en) * 1992-11-09 1995-01-24 Martin Marietta Energy Systems, Inc. Portable microwave instrument for non-destructive evaluation of structural characteristics
US5371505A (en) * 1993-04-22 1994-12-06 Microwave Power Devices, Inc. Radome test systems and methods

Also Published As

Publication number Publication date
CA2134165C (fr) 2004-09-28
DE69419380T2 (de) 2000-04-06
US5502394A (en) 1996-03-26
CA2134165A1 (fr) 1995-04-26
DE69419380D1 (de) 1999-08-12
FR2711798B1 (fr) 1996-02-09
EP0650046B1 (fr) 1999-07-07
FR2711798A1 (fr) 1995-05-05
EP0650046A1 (fr) 1995-04-26

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