ES2182907T3 - Aparato para cartografiar elementos opticos. - Google Patents

Aparato para cartografiar elementos opticos.

Info

Publication number
ES2182907T3
ES2182907T3 ES95924219T ES95924219T ES2182907T3 ES 2182907 T3 ES2182907 T3 ES 2182907T3 ES 95924219 T ES95924219 T ES 95924219T ES 95924219 T ES95924219 T ES 95924219T ES 2182907 T3 ES2182907 T3 ES 2182907T3
Authority
ES
Spain
Prior art keywords
light
ray
optical element
optical elements
cartograph
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES95924219T
Other languages
English (en)
Inventor
Marc Abitbol
Ariel Blum
Alain Halimi
Eli Meimoun
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Visionix Ltd
Original Assignee
Visionix Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from IL11001694A external-priority patent/IL110016A/xx
Priority claimed from IL11317295A external-priority patent/IL113172A/xx
Application filed by Visionix Ltd filed Critical Visionix Ltd
Application granted granted Critical
Publication of ES2182907T3 publication Critical patent/ES2182907T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

LA INVENCION SE RELACIONA CON UN APARATO PARA REPRESENTAR ELEMENTOS OPTICOS, EL CUAL COMPRENDE UNA FUENTE DE LUZ DISPUESTA DE FORMA QUE TRANSMITA UN RAYO DE LUZ HACIA UN ELEMENTO OPTICO; UN SEPARADOR DE RAYOS QUE INCLUYE UNA PLURALIDAD DE ELEMENTOS DIVISORES DE RAYOS QUE SIRVEN PARA DIVIDIR EL RAYO DE LUZ EN UNA PLURALIDAD CORRESPONDIENTE DE PORCIONES DE RAYOS DE LUZ; UN DISPOSITIVO SENSOR OPTICO QUE SIRVE PARA GENERAR UN MAPA DE PUNTOS LUMINOSOS QUE INCLUYE UNA PLURALIDAD DE PUNTOS LUMINOSOS QUE SE CORRESPONDEN CON DICHA PLURALIDAD DE ELEMENTOS DIVISORES DE LOS RAYOS; Y UN DISPOSITIVO DE CALCULO DE LAS CARACTERISTICAS DEL ELEMENTO OPTICO QUE SIRVE PARA DERIVAR AL MENOS UNA CARACTERISTICA DEL ELEMENTO OPTICO DESDE DICHO MAPA DE PUNTOS LUMINOSOS PARA IDENTIFICAR EL ELEMENTO DIVISOR DE RAYOS QUE SE CORRESPONDE CON UN PUNTO INDIVIDUAL BASADO EN, AL MENOS PARCIALMENTE, EN CUALQUIER INFORMACION QUE NO SEA LA DE LA POSICION DEL PUNTO.
ES95924219T 1994-06-14 1995-06-13 Aparato para cartografiar elementos opticos. Expired - Lifetime ES2182907T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL11001694A IL110016A (en) 1994-06-14 1994-06-14 System and method for testing parameters of optical elements
IL11317295A IL113172A (en) 1995-03-28 1995-03-28 Apparatus and method for mapping optical elements

Publications (1)

Publication Number Publication Date
ES2182907T3 true ES2182907T3 (es) 2003-03-16

Family

ID=26322853

Family Applications (1)

Application Number Title Priority Date Filing Date
ES95924219T Expired - Lifetime ES2182907T3 (es) 1994-06-14 1995-06-13 Aparato para cartografiar elementos opticos.

Country Status (6)

Country Link
US (1) US5825476A (es)
EP (2) EP0765468B1 (es)
JP (2) JPH10507825A (es)
DE (1) DE69528647T2 (es)
ES (1) ES2182907T3 (es)
WO (1) WO1995034800A1 (es)

