|
US5980513A
(en)
|
1994-04-25 |
1999-11-09 |
Autonomous Technologies Corp. |
Laser beam delivery and eye tracking system
|
|
US5973772A
(en)
*
|
1996-01-10 |
1999-10-26 |
Kabushiki Kaisha Topcon |
Layout judgment apparatus and layout judgment system
|
|
JP3685886B2
(ja)
*
|
1996-09-30 |
2005-08-24 |
株式会社トプコン |
レンズメーター
|
|
JP3647991B2
(ja)
*
|
1996-09-30 |
2005-05-18 |
株式会社トプコン |
レンズメーター
|
|
US6271914B1
(en)
|
1996-11-25 |
2001-08-07 |
Autonomous Technologies Corporation |
Objective measurement and correction of optical systems using wavefront analysis
|
|
JP3886191B2
(ja)
*
|
1996-12-20 |
2007-02-28 |
株式会社トプコン |
レンズメーター
|
|
US5855074A
(en)
*
|
1997-12-07 |
1999-01-05 |
Visionix Ltd. |
Methods and apparatus for measuring and mapping opthalmic elements
|
|
US6819414B1
(en)
|
1998-05-19 |
2004-11-16 |
Nikon Corporation |
Aberration measuring apparatus, aberration measuring method, projection exposure apparatus having the same measuring apparatus, device manufacturing method using the same measuring method, and exposure method
|
|
US6791696B1
(en)
|
1998-06-18 |
2004-09-14 |
Optikos Corporation |
Automated optical measurement apparatus and method
|
|
US6598975B2
(en)
*
|
1998-08-19 |
2003-07-29 |
Alcon, Inc. |
Apparatus and method for measuring vision defects of a human eye
|
|
US6222621B1
(en)
|
1998-10-12 |
2001-04-24 |
Hoyo Corporation |
Spectacle lens evaluation method and evaluation device
|
|
US6750958B1
(en)
|
1999-06-09 |
2004-06-15 |
Optikos Corporation |
Automated optical measurement apparatus and method
|
|
IL130465A0
(en)
|
1999-06-14 |
2000-06-01 |
Prolaser Ltd |
Method and apparatus for measuring power of an optical element for its mapping
|
|
US7242464B2
(en)
*
|
1999-06-24 |
2007-07-10 |
Asml Holdings N.V. |
Method for characterizing optical systems using holographic reticles
|
|
US7016025B1
(en)
*
|
1999-06-24 |
2006-03-21 |
Asml Holding N.V. |
Method and apparatus for characterization of optical systems
|
|
US6396588B1
(en)
*
|
1999-10-06 |
2002-05-28 |
Trw Inc. |
Hybrid curvature-tilt wave front sensor
|
|
JP4549468B2
(ja)
*
|
1999-12-28 |
2010-09-22 |
株式会社トプコン |
レンズメータ
|
|
US6381012B1
(en)
*
|
2000-01-20 |
2002-04-30 |
Virgil Thomas Yancy |
System, method and article of manufacture to determine and communicate optical lens sizing and prescription information
|
|
US6222495B1
(en)
*
|
2000-02-25 |
2001-04-24 |
Channel Master Llc |
Multi-beam antenna
|
|
US6234631B1
(en)
|
2000-03-09 |
2001-05-22 |
Lasersight Technologies, Inc. |
Combination advanced corneal topography/wave front aberration measurement
|
|
US6394999B1
(en)
|
2000-03-13 |
2002-05-28 |
Memphis Eye & Cataract Associates Ambulatory Surgery Center |
Laser eye surgery system using wavefront sensor analysis to control digital micromirror device (DMD) mirror patterns
|
|
DE10014334C2
(de)
*
|
2000-03-24 |
2002-03-21 |
Zeiss Carl |
