ES469242A1 - Mejoras introducidas en un metodo y un aparato para inspe- ccionar muestras de productos con el fin de determinar si cada una de dichas muestras tiene una cantidad medida de unapropiedad fisica dentro de limites predeterminados - Google Patents

Mejoras introducidas en un metodo y un aparato para inspe- ccionar muestras de productos con el fin de determinar si cada una de dichas muestras tiene una cantidad medida de unapropiedad fisica dentro de limites predeterminados

Info

Publication number
ES469242A1
ES469242A1 ES469242A ES469242A ES469242A1 ES 469242 A1 ES469242 A1 ES 469242A1 ES 469242 A ES469242 A ES 469242A ES 469242 A ES469242 A ES 469242A ES 469242 A1 ES469242 A1 ES 469242A1
Authority
ES
Spain
Prior art keywords
standardization
testing system
penetrating radiation
signal
radiation testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES469242A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bedford Engineering Corp
Original Assignee
Bedford Engineering Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bedford Engineering Corp filed Critical Bedford Engineering Corp
Publication of ES469242A1 publication Critical patent/ES469242A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/3416—Sorting according to other particular properties according to radiation transmissivity, e.g. for light, x-rays, particle radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/12—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/905—Feeder conveyor holding item by suction

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Toxicology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

Mejoras introducidas en un método y un aparato para inspeccionar muestras de producto con el fin de determinar si cada una de dichas muestras tiene una cantidad medida de una propiedad física incluida dentro de límites predeterminados, incluyendo dicho aparato un dispositivo para transportar dicha muestra a lo largo de un trayecto predeterminado a través de un puesto de inspección; un dispositivo de irradiación situado en un punto adyacente a dicho puesto de inspección para dirigir un haz de radiación penetrante transversalmente respecto a dicho trayecto de tal manera que cada una de dichas muestras está sometida a dicho haz, un dispositivo detector adaptado para recibir la radiación difundida por cada muestra irradiada por dicho haz, un dispositivo que responde a dicho dispositivo detector generando una señal eléctrica representativa de la cantidad de radiación recibida por dicho dispositivo detector de acuerdo con una ganancia de señal predeterminada; y un dispositivo para determinar la cantidad de dicha propiedad física de cada muestra irradiada por dicho haz en función de dicha señal eléctrica.
ES469242A 1977-04-28 1978-04-27 Mejoras introducidas en un metodo y un aparato para inspe- ccionar muestras de productos con el fin de determinar si cada una de dichas muestras tiene una cantidad medida de unapropiedad fisica dentro de limites predeterminados Expired ES469242A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/792,061 US4154672A (en) 1977-04-28 1977-04-28 Standardization of penetrating radiation testing system

Publications (1)

Publication Number Publication Date
ES469242A1 true ES469242A1 (es) 1979-09-16

Family

ID=25155674

Family Applications (1)

Application Number Title Priority Date Filing Date
ES469242A Expired ES469242A1 (es) 1977-04-28 1978-04-27 Mejoras introducidas en un metodo y un aparato para inspe- ccionar muestras de productos con el fin de determinar si cada una de dichas muestras tiene una cantidad medida de unapropiedad fisica dentro de limites predeterminados

Country Status (9)

