ES478807A1 - Metodo y aparato para captar la radiacion detectable produ- cida por la presencia de material en forma de particulas - Google Patents

Metodo y aparato para captar la radiacion detectable produ- cida por la presencia de material en forma de particulas

Info

Publication number
ES478807A1
ES478807A1 ES478807A ES478807A ES478807A1 ES 478807 A1 ES478807 A1 ES 478807A1 ES 478807 A ES478807 A ES 478807A ES 478807 A ES478807 A ES 478807A ES 478807 A1 ES478807 A1 ES 478807A1
Authority
ES
Spain
Prior art keywords
reflector
reflector surface
radiation collector
efficient
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES478807A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coulter Electronics Inc
Original Assignee
Coulter Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/899,584 external-priority patent/US4188543A/en
Priority claimed from US05/899,583 external-priority patent/US4188542A/en
Application filed by Coulter Electronics Inc filed Critical Coulter Electronics Inc
Publication of ES478807A1 publication Critical patent/ES478807A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G01N15/1436—Optical arrangements the optical arrangement forming an integrated apparatus with the sample container, e.g. a flow cell
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
    • G02B19/0028—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed refractive and reflective surfaces, e.g. non-imaging catadioptric systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
    • G02B19/0076—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Biological Materials (AREA)

Abstract

1. - Método y aparato para captar la radiación detectable producida por la presencia de material en forma de partículas, consistiendo dicho aparato en un aparato captador de radiaciones (10) en el cual la irradiación del material en forma de partículas produce una fuente (42) de radiación detectable, caracterizado el aparato por una cámara reflectora (12) que tiene una primera superficie reflectora (14 o 74) y una segunda superficie reflectora (16 o 76), teniendo dicha primera superficie reflectora (14 o 74) sustancialmente la configuración de la mitad de un elipsoide de revolución, teniendo dicha primera superficie reflectora (14 o 74) un foco principal (18) y un foco secundario (20), estando uno de dichos focos (18, 20) situado en el interior de dicha cámara reflectora (12) en la fuente (42) de radiación detectable, teniendo dicha segunda superficie reflectora (16 o 76) cualquier configuración sustancialmente plana y sustancialmente una configuración de mitad de elipsoide de revolución, una ventana (24 o 58) formada en una de dichas superficies reflectoras (14, 74 o 16, 76) y alineada en posición de intersección con un eje de simetría (22) definido por dicho foco principal (18) y dicho foco secundario (20), teniendo dicha ventana una dimensión y configuración tal como para proporcionar una parte de la radiación detectable para reflejar dentro de dicha cámara reflectora más de una vez, con lo cual la radiación detectable que emana del primer foco (18) continúa, bien directamente o bien después de una o varias reflexiones a través de dicha ventana (24 o 58).
ES478807A 1978-03-20 1979-03-20 Metodo y aparato para captar la radiacion detectable produ- cida por la presencia de material en forma de particulas Expired ES478807A1 (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US88856778A 1978-03-20 1978-03-20
US88856678A 1978-03-20 1978-03-20
US05/899,584 US4188543A (en) 1978-03-20 1978-04-24 Ellipsoid radiation collector apparatus and method
US05/899,583 US4188542A (en) 1978-03-20 1978-04-24 Mirror image ellipsoid radiation collector and method

Publications (1)

Publication Number Publication Date
ES478807A1 true ES478807A1 (es) 1980-07-01

Family

ID=27505976

Family Applications (1)

Application Number Title Priority Date Filing Date
ES478807A Expired ES478807A1 (es) 1978-03-20 1979-03-20 Metodo y aparato para captar la radiacion detectable produ- cida por la presencia de material en forma de particulas

Country Status (9)

Country Link
JP (1) JPS54130187A (es)
AU (1) AU4524979A (es)
CA (1) CA1127867A (es)
CH (1) CH629592A5 (es)
DE (1) DE2910031A1 (es)
ES (1) ES478807A1 (es)
FR (1) FR2420751A1 (es)
GB (1) GB2016735A (es)
SE (1) SE7902427L (es)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4692024A (en) * 1985-05-10 1987-09-08 Electro-Tec Corporation Automatic refractometer
JPS6214036A (ja) * 1985-07-12 1987-01-22 Rion Co Ltd 光散乱式粒子計数器
JP2635992B2 (ja) * 1988-03-24 1997-07-30 興和株式会社 微粒子測定装置
GB2231951A (en) * 1989-03-02 1990-11-28 I E I Detection apparatus and methods
US5170064A (en) * 1989-09-29 1992-12-08 Atomic Energy Of Canada Limited Infrared-based gas detector using a cavity having elliptical reflecting surface
GB2241080B (en) * 1990-02-19 1994-06-01 Perkin Elmer Ltd Improvements in or relating to analytical-sampling devices and associated spectrophotometric apparatus and method
EP0456427B1 (en) * 1990-05-08 1998-01-28 Canon Kabushiki Kaisha Polarization converting apparatus
US5262841A (en) * 1991-10-16 1993-11-16 Tsi Incorporated Vacuum particle detector
JP2577926Y2 (ja) * 1991-12-04 1998-08-06 横河電機株式会社 蛍光測定装置
JPH05264904A (ja) * 1992-03-18 1993-10-15 Canon Inc 照明光学系および該照明光学系を用いた投写型画像表示装置
DE4431921A1 (de) * 1994-09-08 1996-03-14 Rohde Helmut Lichtsammeleinrichtung
WO1998031054A1 (fr) * 1997-01-13 1998-07-16 Hitachi, Ltd. Transducteur photoelectrique et dispositif l'utilisant
WO2000063673A1 (en) * 1999-04-20 2000-10-26 The Secretary Of State For Defence Apparatus to detect shape, size and fluorescence of fluidborne particles
KR100494103B1 (ko) * 2003-12-12 2005-06-10 (주)이엘티 광학적 가스 센서

Also Published As

Publication number Publication date
SE7902427L (sv) 1979-09-21
CA1127867A (en) 1982-07-20
GB2016735A (en) 1979-09-26
AU4524979A (en) 1979-09-27
DE2910031A1 (de) 1979-10-04
JPS54130187A (en) 1979-10-09
FR2420751B3 (es) 1982-01-08
CH629592A5 (fr) 1982-04-30
FR2420751A1 (fr) 1979-10-19

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