Vorrichtung und Verfahren zur ortsaufgelösten Brechkraft-Bestimmung
|
|
AR031570A1
(es)
|
2000-04-19 |
2003-09-24 |
Alcon Inc |
Aparato sensor de frentes de onda
|
|
US6565209B2
(en)
|
2000-04-25 |
2003-05-20 |
Alcon Universal Ltd. |
Range-extending system and spatial filter for enhancing Hartmann-Shack images and associated methods
|
|
AU781722B2
(en)
|
2000-04-25 |
2005-06-09 |
Alcon Refractivehorizons, Inc. |
Spatial filter for enhancing Hartmann-Shack images and associated methods
|
|
US6460997B1
(en)
|
2000-05-08 |
2002-10-08 |
Alcon Universal Ltd. |
Apparatus and method for objective measurements of optical systems using wavefront analysis
|
|
FR2813391B1
(fr)
*
|
2000-08-22 |
2002-11-29 |
Essilor Int |
Procede et appareil de mesure en transmission de la structure geometrique d'un composant optique
|
|
US6577447B1
(en)
|
2000-10-20 |
2003-06-10 |
Nikon Corporation |
Multi-lens array of a wavefront sensor for reducing optical interference and method thereof
|
|
US6548797B1
(en)
|
2000-10-20 |
2003-04-15 |
Nikon Corporation |
Apparatus and method for measuring a wavefront using a screen with apertures adjacent to a multi-lens array
|
|
DE60204495T2
(de)
*
|
2001-02-09 |
2006-03-16 |
Hoya Corp. |
Linsenmesser zur Messung der Eigenschaft eines Brillenglases oder einer Kontaktlinse
|
|
AUPR419301A0
(en)
*
|
2001-04-03 |
2001-05-03 |
Solar Systems Pty Ltd |
Solar mirror testing and alignment
|
|
US6806965B2
(en)
*
|
2001-05-22 |
2004-10-19 |
Zygo Corporation |
Wavefront and intensity analyzer for collimated beams
|
|
US6561648B2
(en)
|
2001-05-23 |
2003-05-13 |
David E. Thomas |
System and method for reconstruction of aberrated wavefronts
|
|
DE10146499B4
(de)
*
|
2001-09-21 |
2006-11-09 |
Carl Zeiss Smt Ag |
Verfahren zur Optimierung der Abbildungseigenschaften von mindestens zwei optischen Elementen sowie Verfahren zur Optimierung der Abbildungseigenschaften von mindestens drei optischen Elementen
|
|
EP1507135B1
(en)
|
2002-05-16 |
2008-09-17 |
Hoya Corporation |
Method and device for evaluating spectacle lens or mold for molding spectacle lens, and method and system for manufacturing spectacle lens
|
|
EP1511978A4
(en)
*
|
2002-05-31 |
2008-03-05 |
Wavefront Sciences Inc |
METHOD AND SYSTEM FOR DETECTING AND ANALYZING THE WAVE FRONT OF AN OPTICAL TRANSMISSION SYSTEM
|
|
US20040021826A1
(en)
*
|
2002-08-01 |
2004-02-05 |
Sarver Edwin J. |
Combination advanced corneal topography/wave front aberration measurement
|
|
DE10245473A1
(de)
*
|
2002-09-28 |
2004-04-08 |
Leica Microsystems Semiconductor Gmbh |
Strukturbreiten-Messgerät
|
|
JP2004125664A
(ja)
*
|
2002-10-03 |
2004-04-22 |
Hamamatsu Photonics Kk |
位相分布計測装置
|
|
GB2395289A
(en)
*
|
2002-11-11 |
2004-05-19 |
Qinetiq Ltd |
Structured light generator
|
|
GB2395262A
(en)
*
|
2002-11-11 |
2004-05-19 |
Qinetiq Ltd |
Optical proximity sensor with array of spot lights and a mask
|
|
GB2395261A
(en)
*
|