Families Citing this family (89)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5980513A (en) 1994-04-25 1999-11-09 Autonomous Technologies Corp. Laser beam delivery and eye tracking system
DE69726506T2 (de) * 1996-01-10 2004-11-04 Kabushiki Kaisha Topcon Anordnungsbeurteilungsvorrichtung und system
JP3685886B2 (ja) * 1996-09-30 2005-08-24 株式会社トプコン レンズメーター
JP3647991B2 (ja) * 1996-09-30 2005-05-18 株式会社トプコン レンズメーター
US6271914B1 (en) 1996-11-25 2001-08-07 Autonomous Technologies Corporation Objective measurement and correction of optical systems using wavefront analysis
JP3886191B2 (ja) * 1996-12-20 2007-02-28 株式会社トプコン レンズメーター
US5855074A (en) * 1997-12-07 1999-01-05 Visionix Ltd. Methods and apparatus for measuring and mapping opthalmic elements
US6819414B1 (en) 1998-05-19 2004-11-16 Nikon Corporation Aberration measuring apparatus, aberration measuring method, projection exposure apparatus having the same measuring apparatus, device manufacturing method using the same measuring method, and exposure method
US6791696B1 (en) 1998-06-18 2004-09-14 Optikos Corporation Automated optical measurement apparatus and method
US6598975B2 (en) * 1998-08-19 2003-07-29 Alcon, Inc. Apparatus and method for measuring vision defects of a human eye
US6222621B1 (en) 1998-10-12 2001-04-24 Hoyo Corporation Spectacle lens evaluation method and evaluation device
US6750958B1 (en) 1999-06-09 2004-06-15 Optikos Corporation Automated optical measurement apparatus and method
IL130465A0 (en) 1999-06-14 2000-06-01 Prolaser Ltd Method and apparatus for measuring power of an optical element for its mapping
US7242464B2 (en) * 1999-06-24 2007-07-10 Asml Holdings N.V. Method for characterizing optical systems using holographic reticles
US7016025B1 (en) 1999-06-24 2006-03-21 Asml Holding N.V. Method and apparatus for characterization of optical systems
US6396588B1 (en) * 1999-10-06 2002-05-28 Trw Inc. Hybrid curvature-tilt wave front sensor
JP4549468B2 (ja) * 1999-12-28 2010-09-22 株式会社トプコン レンズメータ
US6381012B1 (en) * 2000-01-20 2002-04-30 Virgil Thomas Yancy System, method and article of manufacture to determine and communicate optical lens sizing and prescription information
US6222495B1 (en) 2000-02-25 2001-04-24 Channel Master Llc Multi-beam antenna
US6234631B1 (en) 2000-03-09 2001-05-22 Lasersight Technologies, Inc. Combination advanced corneal topography/wave front aberration measurement
US6394999B1 (en) 2000-03-13 2002-05-28 Memphis Eye & Cataract Associates Ambulatory Surgery Center Laser eye surgery system using wavefront sensor analysis to control digital micromirror device (DMD) mirror patterns
DE10014334C2 (de) 2000-03-24 2002-03-21 Zeiss Carl Vorrichtung und Verfahren zur ortsaufgelösten Brechkraft-Bestimmung
BR0106071A (pt) 2000-04-19 2002-04-02 Alcon Universal Ltd Sensor de frente de onda para mensuração objetiva de um sistema ótico e métodos associados
US6565209B2 (en) 2000-04-25 2003-05-20 Alcon Universal Ltd. Range-extending system and spatial filter for enhancing Hartmann-Shack images and associated methods
CA2377852C (en) 2000-04-25 2007-08-07 Alcon Universal Ltd. Spatial filter for enhancing hartmann-shack images and associated methods
US6460997B1 (en) 2000-05-08 2002-10-08 Alcon Universal Ltd. Apparatus and method for objective measurements of optical systems using wavefront analysis
FR2813391B1 (fr) * 2000-08-22 2002-11-29 Essilor Int Procede et appareil de mesure en transmission de la structure geometrique d'un composant optique
