ES2561732A1 - Dispositivo de calibración multirresolución para sistemas de visión artificial - Google Patents

Dispositivo de calibración multirresolución para sistemas de visión artificial Download PDF

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Publication number
ES2561732A1
ES2561732A1 ES201531330A ES201531330A ES2561732A1 ES 2561732 A1 ES2561732 A1 ES 2561732A1 ES 201531330 A ES201531330 A ES 201531330A ES 201531330 A ES201531330 A ES 201531330A ES 2561732 A1 ES2561732 A1 ES 2561732A1
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Prior art keywords
translation
machine
legally binding
google translate
calibration device
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Granted
Application number
ES201531330A
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English (en)
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ES2561732B2 (es
Inventor
David MIRAUT ANDRÉS
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Universidad Rey Juan Carlos
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Universidad Rey Juan Carlos
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Priority to ES201531330A priority Critical patent/ES2561732B2/es
Publication of ES2561732A1 publication Critical patent/ES2561732A1/es
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Publication of ES2561732B2 publication Critical patent/ES2561732B2/es
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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/32—Fiducial marks and measuring scales within the optical system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Prostheses (AREA)

Abstract

Superficie plana o tridimensional, a modo de placa de calibración, que se caracteriza porque sobre ella se han dibujado con precisión un conjunto de marcadores fiduciarios de distinto tamaño, que no se solapan y cuya posición relativa sobre la superficie es conocida con gran exactitud. Opcionalmente, los marcadores fiduciarios tienen forma de cuadriculas regulares compuestas de celdas cuadradas que están coloreadas en dos tonos de diferente luminosidad, tienen el mismo número de filas y columnas, pero distinto tamaño de celda.

Description

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Claims (1)

  1. imagen1
ES201531330A 2015-09-18 2015-09-18 Dispositivo de calibración multirresolución para sistemas de visión artificial Active ES2561732B2 (es)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES201531330A ES2561732B2 (es) 2015-09-18 2015-09-18 Dispositivo de calibración multirresolución para sistemas de visión artificial

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES201531330A ES2561732B2 (es) 2015-09-18 2015-09-18 Dispositivo de calibración multirresolución para sistemas de visión artificial

Publications (2)

Publication Number Publication Date
ES2561732A1 true ES2561732A1 (es) 2016-02-29
ES2561732B2 ES2561732B2 (es) 2016-10-07

Family

ID=55359280

Family Applications (1)

Application Number Title Priority Date Filing Date
ES201531330A Active ES2561732B2 (es) 2015-09-18 2015-09-18 Dispositivo de calibración multirresolución para sistemas de visión artificial

Country Status (1)

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ES (1) ES2561732B2 (es)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019067283A1 (en) 2017-09-29 2019-04-04 Waymo Llc TARGET, METHOD AND SYSTEM FOR CAMERA CALIBRATION
EP4510085A1 (en) * 2023-08-03 2025-02-19 Rapsodo Pte. Ltd. Spin estimation for objects with markers

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2055606U (zh) * 1989-06-20 1990-04-04 中国科学院遥感应用研究所 显微立体量测用模板
US20010017693A1 (en) * 1999-09-02 2001-08-30 Zheng Sandra S. Image displacement test reticle for measuring aberration characteristics of projection optics
US20030156276A1 (en) * 2002-02-20 2003-08-21 Micron Technology, Inc. Aberration mark and method for estimating overlay error and optical aberrations
US20050237541A1 (en) * 2002-07-19 2005-10-27 Litel Instruments In-situ interferometer arrangement
US20120300293A1 (en) * 2011-05-28 2012-11-29 The Board Of Trustees Of The University Of Illinois Simple Ultra-Stable Stage with Built-in Fiduciary Markers for Fluorescence Nanoscopy

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2055606U (zh) * 1989-06-20 1990-04-04 中国科学院遥感应用研究所 显微立体量测用模板
US20010017693A1 (en) * 1999-09-02 2001-08-30 Zheng Sandra S. Image displacement test reticle for measuring aberration characteristics of projection optics
US20030156276A1 (en) * 2002-02-20 2003-08-21 Micron Technology, Inc. Aberration mark and method for estimating overlay error and optical aberrations
US20050237541A1 (en) * 2002-07-19 2005-10-27 Litel Instruments In-situ interferometer arrangement
US20120300293A1 (en) * 2011-05-28 2012-11-29 The Board Of Trustees Of The University Of Illinois Simple Ultra-Stable Stage with Built-in Fiduciary Markers for Fluorescence Nanoscopy

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019067283A1 (en) 2017-09-29 2019-04-04 Waymo Llc TARGET, METHOD AND SYSTEM FOR CAMERA CALIBRATION
US10930014B2 (en) 2017-09-29 2021-02-23 Waymo Llc Target, method, and system for camera calibration
EP3676803A4 (en) * 2017-09-29 2021-03-03 Waymo LLC AIM, METHOD AND SYSTEM FOR CAMERA CALIBRATION
AU2021202531B2 (en) * 2017-09-29 2022-06-16 Waymo Llc Target, method, and system for camera calibration
US11657536B2 (en) 2017-09-29 2023-05-23 Waymo Llc Target, method, and system for camera calibration
EP4510085A1 (en) * 2023-08-03 2025-02-19 Rapsodo Pte. Ltd. Spin estimation for objects with markers
US12530796B2 (en) 2023-08-03 2026-01-20 Rapsodo Pte. Ltd. Spin estimation for marked objects

Also Published As

Publication number Publication date
ES2561732B2 (es) 2016-10-07

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