ES399676A1 - IMPROVEMENTS INTRODUCED IN FAILURE-TESTED LOGIC DOORS FOR CONTROL SYSTEMS. - Google Patents

IMPROVEMENTS INTRODUCED IN FAILURE-TESTED LOGIC DOORS FOR CONTROL SYSTEMS.

Info

Publication number
ES399676A1
ES399676A1 ES399676A ES399676A ES399676A1 ES 399676 A1 ES399676 A1 ES 399676A1 ES 399676 A ES399676 A ES 399676A ES 399676 A ES399676 A ES 399676A ES 399676 A1 ES399676 A1 ES 399676A1
Authority
ES
Spain
Prior art keywords
signal
input
transistor
excursion
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES399676A
Other languages
Spanish (es)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Westinghouse Electric Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of ES399676A1 publication Critical patent/ES399676A1/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/08—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
    • H03K19/082—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using bipolar transistors
    • H03K19/084—Diode-transistor logic
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/007—Fail-safe circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Power Engineering (AREA)
  • Electronic Switches (AREA)

Abstract

Improvements introduced in fail-safe logic doors for control systems, of the type comprising a transistor having base, collector and emitter electrodes; at least two signal input circuits each of which has an input terminal to which an input signal of duration t and frequency f can be applied, and an output terminal where an output signal is provided in response to said signal of input, said output terminal being connected to the base electrode of said transistor, whose improvements are characterized in that in said logic gates each of the signal input circuits includes: load coupling means that have a high impedance to all the signals having substantially said frequency f, whose first terminal is being connected to the input terminal of said input signal circuit and which respond to said input signal by providing a differentiated signal having a positive excursion part and an excursion part negative; first means operating with said charge coupling means and said transistor, and responding to one of said positive and negative excursion portions of said differentiated signal to apply sufficient charge to the base electrode of said transistor to make said transistor conduct during a time at least equal to said duration t, said first means blocking the charge leakage of said base electrode; and second means responsive to the remaining portion of said positive and negative excursion portions of said differentiated signal, providing one of the loading and unloading paths for said load-engaging means. (Machine-translation by Google Translate, not legally binding)
ES399676A 1971-02-19 1972-02-11 IMPROVEMENTS INTRODUCED IN FAILURE-TESTED LOGIC DOORS FOR CONTROL SYSTEMS. Expired ES399676A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11675171A 1971-02-19 1971-02-19

Publications (1)

Publication Number Publication Date
ES399676A1 true ES399676A1 (en) 1975-07-01

Family

ID=22368986

Family Applications (1)

Application Number Title Priority Date Filing Date
ES399676A Expired ES399676A1 (en) 1971-02-19 1972-02-11 IMPROVEMENTS INTRODUCED IN FAILURE-TESTED LOGIC DOORS FOR CONTROL SYSTEMS.

Country Status (6)

Country Link
BE (1) BE779520A (en)
BR (1) BR7200517D0 (en)
CA (1) CA963542A (en)
ES (1) ES399676A1 (en)
FR (1) FR2126018A5 (en)
IT (1) IT947475B (en)

Also Published As

Publication number Publication date
CA963542A (en) 1975-02-25
BR7200517D0 (en) 1973-05-24
FR2126018A5 (en) 1972-09-29
IT947475B (en) 1973-05-21
BE779520A (en) 1972-08-18

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