US6577447B1 (en) 2000-10-20 2003-06-10 Nikon Corporation Multi-lens array of a wavefront sensor for reducing optical interference and method thereof
US6548797B1 (en) 2000-10-20 2003-04-15 Nikon Corporation Apparatus and method for measuring a wavefront using a screen with apertures adjacent to a multi-lens array
ATE297546T1 (de) * 2001-02-09 2005-06-15 Hoya Corp Linsenmesser zur messung der eigenschaft eines brillenglases oder einer kontaktlinse
AUPR419301A0 (en) * 2001-04-03 2001-05-03 Solar Systems Pty Ltd Solar mirror testing and alignment
US6806965B2 (en) * 2001-05-22 2004-10-19 Zygo Corporation Wavefront and intensity analyzer for collimated beams
US6561648B2 (en) 2001-05-23 2003-05-13 David E. Thomas System and method for reconstruction of aberrated wavefronts
DE10146499B4 (de) * 2001-09-21 2006-11-09 Carl Zeiss Smt Ag Verfahren zur Optimierung der Abbildungseigenschaften von mindestens zwei optischen Elementen sowie Verfahren zur Optimierung der Abbildungseigenschaften von mindestens drei optischen Elementen
DE60323630D1 (de) * 2002-05-16 2008-10-30 Hoya Corp Verfahren und einrichtung zum bewerten einer brillenlinse oder form zum formen einer brillenlinse und verfahren und system zur herstellung einer brillenlinse
EP1511978A4 (en) * 2002-05-31 2008-03-05 Wavefront Sciences Inc METHOD AND SYSTEM FOR DETECTING AND ANALYZING THE WAVE FRONT OF AN OPTICAL TRANSMISSION SYSTEM
US20040021826A1 (en) * 2002-08-01 2004-02-05 Sarver Edwin J. Combination advanced corneal topography/wave front aberration measurement
DE10245473A1 (de) * 2002-09-28 2004-04-08 Leica Microsystems Semiconductor Gmbh Strukturbreiten-Messgerät
JP2004125664A (ja) * 2002-10-03 2004-04-22 Hamamatsu Photonics Kk 位相分布計測装置
GB2395261A (en) * 2002-11-11 2004-05-19 Qinetiq Ltd Ranging apparatus
GB2395289A (en) * 2002-11-11 2004-05-19 Qinetiq Ltd Structured light generator
GB2395262A (en) * 2002-11-11 2004-05-19 Qinetiq Ltd Optical proximity sensor with array of spot lights and a mask
WO2004068088A2 (en) * 2003-01-27 2004-08-12 Oraxion Optical characterization of surfaces and plates
CN100343622C (zh) * 2003-05-29 2007-10-17 中国科学院光电技术研究所 微透镜结构参数及面形畸变的快速检测方法
DE10325841A1 (de) 2003-06-06 2004-12-30 Acritec Gmbh Intraokularlinse
DE10327019A1 (de) * 2003-06-12 2004-12-30 Carl Zeiss Sms Gmbh Verfahren zur Bestimmung der Abbildungsgüte eines optischen Abbildungssystems
DE10348509A1 (de) * 2003-10-18 2005-05-19 Carl Zeiss Jena Gmbh Wellenfrontsensor
US7532749B2 (en) * 2003-11-18 2009-05-12 Panasonic Corporation Light processing apparatus
FR2878973B1 (fr) * 2004-12-03 2007-04-20 Essilor Int Dispositif de mesure automatique de caracteristiques d'une lentille ophtalmique
FR2879736B1 (fr) * 2004-12-20 2007-02-02 Essilor Int Procede et dispositif de mesure sans contact de la courbure d'un objet ophtalmique
FR2880118B1 (fr) * 2004-12-23 2007-03-02 Essilor Int Procede et appareil de mesure locale des caracteristiques de refraction d'une lentille en un ou plusieurs points specifiques de cette lentille
US20060186312A1 (en) * 2005-02-23 2006-08-24 Zino Altman Apparatus and method for optical wavefront analysis using active light modulation
DE202005009847U1 (de) 2005-03-23 2005-10-20 Oculus Optikgeräte GmbH Messeinrichtung zum Messen der Refraktionseigenschaften optischer Linsen
DE202005004934U1 (de) * 2005-03-23 2005-06-09 Oculus Optikgeräte GmbH Messeinrichtung zum Messen der Refraktionseigenschaften optischer Linsen
JP4683270B2 (ja) * 2005-03-30 2011-05-18 株式会社ニデック レンズメータ