2002-11-11 |
2004-05-19 |
Qinetiq Ltd |
Ranging apparatus
|
|
WO2004068088A2
(en)
*
|
2003-01-27 |
2004-08-12 |
Oraxion |
Optical characterization of surfaces and plates
|
|
CN100343622C
(zh)
*
|
2003-05-29 |
2007-10-17 |
中国科学院光电技术研究所 |
微透镜结构参数及面形畸变的快速检测方法
|
|
DE10325841A1
(de)
|
2003-06-06 |
2004-12-30 |
Acritec Gmbh |
Intraokularlinse
|
|
DE10327019A1
(de)
|
2003-06-12 |
2004-12-30 |
Carl Zeiss Sms Gmbh |
Verfahren zur Bestimmung der Abbildungsgüte eines optischen Abbildungssystems
|
|
DE10348509A1
(de)
*
|
2003-10-18 |
2005-05-19 |
Carl Zeiss Jena Gmbh |
Wellenfrontsensor
|
|
US7532749B2
(en)
*
|
2003-11-18 |
2009-05-12 |
Panasonic Corporation |
Light processing apparatus
|
|
FR2878973B1
(fr)
*
|
2004-12-03 |
2007-04-20 |
Essilor Int |
Dispositif de mesure automatique de caracteristiques d'une lentille ophtalmique
|
|
FR2879736B1
(fr)
*
|
2004-12-20 |
2007-02-02 |
Essilor Int |
Procede et dispositif de mesure sans contact de la courbure d'un objet ophtalmique
|
|
FR2880118B1
(fr)
*
|
2004-12-23 |
2007-03-02 |
Essilor Int |
Procede et appareil de mesure locale des caracteristiques de refraction d'une lentille en un ou plusieurs points specifiques de cette lentille
|
|
US20060186312A1
(en)
*
|
2005-02-23 |
2006-08-24 |
Zino Altman |
Apparatus and method for optical wavefront analysis using active light modulation
|
|
DE202005004934U1
(de)
|
2005-03-23 |
2005-06-09 |
Oculus Optikgeräte GmbH |
Messeinrichtung zum Messen der Refraktionseigenschaften optischer Linsen
|
|
DE202005009847U1
(de)
|
2005-03-23 |
2005-10-20 |
Oculus Optikgeräte GmbH |
Messeinrichtung zum Messen der Refraktionseigenschaften optischer Linsen
|
|
JP4683270B2
(ja)
*
|
2005-03-30 |
2011-05-18 |
株式会社ニデック |
レンズメータ
|
|
EP1785714B1
(en)
|
2005-11-15 |
2017-02-22 |
Olympus Corporation |
Lens evaluation device
|
|
DE102007003681B4
(de)
|
2006-02-10 |
2017-11-30 |
Hochschule Bremen |
Verfahren und Vorrichtung zur Analyse einer optischen Einrichtung
|
|
CA2645670C
(en)
|
2006-03-14 |
2016-12-06 |
Amo Manufacturing Usa, Llc |
Spatial frequency wavefront sensor system and method
|
|
DE102006033779B4
(de)
*
|
2006-07-21 |
2012-09-20 |
Karlsruher Institut für Technologie |
Verfahren zur Vermessung einer reflektierenden Oberfläche
|
|
JP2008082874A
(ja)
*
|
2006-09-27 |
2008-04-10 |
Fujitsu Ltd |
測定装置および測定方法
|
|
US20080129984A1
(en)
*
|
2006-12-01 |
2008-06-05 |
Sol Focus, Inc. |
Inspection of optical elements
|
|
ES2656421T3
(es)
|
2007-08-21 |
2018-02-27 |
Visionix Ltd. |
Sistema multifuncional de medición oftálmica y procedimiento correspondiente
|
|
EP2189777B1
(en)
|
2007-08-31 |
2020-01-01 |
Hoya Corporation |
Method and device for evaluating graduated refraction power lens and method for manufacturing graduated refraction power lens
|
|
WO2009028684A1
(ja)
|
2007-08-31 |
2009-03-05 |
Hoya Corporation |
レンズ評価方法、レンズ評価装置及びレンズ製造方法、並びにレンズ特性表示方法
|
|
CN101918178B
(zh)
|
2007-11-30 |