Country Link
US (1) US4154672A (es)
BE (1) BE866463A (es)
CH (1) CH643359A5 (es)
DE (1) DE2818876A1 (es)
ES (1) ES469242A1 (es)
FR (1) FR2389127A1 (es)
GB (1) GB1584492A (es)
IT (1) IT1102276B (es)
NL (1) NL7804655A (es)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4331241A (en) * 1979-09-26 1982-05-25 Smirin Lev N Apparatus for thickness sorting of sheet materials
DE3330817A1 (de) * 1983-08-26 1985-03-14 Holstein Und Kappert Gmbh, 4600 Dortmund Vorrichtung zur bereitschaftsueberpruefung von inspektionsmaschinen
DE3508576C1 (de) * 1985-03-11 1986-04-30 Staudacher Horst Vorrichtung zur Objektkontrolle mittels Objektvergleich
ZA867411B (en) * 1985-09-30 1987-09-30 Cra Services Classifier
DE3624419A1 (de) * 1986-07-19 1988-01-28 Staudacher Horst Vorrichtung zur objektkontrolle
US5661249A (en) * 1994-08-11 1997-08-26 Walter Grassle Gmbh Apparatus and method for inspecting small articles
DE19511854A1 (de) * 1994-08-11 1996-02-15 Graessle Walter Gmbh Vorrichtung und Verfahren zum Prüfen von kleinen Gegenständen
JP3339390B2 (ja) * 1997-11-12 2002-10-28 株式会社村田製作所 電子部品の搬送装置
GB2337032B (en) * 1998-05-05 2002-11-06 Rapiscan Security Products Ltd Sorting apparatus
US6829055B1 (en) * 2003-08-07 2004-12-07 Delphi Technologies, Inc. Angular position sensor assembly for use with steering column
US7499821B2 (en) * 2006-01-20 2009-03-03 Airadvice, Inc. Sensor drift characteristic testing
DE202007005881U1 (de) 2007-04-24 2008-08-28 Puma Aktiengesellschaft Rudolf Dassler Sport Stollen für einen Schuh
US9002656B2 (en) * 2011-10-17 2015-04-07 Daxor Corporation Automated total body albumin analyzer
WO2013104365A1 (en) * 2012-01-09 2013-07-18 Udviklingsselskabet Innoscan K/S Automatic standards inspection
US10195647B2 (en) * 2016-01-15 2019-02-05 Key Technology, Inc Method and apparatus for sorting
CN107167300B (zh) * 2017-06-12 2019-06-28 中国科学院长春光学精密机械与物理研究所 一种led灯具寿命连续在线检测的立式转动机构

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2885557A (en) * 1955-04-01 1959-05-05 Gen Electric Inspection apparatus
US2939960A (en) * 1955-11-21 1960-06-07 Exxon Research Engineering Co Method of quality control of catalysts by radiation scatter measurement
DE1137565B (de) * 1958-03-03 1962-10-04 Siemens Ag Verfahren zur UEberwachung oder Regelung der Dicke oder Dichte eines an einem Messspalt vorbeigefuehrten Produktes mittels durchdringender Strahlen
US2942113A (en) * 1958-03-18 1960-06-21 Industrial Nucleonics Corp Measuring system
US3198944A (en) * 1961-11-06 1965-08-03 Gen Electric X-ray emission analyzer with standardizing system and novel switch means
US3361911A (en) * 1962-04-27 1968-01-02 Kowalczynski Jerzy Klemens System for measuring the mass of material by the detection of radiation scattered by the material
US3382975A (en) * 1966-08-24 1968-05-14 Mandrel Industries Apparatus for sorting comestible and other objects
FR1587501A (es) * 1968-10-14 1970-03-20
US4009376A (en) * 1972-02-15 1977-02-22 Sangamo Weston, Inc. Method and apparatus for measuring material thickness
US3880750A (en) * 1974-06-06 1975-04-29 Owens Illinois Inc Sealing surface gauge
US4060726A (en) * 1976-10-18 1977-11-29 Beckman Instruments, Inc. Gamma counter calibration system

Also Published As

Publication number Publication date
FR2389127B1 (es) 1984-08-24
IT1102276B (it) 1985-10-07
FR2389127A1 (fr) 1978-11-24
IT7849148A0 (it) 1978-04-28
NL7804655A (nl) 1978-10-31
GB1584492A (en) 1981-02-11
BE866463A (fr) 1978-08-14
DE2818876A1 (de) 1978-11-09
US4154672A (en) 1979-05-15
CH643359A5 (de) 1984-05-30

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 19980202