ES2187174T3 - Procedimiento para la comprobacion de la capacidad de funcionamiento de un espectometro y espectometro con dispositivo de deteccion de errores. - Google Patents

Procedimiento para la comprobacion de la capacidad de funcionamiento de un espectometro y espectometro con dispositivo de deteccion de errores.

Info

Publication number
ES2187174T3
ES2187174T3 ES99934659T ES99934659T ES2187174T3 ES 2187174 T3 ES2187174 T3 ES 2187174T3 ES 99934659 T ES99934659 T ES 99934659T ES 99934659 T ES99934659 T ES 99934659T ES 2187174 T3 ES2187174 T3 ES 2187174T3
Authority
ES
Spain
Prior art keywords
spectometer
checking
procedure
operating capacity
deviation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES99934659T
Other languages
English (en)
Inventor
Thomas Huth-Fehre
Frank Kowol
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institut fuer Chemo und Biosensorik Muenster eV ICB
Original Assignee
Institut fuer Chemo und Biosensorik Muenster eV ICB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institut fuer Chemo und Biosensorik Muenster eV ICB filed Critical Institut fuer Chemo und Biosensorik Muenster eV ICB
Application granted granted Critical
Publication of ES2187174T3 publication Critical patent/ES2187174T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Radiation Pyrometers (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Procedimiento para la comprobación de la capacidad de funcionamiento de un espectrómetro ante errores, que dispone de al menos una fuente de radiación, una disposición de filtros para la descomposición de la radiación en diferentes zonas espectrales y una disposición de recepción, caracterizado porque los valores de referencia se elaboran para al menos dos temperatura de color diferentes de la fuente de radiación y para cada una de las diferentes zonas espectrales, porque para la comprobación del espectrómetro se comparan las señales de recepción actuales en al menos dos temperaturas de color que se han de ajustar con los valores de referencia, y porque en caso de desviación, el tipo de desviación se determina en función de las zonas espectrales y de las temperaturas de color, y se deducen determinados errores a partir del tipo de desviación.
ES99934659T 1998-07-21 1999-07-12 Procedimiento para la comprobacion de la capacidad de funcionamiento de un espectometro y espectometro con dispositivo de deteccion de errores. Expired - Lifetime ES2187174T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19833793A DE19833793C2 (de) 1998-07-21 1998-07-21 Verfahren zur Überprüfung der Funktionsfähigkeit eines Spektrometers und Spektrometer mit Fehlererkennungsvorrichtung

Publications (1)

Publication Number Publication Date
ES2187174T3 true ES2187174T3 (es) 2003-05-16

Family

ID=7875482

Family Applications (1)

Application Number Title Priority Date Filing Date
ES99934659T Expired - Lifetime ES2187174T3 (es) 1998-07-21 1999-07-12 Procedimiento para la comprobacion de la capacidad de funcionamiento de un espectometro y espectometro con dispositivo de deteccion de errores.

Country Status (7)

Country Link
US (1) US6542239B1 (es)
EP (1) EP1099099B1 (es)
JP (1) JP2002521656A (es)
AT (1) ATE227422T1 (es)
DE (2) DE19833793C2 (es)
ES (1) ES2187174T3 (es)
WO (1) WO2000005555A1 (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL159249A0 (en) * 2002-04-23 2004-06-01 Small packaged spectroscopic sensor unit
US8894576B2 (en) * 2004-03-10 2014-11-25 University Of Virginia Patent Foundation System and method for the inference of activities of daily living and instrumental activities of daily living automatically
JP2014016243A (ja) * 2012-07-09 2014-01-30 Muto Kogyo Kk 分光光度計診断システム及び方法
US11169023B2 (en) * 2016-04-14 2021-11-09 Konica Minolta, Inc. Optical measuring device, malfunction determination system, malfunction determination method, and a non-transitory recording medium storing malfunction
DE102017010766A1 (de) * 2017-11-21 2019-06-13 OBLF Ges. für Elektronik u. Feinwerktechnik mbH Transparenzkontrolle optischer Emissions-Spektrometer
US20260092811A1 (en) * 2024-09-30 2026-04-02 Spectronix Ltd. Multi-spectral optical detector with integrated test

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE221015C (es)
US4358679A (en) * 1980-09-02 1982-11-09 Astro Safety Products Inc. Calibration of analyzers employing radiant energy
US4358079A (en) * 1981-10-15 1982-11-09 Pass And Seymour, Inc. Moisture resistant clamp for portable cables
US4449821A (en) * 1982-07-14 1984-05-22 E. I. Du Pont De Nemours And Company Process colorimeter
DD221015A1 (de) * 1983-11-24 1985-04-10 Adw Ddr Radiometrische kontrollvorrichtung fuer optische spektralfotometer
US4822998A (en) * 1986-05-15 1989-04-18 Minolta Camera Kabushiki Kaisha Spectral sensor with interference filter
US5032710A (en) * 1988-09-22 1991-07-16 Canon Kabushiki Kaisha Photodetector to detect a light in different wavelength regions through clad layer having different thickness portions
NL9001302A (nl) * 1989-06-30 1991-01-16 Philips Nv Schakelinrichting.
US5028790A (en) * 1990-05-07 1991-07-02 Lear Siegler Measurement Controls Corporation Apparatus for full-system zero check and window soiling measurement and correction for transmissometers
US5042948A (en) * 1990-06-14 1991-08-27 Honeywell Inc. Industrial colorimeter having lamp aging compensation means
US5137364A (en) * 1991-01-31 1992-08-11 Mccarthy Cornelius J Optical spectral analysis apparatus
DE4128912C2 (de) * 1991-08-30 1995-06-22 Deutsche Forsch Luft Raumfahrt Verfahren und Einrichtung zur Kalibrierung von Spektralradiometern
CA2078637A1 (en) * 1991-09-20 1993-03-21 Yukiharu Shimizu System for calibration of optical instrument on satellite with reference light source
DE4241905C2 (de) 1992-12-11 1995-01-26 Bruker Analytische Messtechnik Spektrometer mit dynamisch kodierten Komponenten
US6240372B1 (en) * 1997-11-14 2001-05-29 Arch Development Corporation System for surveillance of spectral signals

Also Published As

Publication number Publication date
EP1099099B1 (de) 2002-11-06
DE59903332D1 (de) 2002-12-12
ATE227422T1 (de) 2002-11-15
US6542239B1 (en) 2003-04-01
DE19833793A1 (de) 2000-01-27
DE19833793C2 (de) 2000-12-07
WO2000005555A1 (de) 2000-02-03
EP1099099A1 (de) 2001-05-16
JP2002521656A (ja) 2002-07-16

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