EP1785714B1 (en) * 2005-11-15 2017-02-22 Olympus Corporation Lens evaluation device
DE102007003681B4 (de) 2006-02-10 2017-11-30 Hochschule Bremen Verfahren und Vorrichtung zur Analyse einer optischen Einrichtung
EP1999443B1 (en) 2006-03-14 2017-12-27 AMO Manufacturing USA, LLC Spatial frequency wavefront sensor system and method
DE102006033779B4 (de) * 2006-07-21 2012-09-20 Karlsruher Institut für Technologie Verfahren zur Vermessung einer reflektierenden Oberfläche
JP2008082874A (ja) * 2006-09-27 2008-04-10 Fujitsu Ltd 測定装置および測定方法
US20080129984A1 (en) * 2006-12-01 2008-06-05 Sol Focus, Inc. Inspection of optical elements
US9192296B2 (en) 2007-08-21 2015-11-24 Visionix Ltd. Multifunctional ophthalmic measurement system
JP5107358B2 (ja) 2007-08-31 2012-12-26 Ｈｏｙａ株式会社 レンズ評価方法、レンズ評価装置及びレンズ製造方法、並びにレンズ特性表示方法
JP5107359B2 (ja) 2007-08-31 2012-12-26 Ｈｏｙａ株式会社 累進屈折力レンズの評価方法および評価装置、並びに累進屈折力レンズの製造方法
CN101918178B (zh) 2007-11-30 2013-07-10 依视路国际集团（光学总公司） 透镜制造过程的控制过程
US7802883B2 (en) 2007-12-20 2010-09-28 Johnson & Johnson Vision Care, Inc. Cosmetic contact lenses having a sparkle effect
KR101441309B1 (ko) * 2008-01-28 2014-09-17 삼성디스플레이 주식회사 디스플레이 시스템
JP2010133980A (ja) * 2010-03-04 2010-06-17 Nikon Corp 検査装置、該検査装置を備えた露光装置、およびマイクロデバイスの製造方法
JP5712454B2 (ja) * 2010-04-28 2015-05-07 東海光学株式会社 セミフィニッシュトブランクの測定方法及び加工方法
CN102338693A (zh) * 2010-07-20 2012-02-01 上海雄博精密仪器股份有限公司 一种渐进多焦点镜片的检测方法和装置
US9366884B2 (en) 2011-03-03 2016-06-14 Visionix Ltd. Automatic lens mapping system
CN102928196A (zh) * 2011-08-10 2013-02-13 上海雄博精密仪器股份有限公司 自由曲面镜片的检测方法和装置
EP2880398B1 (en) * 2012-07-31 2018-03-28 Essilor International Method and system for identification of a given geometrical feature of an optical component
JP6080427B2 (ja) * 2012-08-10 2017-02-15 キヤノン株式会社 シャック・ハルトマンセンサとそれを利用した波面計測方法
EP2901127B1 (en) 2012-09-28 2019-10-23 Novartis AG Method for automated in-line determination of center thickness of an ophthalmic lens
WO2014049053A1 (en) * 2012-09-28 2014-04-03 Novartis Ag Method for automated inline determination of the refractive power of an ophthalmic lens
US8941825B2 (en) 2013-03-15 2015-01-27 Owens-Brockway Glass Container Inc. Container inspection
FR3017963B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour identifier et localiser des microgravures presentes sur une lentille ophtalmique
FR3017964B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour reperer au moins un point caracteristique d'une lentille ophtalmique
CN103954434B (zh) * 2014-04-16 2016-05-11 青岛歌尔声学科技有限公司 一种光轴校准治具、系统及方法
US9491863B2 (en) 2014-06-26 2016-11-08 Align Technology, Inc. Mounting system that maintains stability of optics as temperature changes
CN104198164B (zh) * 2014-09-19 2017-02-15 中国科学院光电技术研究所 一种基于哈特曼波前检测原理的检焦方法
DE102016209720A1 (de) * 2016-06-02 2017-12-07 Humanoptics Ag Verfahren zur Prüfung individuell hergestellter Intraokularlinsen
WO2018218605A1 (zh) * 2017-06-01 2018-12-06 大族激光科技产业集团股份有限公司 激光清洗镜头
WO2020067028A1 (ja) 2018-09-28 2020-04-02 ホヤ レンズ タイランド リミテッド 曲面形状評価方法、眼鏡レンズの製造方法および眼鏡レンズ
GB2580946A (en) * 2019-01-31 2020-08-05 Eyoto Group Ltd Methods and apparatus for determining prism in a lens
EP4042130B1 (en) * 2019-10-07 2023-12-13 Essilor International Characterizing an optical element
CN114429444B (zh) * 2020-10-14 2025-09-09 亿美视觉私人有限公司 接触透镜缺陷分析跟踪系统及方法
EP4264211A1 (en) 2020-12-15 2023-10-25 Quartus Engineering Incorporated Wavefront sensors with irregular aperture masks, diffusers, and cameras, and methods of making and using the same

