ES2166831T3 - Medicion de espesores de capas utilizando retrodispersion de fotones de alta energia. - Google Patents

Medicion de espesores de capas utilizando retrodispersion de fotones de alta energia.

Info

Publication number
ES2166831T3
ES2166831T3 ES95928920T ES95928920T ES2166831T3 ES 2166831 T3 ES2166831 T3 ES 2166831T3 ES 95928920 T ES95928920 T ES 95928920T ES 95928920 T ES95928920 T ES 95928920T ES 2166831 T3 ES2166831 T3 ES 2166831T3
Authority
ES
Spain
Prior art keywords
photons
source
substrate
thickness
paint
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES95928920T
Other languages
English (en)
Inventor
Innes K Mackenzie
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Guelph
Original Assignee
University of Guelph
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Guelph filed Critical University of Guelph
Application granted granted Critical
Publication of ES2166831T3 publication Critical patent/ES2166831T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B12/00—Arrangements for controlling delivery; Arrangements for controlling the spray area
    • B05B12/08—Arrangements for controlling delivery; Arrangements for controlling the spray area responsive to condition of liquid or other fluent material to be discharged, of ambient medium or of target ; responsive to condition of spray devices or of supply means, e.g. pipes, pumps or their drive means
    • B05B12/084—Arrangements for controlling delivery; Arrangements for controlling the spray area responsive to condition of liquid or other fluent material to be discharged, of ambient medium or of target ; responsive to condition of spray devices or of supply means, e.g. pipes, pumps or their drive means responsive to condition of liquid or other fluent material already sprayed on the target, e.g. coating thickness, weight or pattern
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B16/00—Spray booths
    • B05B16/20—Arrangements for spraying in combination with other operations, e.g. drying; Arrangements enabling a combination of spraying operations
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B64—AIRCRAFT; AVIATION; COSMONAUTICS
    • B64D—EQUIPMENT FOR FITTING IN OR TO AIRCRAFT; FLIGHT SUITS; PARACHUTES; ARRANGEMENT OR MOUNTING OF POWER PLANTS OR PROPULSION TRANSMISSIONS IN AIRCRAFT
    • B64D15/00—De-icing or preventing icing on exterior surfaces of aircraft
    • B64D15/20—Means for detecting icing or initiating de-icing

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

EN LA PRESENTE INVENCION SE PRESENTAN UN METODO Y UN APARATO PARA LA MEDICION NO DESTRUCTIVA, IN SITU, DEL GROSOR DE LAS CAPAS DISPUESTAS SOBRE SUSTRATOS. EN EL METODO Y EL DISPOSITIVO SE HACE USO DE UNA SONDA DE UNA FUENTE RADIOACTIVA Y DE UN FOTODETECTOR MONTADO DETRAS DE LA FUENTE PARA LA DETECCION DE LOS FOTONES RETRODIFUNDIDOS. EN UN ASPECTO, EL METODO SE UTILIZA PARA MEDIR EL GROSOR DE LA PINTURA DEPOSITADA SOBRE ACERO GALVANIZADO TAL COMO LA UTILIZADA EN VEHICULOS. UNA FUENTE QUE CONTIENE {SUP,109}CD RADIOACTIVO QUE PRODUCE FOTONES DE ALTA ENERGIA CON UNA ENERGIA DE 23 Y 25 KEV SE SEPARA DE LA SUPERFICIE PINTADA DE MODO QUE LOS FOTONES CHOQUEN CONTRA EL SUSTRATO PINTADO. LA INTENSIDAD DE FOTONES RETRODIFUNDIDO POR UNA DIFUSION COMPTON EN LA CAPA DE PINTURA ES PROPORCIONAL A LA DENSIDAD DE MASA DE LA PINTURA PARA OBTENER ASI UNA MEDICION DIRECTA DEL GROSOR DE LA PINTURA. LOS FOTONES QUE PENETRAN A TRAVES DEL SUSTRATO SON ABSORBIDOS DENTRO DEL SUSTRATO. EN OTRO ASPECTO, EL METODO SE UTILIZA PARA MEDIR EL GROSOR DEL HIELO EN SUPERFICIES AERODINAMICAS. LA SONDA SE MONTA EN EL INTERIOR DE LA SUPERFICIE AERODINAMICA Y LA FUENTE ES DE {SUP,241}AM QUE PRODUCE FOTONES DE 60 KEV QUE PENETRAN A TRAVES DEL SUSTRATO DE LA SUPERFICIE AERODINAMICA Y SON RETRODIFUNDIDOS DENTRO DE LA CAPA DE HIELO Y DE VUELTA A TRAVES DEL SUSTRATO DE LA SUPERFICIE AERODINAMICA HASTA EL DETECTOR. LAS FORMA Y DENSIDAD DEL SOPORTE DE LA FUENTE ADEMAS DE LA DISPOSICION GEOMETRICA DE LA FUENTE Y DEL DETECTOR RESPECTO AL SUSTRATO DE LA SUPERFICIE AERODINAMICA SE UTILIZAN PARA BLOQUEAR LOS FOTONES RETRODIFUNDIDOS POR EL SUSTRATO DE LA SUPERFICIE AERODINAMICA PARA FAVORECER ASI LA DIFUSION POR LA CAPA DE HIELO RESPECTO A LA DIFUSION POR EL ALUMINIO.
ES95928920T 1994-08-30 1995-08-30 Medicion de espesores de capas utilizando retrodispersion de fotones de alta energia. Expired - Lifetime ES2166831T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9417419A GB9417419D0 (en) 1994-08-30 1994-08-30 Method of measuring film thickness and monitoring liquid flow using backscattered x-rays and gamma-rays