2013-07-10 |
依视路国际集团(光学总公司) |
透镜制造过程的控制过程
|
|
US7802883B2
(en)
|
2007-12-20 |
2010-09-28 |
Johnson & Johnson Vision Care, Inc. |
Cosmetic contact lenses having a sparkle effect
|
|
KR101441309B1
(ko)
*
|
2008-01-28 |
2014-09-17 |
삼성디스플레이 주식회사 |
디스플레이 시스템
|
|
JP2010133980A
(ja)
*
|
2010-03-04 |
2010-06-17 |
Nikon Corp |
検査装置、該検査装置を備えた露光装置、およびマイクロデバイスの製造方法
|
|
JP5712454B2
(ja)
*
|
2010-04-28 |
2015-05-07 |
東海光学株式会社 |
セミフィニッシュトブランクの測定方法及び加工方法
|
|
CN102338693A
(zh)
*
|
2010-07-20 |
2012-02-01 |
上海雄博精密仪器股份有限公司 |
一种渐进多焦点镜片的检测方法和装置
|
|
US9366884B2
(en)
|
2011-03-03 |
2016-06-14 |
Visionix Ltd. |
Automatic lens mapping system
|
|
CN102928196A
(zh)
*
|
2011-08-10 |
2013-02-13 |
上海雄博精密仪器股份有限公司 |
自由曲面镜片的检测方法和装置
|
|
WO2014019806A1
(en)
*
|
2012-07-31 |
2014-02-06 |
Essilor International (Compagnie Générale d'Optique) |
Method and system for identification of a given geometrical feature of an optical component
|
|
JP6080427B2
(ja)
*
|
2012-08-10 |
2017-02-15 |
キヤノン株式会社 |
シャック・ハルトマンセンサとそれを利用した波面計測方法
|
|
CN104704339A
(zh)
|
2012-09-28 |
2015-06-10 |
诺华股份有限公司 |
一种用于眼透镜的中心厚度的自动化线内确定的方法
|
|
CN104662402B
(zh)
*
|
2012-09-28 |
2018-10-02 |
诺华股份有限公司 |
用于眼透镜的屈光力的自动化线内确定的方法
|
|
US8941825B2
(en)
|
2013-03-15 |
2015-01-27 |
Owens-Brockway Glass Container Inc. |
Container inspection
|
|
FR3017964B1
(fr)
|
2014-02-27 |
2016-03-25 |
Essilor Int |
Instrument optique pour reperer au moins un point caracteristique d'une lentille ophtalmique
|
|
FR3017963B1
(fr)
|
2014-02-27 |
2016-03-25 |
Essilor Int |
Instrument optique pour identifier et localiser des microgravures presentes sur une lentille ophtalmique
|
|
CN103954434B
(zh)
*
|
2014-04-16 |
2016-05-11 |
青岛歌尔声学科技有限公司 |
一种光轴校准治具、系统及方法
|
|
US9491863B2
(en)
|
2014-06-26 |
2016-11-08 |
Align Technology, Inc. |
Mounting system that maintains stability of optics as temperature changes
|
|
CN104198164B
(zh)
*
|
2014-09-19 |
2017-02-15 |
中国科学院光电技术研究所 |
一种基于哈特曼波前检测原理的检焦方法
|
|
DE102016209720A1
(de)
*
|
2016-06-02 |
2017-12-07 |
Humanoptics Ag |
Verfahren zur Prüfung individuell hergestellter Intraokularlinsen
|
|
WO2018218605A1
(zh)
*
|
2017-06-01 |
2018-12-06 |
大族激光科技产业集团股份有限公司 |
激光清洗镜头
|
|
EP3859438B1
(en)
*
|
2018-09-28 |
2026-04-01 |
Hoya Lens Thailand Ltd. |
Curved face shape evaluation method, eyeglass lens manufacturing method, and eyeglass lens
|
|
GB2580946A
(en)
*
|
2019-01-31 |
2020-08-05 |
Eyoto Group Ltd |
Methods and apparatus for determining prism in a lens
|
|
BR112022000943A2
(pt)
*
|
2019-10-07 |
2022-06-28 |
Essilor Int |
Caracterização de um elemento óptico
|
|
DE102021211596A1
(de)
|
2020-10-14 |
2022-04-14 |
Emage Vision PTE, Ltd. |
Analyse- und nachverfolgungssystem für fehler an kontaktlinsen
|
|
WO2022132797A1
(en)
*
|
2020-12-15 |
2022-06-23 |
Quartus Engineering Incorporated |
Wavefront sensors with irregular aperture masks, diffusers, and cameras, and methods of making and using the same
|