ES2164209T3 - Aparato y metodo para el ensayo no destructivo de material iluminado por radiacion coherente. - Google Patents

Aparato y metodo para el ensayo no destructivo de material iluminado por radiacion coherente.

Info

Publication number
ES2164209T3
ES2164209T3 ES96301533T ES96301533T ES2164209T3 ES 2164209 T3 ES2164209 T3 ES 2164209T3 ES 96301533 T ES96301533 T ES 96301533T ES 96301533 T ES96301533 T ES 96301533T ES 2164209 T3 ES2164209 T3 ES 2164209T3
Authority
ES
Spain
Prior art keywords
phase
marked
pictures
pressure
way
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES96301533T
Other languages
English (en)
Inventor
Steve Carl Jamieson Parker
Phillip Langley Salter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BAE Systems PLC
Original Assignee
BAE Systems PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BAE Systems PLC filed Critical BAE Systems PLC
Application granted granted Critical
Publication of ES2164209T3 publication Critical patent/ES2164209T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078—Caused by ambiguity
    • G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
    • G01B9/02081—Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02097—Self-interferometers
    • G01B9/02098—Shearing interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

UN APARATO OPTICO DE PRUEBAS NO DESTRUCTIVAS INCLUYE UN DISPOSITIVO INTERFEROMETRO MACH-ZEHNDER BIARMADO RECORTADO (1) Y DOS MEDIOS DE REGISTRO SEPARADOS (2,3). CUATRO CAMBIOS DE FASE DESPLAZADOS LATERALMENTE QUE MARCAN LAS IMAGENES PATRON DE UN MATERIAL, SON RECOGIDAS ANTES DE PRESIONARLES Y CUATRO CAMBIOS DE FASE DESPLAZADOS LATERALMENTE QUE MARCAN LAS IMAGENES PATRON SON RECOGIDAS DESPUES DE PRESIONARLAS. EL CAMBIO DE FASE ES EFECTUADO POR MEDIO DE UN TRANSDUCTOR PIEZOELECTRICO MONTADO EN UN ESPEJO (11) EL CUAL INCREMENTA LA LONGITUD DEL CAMINO DE UNO DE LOS BRAZOS DEL DISPOSITIVO (1). DE ESTA MANERA CUATRO IMAGENES SUCESIVAS SON GENERADAS Y GRABADAS SOBRE LOS MEDIOS DE REGISTRO SEPARADOS (2,3) CON UN SIMPLE CAMBIO DE FASE. LAS CUATRO IMAGENES PATRON MARCADAS Y RECOGIDAS ANTES DE LA PRESION, SON UTILIZADAS PARA DERIVAR UN PERFIL DE FASE MARCADO COMO SON LAS CUATRO IMAGENES TOMADAS DESPUES DE LA PRESION Y DOS PERFILES DE FASE MARCADOS SON DIFERENCIADOS PARA REVELAR LOS DEFECTOS DEL MATERIAL.
ES96301533T 1995-03-08 1996-03-06 Aparato y metodo para el ensayo no destructivo de material iluminado por radiacion coherente. Expired - Lifetime ES2164209T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9504675A GB2298710B (en) 1995-03-08 1995-03-08 Apparatus and method for non destructive testing of coherent radiation illumin ated material

Publications (1)

Publication Number Publication Date
ES2164209T3 true ES2164209T3 (es) 2002-02-16

Family

ID=10770862

Family Applications (1)

Application Number Title Priority Date Filing Date
ES96301533T Expired - Lifetime ES2164209T3 (es) 1995-03-08 1996-03-06 Aparato y metodo para el ensayo no destructivo de material iluminado por radiacion coherente.

Country Status (4)

Country Link
EP (1) EP0731335B1 (es)
DE (1) DE69617498T2 (es)
ES (1) ES2164209T3 (es)
GB (1) GB2298710B (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19650325A1 (de) * 1996-12-04 1998-06-10 Ettemeyer Gmbh & Co Mes Und Pr Verfahren und Vorrichtung zur Ermittlung von Verformungen und Dehnungen an gekrümmten Körpern
WO2001027583A1 (en) * 1999-10-13 2001-04-19 Hytec, Inc. Interferometric residual-stress analysis
DE10341714A1 (de) * 2003-09-10 2005-05-25 Nova Wave Light 01 Gmbh Optischer Sensor
CN100552431C (zh) * 2004-05-12 2009-10-21 中国科学院长春光学精密机械与物理研究所 激光散斑干涉测量方法及装置
DE102019113154A1 (de) * 2019-05-17 2020-11-19 Schenck Rotec Gmbh Verfahren und Vorrichtung zur Dehnungsmessung an einem fliehkraftbelasteten Körper
CN114235023B (zh) * 2021-11-18 2024-05-03 北京卫星制造厂有限公司 相移器在线标定方法及装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4036120C2 (de) * 1990-11-13 1994-06-23 Steinbichler Hans Verfahren zur Bestimmung der Wegänderung von Strahlen, insbesondere von Lichtstrahlen, und Vorrichtung zur Durchführung des Verfahrens

Also Published As

Publication number Publication date
DE69617498T2 (de) 2002-05-16
EP0731335A3 (en) 1997-12-29
EP0731335B1 (en) 2001-12-05
GB9504675D0 (en) 1995-05-03
DE69617498D1 (de) 2002-01-17
GB2298710B (en) 1999-05-26
EP0731335A2 (en) 1996-09-11
GB2298710A (en) 1996-09-11

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