Publications (1)

Publication Number Publication Date
ES2166831T3 true ES2166831T3 (es) 2002-05-01

Family

ID=10760558

Family Applications (1)

Application Number Title Priority Date Filing Date
ES95928920T Expired - Lifetime ES2166831T3 (es) 1994-08-30 1995-08-30 Medicion de espesores de capas utilizando retrodispersion de fotones de alta energia.

Country Status (8)

Country Link
US (1) US6252930B1 (es)
EP (1) EP0805949B1 (es)
AU (1) AU3250095A (es)
CA (1) CA2198712A1 (es)
DE (1) DE69523476T2 (es)
ES (1) ES2166831T3 (es)
GB (1) GB9417419D0 (es)
WO (1) WO1996007077A1 (es)

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US6816101B2 (en) * 2002-03-08 2004-11-09 Quelian, Inc. High-speed analog-to-digital converter using a unique gray code
US20050129178A1 (en) * 2003-12-16 2005-06-16 Pettit John W. Detector using carbon nanotube material as cold cathode for synthetic radiation source
NZ538649A (en) 2005-03-07 2006-10-27 Inst Geolog Nuclear Sciences Estimating strengths of wooden supports using gamma rays
US7605366B2 (en) 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
DE102008017838A1 (de) 2008-04-08 2009-12-10 Dürr Systems GmbH Lackieranlage mit einer Messzelle zur Schichtdickenmessung
US8767912B1 (en) 2013-04-09 2014-07-01 King Abdulaziz University System for inspection and imaging of insulated pipes and vessels using backscattered radiation and X-ray fluorescence
US9151722B2 (en) 2014-01-15 2015-10-06 King Abdulaziz University Systems for determining and imaging wax deposition and simultaneous corrosion and wax deposit determination in pipelines
US8976936B1 (en) 2014-05-22 2015-03-10 King Abdulaziz University Collimator for backscattered radiation imaging and method of using the same
US20160274039A1 (en) 2014-09-25 2016-09-22 King Abdulaziz University System for determining and imaging wax deposition and corrosion in pipelines
US9020099B1 (en) 2014-12-03 2015-04-28 King Abdulaziz University Miniaturized pipe inspection system for measuring corrosion and scale in small pipes
US10071482B2 (en) * 2015-08-19 2018-09-11 Ford Global Technologies, Llc Robotic vehicle painting instrument including a terahertz radiation device
JP6550101B2 (ja) * 2017-07-13 2019-07-24 Ｊｆｅテクノリサーチ株式会社 膜厚測定方法及び膜厚測定装置
CN108466106B (zh) * 2018-06-22 2023-08-01 江苏速力达精密科技有限公司 一种轮毂加工中心机内检测装置
US11614324B2 (en) 2019-10-24 2023-03-28 International Business Machines Corporation Non-destructive bond line thickness measurement of thermal interface material on silicon packages

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US2926257A (en) 1955-05-16 1960-02-23 Friedman Herbert Method of measuring the thickness of thin coatings
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US3012140A (en) 1959-01-28 1961-12-05 United States Steel Corp Apparatus for measuring the thickness of a coating on a base material
US3115577A (en) 1962-05-03 1963-12-24 Twin City Testing Corp Measuring table for use in coating thickness measuring
US3412249A (en) 1964-08-04 1968-11-19 Industrial Nucleonics Corp Backscatter thickness measuring gauge utilizing different energy levels of bremsstrahlung and two ionization chambers
US3483382A (en) 1965-12-23 1969-12-09 Twin City Testing Corp Self-stabilizing portable probe for measuring thickness utilizing radiation
US3499152A (en) 1966-03-18 1970-03-03 Industrial Nucleonics Corp Method and apparatus for improving backscatter gauge response
US3539808A (en) 1966-04-22 1970-11-10 Industrial Nucleonics Corp Measuring corrosion on a coated metallic surface by means of backscattered nuclear radiation
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JPS538165A (en) 1976-07-12 1978-01-25 Seiko Instr & Electronics Ltd Thickness measuring method of thin film material and thin film material thickness measuring apparatus
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Also Published As

Publication number Publication date
EP0805949A1 (en) 1997-11-12
AU3250095A (en) 1996-03-22
DE69523476T2 (de) 2002-05-16
MX9701633A (es) 1998-10-31
GB9417419D0 (en) 1994-10-19
US6252930B1 (en) 2001-06-26
EP0805949B1 (en) 2001-10-24
CA2198712A1 (en) 1996-03-07
WO1996007077A1 (en) 1996-03-07
DE69523476D1 (de) 2001-11-29

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