ES2177471A1 - Aparato para caracterizacion optica utilizando imagenes controladas automaticamente. - Google Patents

Aparato para caracterizacion optica utilizando imagenes controladas automaticamente.

Info

Publication number
ES2177471A1
ES2177471A1 ES200101231A ES200101231A ES2177471A1 ES 2177471 A1 ES2177471 A1 ES 2177471A1 ES 200101231 A ES200101231 A ES 200101231A ES 200101231 A ES200101231 A ES 200101231A ES 2177471 A1 ES2177471 A1 ES 2177471A1
Authority
ES
Spain
Prior art keywords
images
optical
examined
automatically
controlled images
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES200101231A
Other languages
English (en)
Other versions
ES2177471B2 (es
Inventor
Martinez Eusebio Bernabeu
Fernandez Jose Alonso
Boutureira Hector Canabal
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad Complutense de Madrid
Original Assignee
Universidad Complutense de Madrid
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universidad Complutense de Madrid filed Critical Universidad Complutense de Madrid
Priority to ES200101231A priority Critical patent/ES2177471B2/es
Priority to EP20020732781 priority patent/EP1406059A1/en
Priority to PCT/ES2002/000257 priority patent/WO2002097361A1/es
Publication of ES2177471A1 publication Critical patent/ES2177471A1/es
Application granted granted Critical
Publication of ES2177471B2 publication Critical patent/ES2177471B2/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0285—Testing optical properties by measuring material or chromatic transmission properties

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Microscoopes, Condenser (AREA)
  • Eyeglasses (AREA)

Abstract

Aparato para caracterización óptica utilizando imágenes controladas automáticamente. Método de caracterización óptica que utiliza imágenes controladas automáticamente, que comprende un sistema que muestra imágenes, un sistema que capta dichas imágenes y un sistema que controla los dos anteriores y analiza la información de las imágenes captadas. El elemento óptico a examinar se coloca de forma tal que los rayos de luz procedentes del sistema formador de imagen atraviesen, o se reflejen, en el objeto a examinar. El análisis de la o las imágenes registradas permite obtener una o varias de las características ópticas del objeto examinado. El control de las imágenes utilizadas permite ajustar las características de la medida (rango, sensibilidad, velocidad, etc) de manera óptima según los requerimientos específicos.
ES200101231A 2001-05-29 2001-05-29 Aparato para caracterizacion optica utilizando imagenes controladas automaticamente. Expired - Fee Related ES2177471B2 (es)

Priority Applications (3)

Application Number Priority Date Filing Date Title
ES200101231A ES2177471B2 (es) 2001-05-29 2001-05-29 Aparato para caracterizacion optica utilizando imagenes controladas automaticamente.
EP20020732781 EP1406059A1 (en) 2001-05-29 2002-05-29 Optical characterisation device using automatically-controlled images
PCT/ES2002/000257 WO2002097361A1 (es) 2001-05-29 2002-05-29 Aparato para caracterizacion optica utilizando imagenes controladas automaticamente

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES200101231A ES2177471B2 (es) 2001-05-29 2001-05-29 Aparato para caracterizacion optica utilizando imagenes controladas automaticamente.

Publications (2)

Publication Number Publication Date
ES2177471A1 true ES2177471A1 (es) 2002-12-01
ES2177471B2 ES2177471B2 (es) 2003-11-01

Family

ID=8497879

Family Applications (1)

Application Number Title Priority Date Filing Date
ES200101231A Expired - Fee Related ES2177471B2 (es) 2001-05-29 2001-05-29 Aparato para caracterizacion optica utilizando imagenes controladas automaticamente.

Country Status (3)

Country Link
EP (1) EP1406059A1 (es)
ES (1) ES2177471B2 (es)
WO (1) WO2002097361A1 (es)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5440383A (en) * 1992-04-01 1995-08-08 Essilor International (Compagnie General D'optique) Phase detection deflectometer-type optical device having a large measuring range
EP0811780A2 (de) * 1996-06-08 1997-12-10 SEW-EURODRIVE GMBH & CO. Elektromagnetisch betätigte Bremse
JP2000097657A (ja) * 1998-09-21 2000-04-07 Nikon Corp 干渉計
US20010026367A1 (en) * 1997-08-26 2001-10-04 Nikon Corporation Method and apparatus for inspecting optical device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5440383A (en) * 1992-04-01 1995-08-08 Essilor International (Compagnie General D'optique) Phase detection deflectometer-type optical device having a large measuring range
EP0811780A2 (de) * 1996-06-08 1997-12-10 SEW-EURODRIVE GMBH & CO. Elektromagnetisch betätigte Bremse
US20010026367A1 (en) * 1997-08-26 2001-10-04 Nikon Corporation Method and apparatus for inspecting optical device
JP2000097657A (ja) * 1998-09-21 2000-04-07 Nikon Corp 干渉計

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
BASE DE DATOS ESP@CENET TEST-12 & JP 2000097657 A (NIKON CORP.) 07.04.2000 *
CANABAL, H. et al. "Improved phase-shifting method for automatic processing of moirÉ deflectograms" APPLIED OPTICS, Vol. 37, No 26, 10 Septiembre 1998, paginas 6227-6228; figuras 1,2. *
J.H. MASSIG "Measurement of phase objects by simple means" APPLIED OPTICS, Vol. 38, No 19, 1 Julio 1999, pagina 4103; figura 1. *

Also Published As

Publication number Publication date
WO2002097361A1 (es) 2002-12-05
EP1406059A1 (en) 2004-04-07
ES2177471B2 (es) 2003-11-01

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