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE213057C (es) *
DE247617C (es) *
US3832066A (en) * 1972-10-27 1974-08-27 Acuity Syst Inc Apparatus and method for analyzing sphero-cylindrical optical systems
US3880525A (en) * 1974-05-08 1975-04-29 American Optical Corp Method and apparatus for determining the refractive characteristics of a lens
US4007990A (en) * 1975-05-23 1977-02-15 Acuity Systems, Incorporated Apparatus and method for measuring refractive properties of a sphero-cylindrical optical system
IL61405A (en) * 1980-11-04 1985-01-31 Israel Atomic Energy Comm Method and equipment for mapping radiation deflection by phase objects
JPS58205834A (ja) * 1982-05-25 1983-11-30 Canon Inc 収差測定方法
JPS6098035U (ja) * 1983-12-13 1985-07-04 キヤノン株式会社 ソフトコンタクトレンズの光学特性測定用装置
SU1312511A1 (ru) * 1985-01-24 1987-05-23 Специальное Конструкторское Бюро Научного Приборостроения "Оптика" Со Ан Ссср Датчик Гартмана
US4725138A (en) * 1985-05-22 1988-02-16 Adaptive Optics Associates Incorporated Optical wavefront sensing system
SU1420428A1 (ru) * 1986-12-16 1988-08-30 Предприятие П/Я А-1705 Устройство дл контрол качества изображени оптических систем
US4824243A (en) * 1987-05-26 1989-04-25 Hughes Aircraft Company Compact continuous wave wavefront sensor
JPH02238338A (ja) * 1989-03-13 1990-09-20 Hitachi Ltd レンズ検査装置
FR2654513B1 (fr) * 1989-11-10 1993-07-16 Essilor Int Procede et dispositif pour la determiantion des caracteristiques d'un lentille, et, notamment, de sa puissance.
US5062702A (en) * 1990-03-16 1991-11-05 Intelligent Surgical Lasers, Inc. Device for mapping corneal topography
US5083015A (en) * 1990-11-16 1992-01-21 United Technologies Corporation Optical centroid processor wavefront sensor
US5287165A (en) * 1991-09-30 1994-02-15 Kaman Aerospace Corporation High sensitivity-wide dynamic range optical tilt sensor
JP3144857B2 (ja) * 1991-10-29 2001-03-12 株式会社リコー 画像書込装置
US5301004A (en) * 1992-03-13 1994-04-05 Leica Inc. Method and apparatus for determining the optical properties of a lens
DE4222395A1 (de) * 1992-07-08 1994-01-13 Amtech Ges Fuer Angewandte Mic Vorrichtung und Verfahren zur Messung der Augenrefraktion
JPH0630900A (ja) * 1992-07-13 1994-02-08 Kimiya Shimizu 角膜の光学特性の表示方法
JPH07124113A (ja) * 1993-10-29 1995-05-16 Nidek Co Ltd 眼科装置
US5488891A (en) * 1995-06-13 1996-02-06 Baker; Michael V. Slide bar for stringed musical instruments

Also Published As

Publication number Publication date
EP0765468B1 (en) 2002-10-23
US5825476A (en) 1998-10-20
JP2008180722A (ja) 2008-08-07
EP0765468A1 (en) 1997-04-02
DE69528647D1 (de) 2002-11-28
JPH10507825A (ja) 1998-07-28
EP1248093A1 (en) 2002-10-09
WO1995034800A1 (en) 1995-12-21
DE69528647T2 (de) 2003-07-10

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