ES2197796A1 - CIRCUIT FOR THE CHARACTERIZATION OF RESISTANT QUARTZ CRYSTAL SENSORS IN FLUID MEDIA. - Google Patents

CIRCUIT FOR THE CHARACTERIZATION OF RESISTANT QUARTZ CRYSTAL SENSORS IN FLUID MEDIA.

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Publication number
ES2197796A1
ES2197796A1 ES200200306A ES200200306A ES2197796A1 ES 2197796 A1 ES2197796 A1 ES 2197796A1 ES 200200306 A ES200200306 A ES 200200306A ES 200200306 A ES200200306 A ES 200200306A ES 2197796 A1 ES2197796 A1 ES 2197796A1
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ES
Spain
Prior art keywords
circuit
sensor
quartz crystal
quartz
fluid media
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES200200306A
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Spanish (es)
Other versions
ES2197796B1 (en
Inventor
Vives Antonio Arnau
Jimenez Yolanda Jimenez
Devesa Tomas Sogorb
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad Politecnica de Valencia
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Universidad Politecnica de Valencia
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Priority to ES200200306A priority Critical patent/ES2197796B1/en
Publication of ES2197796A1 publication Critical patent/ES2197796A1/en
Application granted granted Critical
Publication of ES2197796B1 publication Critical patent/ES2197796B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

Sistema de caracterización de sensores de cristal de cuarzo resonante en medios fluidos, y procedimiento de calibración y compensación de la capacidad del cristal de cuarzo. El sistema de la invención suministra continua y automáticamente la frecuencia de resonancia serie y la resistencia de la rama dinámica y de un resonador de cuarzo. La frecuencia suministrada es independiente de la resistencia dinámica y de la capacidad estática del cristal. El sistema está diseñado para compensar los efectos capacitivos en paralelo con el sensor, incorporando un bucle de enganche de fase y un circuito que proporciona la resistencia dinámica del resonador, además, incluye procedimientos para la calibración del circuito externo al sensor y para la compensación capacitiva. La invención tiene utilidad en aplicaciones en que se utilizan resonadores de cuarzo como sensores, tales como: para la determinación de las propiedades visco-elásticas de fluidos, para la detección de especies químicas específicas en entorno gaseoso o en disolución mediante el recubrimiento adecuado del sensor, entre otras.Characterization system of resonant quartz crystal sensors in fluid media, and procedure for calibration and compensation of the quartz crystal capacity. The system of the invention continuously and automatically supplies the series resonance frequency and the resistance of the dynamic branch and of a quartz resonator. The supplied frequency is independent of the dynamic resistance and the static capacity of the crystal. The system is designed to compensate the capacitive effects in parallel with the sensor, incorporating a phase-locked loop and a circuit that provides the dynamic resistance of the resonator, in addition, it includes procedures for the calibration of the external circuit to the sensor and for capacitive compensation. . The invention is useful in applications in which quartz resonators are used as sensors, such as: for the determination of the visco-elastic properties of fluids, for the detection of specific chemical species in a gaseous environment or in solution by means of the appropriate coating of the sensor. , among other.

ES200200306A 2002-01-31 2002-01-31 CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY. Expired - Fee Related ES2197796B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES200200306A ES2197796B1 (en) 2002-01-31 2002-01-31 CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES200200306A ES2197796B1 (en) 2002-01-31 2002-01-31 CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY.

Publications (2)

Publication Number Publication Date
ES2197796A1 true ES2197796A1 (en) 2004-01-01
ES2197796B1 ES2197796B1 (en) 2005-02-16

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ES200200306A Expired - Fee Related ES2197796B1 (en) 2002-01-31 2002-01-31 CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY.

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ES (1) ES2197796B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010149811A1 (en) 2009-06-23 2010-12-29 Universidad Politécnica De Valencia Method and device for nanogravimetry in fluid media using piezoelectric resonators

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4447782A (en) * 1982-03-17 1984-05-08 Transat Corp. Apparatus for automatic measurement of equivalent circuit parameters of piezoelectric resonators
US5117192A (en) * 1990-01-12 1992-05-26 Leybold Inficon Inc. Control circuitry for quartz crystal deposition monitor
WO1996035103A1 (en) * 1995-05-04 1996-11-07 Michael Rodahl A piezoelectric crystal microbalance device
ES2153740A1 (en) * 1998-07-08 2001-03-01 Univ Valencia Politecnica System for compensating the effects of viscous friction in the measurement of the resonance frequency in a piezometric crystal in a liquid

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4447782A (en) * 1982-03-17 1984-05-08 Transat Corp. Apparatus for automatic measurement of equivalent circuit parameters of piezoelectric resonators
US5117192A (en) * 1990-01-12 1992-05-26 Leybold Inficon Inc. Control circuitry for quartz crystal deposition monitor
WO1996035103A1 (en) * 1995-05-04 1996-11-07 Michael Rodahl A piezoelectric crystal microbalance device
ES2153740A1 (en) * 1998-07-08 2001-03-01 Univ Valencia Politecnica System for compensating the effects of viscous friction in the measurement of the resonance frequency in a piezometric crystal in a liquid

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010149811A1 (en) 2009-06-23 2010-12-29 Universidad Politécnica De Valencia Method and device for nanogravimetry in fluid media using piezoelectric resonators

Also Published As

Publication number Publication date
ES2197796B1 (en) 2005-02-16

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