ES2542252A2 - Procedimiento para la preparación de una capa o multicapa barrera y/o dieléctrica sobre un sustrato y dispositivo para su realización - Google Patents

Procedimiento para la preparación de una capa o multicapa barrera y/o dieléctrica sobre un sustrato y dispositivo para su realización Download PDF

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ES2542252A2
ES2542252A2 ES201590049A ES201590049A ES2542252A2 ES 2542252 A2 ES2542252 A2 ES 2542252A2 ES 201590049 A ES201590049 A ES 201590049A ES 201590049 A ES201590049 A ES 201590049A ES 2542252 A2 ES2542252 A2 ES 2542252A2
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substrate
producing
vacuum chamber
cation
reactive gas
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ES2542252B1 (es
ES2542252R1 (es
Inventor
Jorge Gil Rostra
Victor RICO GAVIRA
Francisco Yubero Valencia
Juan Pedro ESPINÓS MANZORRO
Agustín RODRÍGUEZ GONZÁLEZ-ELIPE
Emilio SÁNCHEZ CORTEZÓN
José María DELGADO SÁNCHEZ
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Abengoa Solar New Technologies SA
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Abengoa Solar New Technologies SA
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  • Manufacturing & Machinery (AREA)
  • Chemical Vapour Deposition (AREA)
  • Optics & Photonics (AREA)
  • Physical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)
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Abstract

Procedimiento para la preparación de una capa o multicapa barrera y/o dieléctrica sobre un sustrato y dispositivo para su realización.#La presente invención se refiere a un procedimiento para la preparación de capas barrera y/o dieléctricas sobre un sustrato caracterizado por que comprende las siguientes etapas: (a) limpieza de sustratos, (b) colocación del sustrato en un portamuestras e introducción del mismo en el interior de una cámara de vacío, (c) dosificación en dicha cámara de vacío de un gas inerte y un gas reactivo, (d) inyección en la cámara de vacío de un precursor volátil que tenga al menos un catión del compuesto a depositar, (e) activación de una fuente de radiofrecuencia y activación de al menos un magnetrón, (f) descomposición del precursor volátil por plasma, produciéndose la reacción entre el catión del precursor volátil y el gas reactivo al mismo tiempo que se produce la reacción entre el gas reactivo contenido en el plasma con el catión procedente del blanco por pulverización catódica, provocando así la deposición de la película sobre el sustrato. Es también objeto de la invención el dispositivo para llevar a cabo dicho procedimiento.

Description

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Claims (1)

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ES201590049A 2012-11-28 2013-11-27 Procedimiento para la preparacion de una capa o multicapa barrera y/o dielectrica sobre un sustrato y dispositivo para su realizacion Expired - Fee Related ES2542252B1 (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP12380053.4A EP2738790A1 (en) 2012-11-28 2012-11-28 Procedure for preparing one single barrier and/or dielectric layer or multilayer on a substrate and device for the implementation thereof
EP12380053 2012-11-28
PCT/ES2013/000264 WO2014083218A1 (es) 2012-11-28 2013-11-27 Procedimiento para la preparación de una capa o multicapa barrera y/o dieléctrica sobre un sustrato y dispositivo para su realización

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ES2542252R1 ES2542252R1 (es) 2015-08-17
ES2542252B1 ES2542252B1 (es) 2016-05-25

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Families Citing this family (9)

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DE102015101025A1 (de) * 2015-01-23 2016-07-28 Von Ardenne Gmbh Verfahren und Vorrichtung zur Abscheidung einer dotierten Metalloxidschicht
FR3045033B1 (fr) 2015-12-09 2020-12-11 Saint Gobain Procede et installation pour l'obtention d'un vitrage colore
DE102017003042B3 (de) * 2017-03-29 2018-08-16 Rodenstock Gmbh Gradienten-Hartschicht mit sich änderndem E-Modul
FR3073865B1 (fr) * 2017-11-17 2022-05-27 Centre Nat Rech Scient Revetement pour recepteur solaire et dispositif comportant un tel revetement
FR3073864B1 (fr) * 2017-11-28 2022-08-05 Centre Nat Rech Scient Reacteur de depot de couches et procede de depot associe
US10840086B2 (en) * 2018-04-27 2020-11-17 Applied Materials, Inc. Plasma enhanced CVD with periodic high voltage bias
CN115110048B (zh) * 2022-06-20 2023-05-02 肇庆市科润真空设备有限公司 基于磁控溅射的pecvd镀膜装置及方法
JP2025540422A (ja) * 2022-12-22 2025-12-11 マツクス-プランク-ゲゼルシヤフト ツール フエルデルング デル ヴイツセンシヤフテン エー フアウ 蒸着システム及び基板の表面をコーティングする方法
CN115874154B (zh) * 2023-02-13 2023-06-02 广州粤芯半导体技术有限公司 半导体结构、芯片及其应用和膜层沉积方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4668365A (en) * 1984-10-25 1987-05-26 Applied Materials, Inc. Apparatus and method for magnetron-enhanced plasma-assisted chemical vapor deposition
US6176983B1 (en) * 1997-09-03 2001-01-23 Vlsi Technology, Inc. Methods of forming a semiconductor device
DE19824364A1 (de) * 1998-05-30 1999-12-02 Bosch Gmbh Robert Verfahren zum Aufbringen eines Verschleißschutz-Schichtsystems mit optischen Eigenschaften auf Oberflächen
US6841044B1 (en) * 2002-08-28 2005-01-11 Novellus Systems, Inc. Chemically-enhanced physical vapor deposition
FR2922362B1 (fr) 2007-10-16 2009-12-18 Avancis Gmbh & Co Kg Perfectionnements apportes a un boitier de connexion pour elements capables de collecter de la lumiere.
US8288276B2 (en) * 2008-12-30 2012-10-16 International Business Machines Corporation Method of forming an interconnect structure including a metallic interfacial layer located at a bottom via portion
DE102010055659A1 (de) * 2010-12-22 2012-06-28 Technische Universität Dresden Verfahren zum Abscheiden dielektrischer Schichten im Vakuum sowie Verwendung des Verfahrens

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EP2738790A1 (en) 2014-06-04
WO2014083218A1 (es) 2014-06-05
ES2542252B1 (es) 2016-05-25
CN104955978A (zh) 2015-09-30
ES2542252R1 (es) 2015-08-17
KR20150099764A (ko) 2015-09-01
US20150325418A1 (en) 2015-11-12

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