ES554081A0 - Aparato para determinar el emplazamiento de defectos presentes en vidrio plano - Google Patents

Aparato para determinar el emplazamiento de defectos presentes en vidrio plano

Info

Publication number
ES554081A0
ES554081A0 ES554081A ES554081A ES554081A0 ES 554081 A0 ES554081 A0 ES 554081A0 ES 554081 A ES554081 A ES 554081A ES 554081 A ES554081 A ES 554081A ES 554081 A0 ES554081 A0 ES 554081A0
Authority
ES
Spain
Prior art keywords
location
flat glass
defects present
defects
present
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES554081A
Other languages
English (en)
Other versions
ES8707340A1 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Glass Europe SA
Original Assignee
Glaverbel Belgium SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glaverbel Belgium SA filed Critical Glaverbel Belgium SA
Publication of ES554081A0 publication Critical patent/ES554081A0/es
Publication of ES8707340A1 publication Critical patent/ES8707340A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/11—Monitoring and controlling the scan
    • G01N2201/117—Indexed, memorised or programmed scan

Landscapes

  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
ES554081A 1985-04-02 1986-04-02 Aparato para determinar el emplazamiento de defectos presentes en vidrio plano Expired ES8707340A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08508590A GB2173294B (en) 1985-04-02 1985-04-02 Method of and apparatus for determining the location of defects present in flat glass

Publications (2)

Publication Number Publication Date
ES554081A0 true ES554081A0 (es) 1987-07-16
ES8707340A1 ES8707340A1 (es) 1987-07-16

Family

ID=10577080

Family Applications (1)

Application Number Title Priority Date Filing Date
ES554081A Expired ES8707340A1 (es) 1985-04-02 1986-04-02 Aparato para determinar el emplazamiento de defectos presentes en vidrio plano

Country Status (10)

Country Link
AT (1) AT399596B (es)
BE (1) BE904465A (es)
DE (1) DE3610484C2 (es)
ES (1) ES8707340A1 (es)
FR (1) FR2579750B1 (es)
GB (1) GB2173294B (es)
IT (1) IT1189618B (es)
LU (1) LU86375A1 (es)
NL (1) NL194480C (es)
PT (1) PT82302B (es)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3641863A1 (de) * 1986-12-08 1988-06-09 Bosch Gmbh Robert Oberflaechenpruefvorrichtung
DE3641862A1 (de) * 1986-12-08 1988-06-09 Bosch Gmbh Robert Vorrichtung zur pruefung rotationssymmetrischer werkstuecke
DE3717274A1 (de) * 1987-05-22 1988-12-01 Sick Erwin Gmbh Optische fehlerinspektionsvorrichtung
JPH07151706A (ja) * 1993-09-03 1995-06-16 Minnesota Mining & Mfg Co <3M> 物品の欠陥検知装置及びその使用方法
GB9812091D0 (en) * 1998-06-05 1998-08-05 Glaverbel Defect detecting unit
DE102004027411A1 (de) * 2004-06-04 2005-12-29 Boraglas Gmbh Verfahren und Vorrichtung zur Identifizierung von Zinn- und Feuerseite bei Floatgläsern
JP5248052B2 (ja) 2006-10-11 2013-07-31 日東電工株式会社 光学フィルムを有するシート状製品の欠点検査装置、その検査データ処理装置、その切断装置及びその製造システム
AT509963B1 (de) 2010-06-07 2012-05-15 Hermann Sonnleitner Vorrichtung für das punktuelle reinigen und inspizieren von fehlern an flachglasscheiben
US8164818B2 (en) * 2010-11-08 2012-04-24 Soladigm, Inc. Electrochromic window fabrication methods
AT511055B1 (de) 2011-03-24 2012-09-15 Softsolution Gmbh Vorrichtung zur projektion von produkt- bzw. produktionsrelevanten bild- und textdaten an anlagen zur produktion von einzel- bzw. isolierglasscheiben
US10739658B2 (en) 2011-12-12 2020-08-11 View, Inc. Electrochromic laminates
US12321075B2 (en) 2011-12-12 2025-06-03 View Operating Corporation Electrochromic laminates
DE102014107542B4 (de) 2014-05-28 2020-02-06 Softsolution Gmbh Verfahren für die Herstellung von mehrscheibigen Flachglasprodukten
CN104730145B (zh) * 2015-03-06 2017-04-26 中国航空工业集团公司北京航空材料研究院 一种超声检测中精确定位材料上缺陷的方法
DE102015108553B4 (de) * 2015-05-29 2019-02-14 Schott Ag Verfahren und Vorrichtungen zur Reduzierung der Säbeligkeit bei Dünngläsern
DE102016104273B4 (de) * 2016-03-09 2021-02-04 Hegla Gmbh & Co. Kg Verfahren und Vorrichtung zur Behandlung von Flachglaseinheiten an einer glasverarbeitenden Anlage und Glasverarbeitende Anlage
CN107798376A (zh) * 2017-10-16 2018-03-13 福耀集团（上海）汽车玻璃有限公司 玻璃智能计数装置及计数方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL272308A (es) * 1960-12-13
US3445672A (en) * 1966-08-15 1969-05-20 Philco Ford Corp Flaw detection and marking system
GB1315654A (en) * 1969-05-21 1973-05-02 Pilkington Brothers Ltd Detection of faults in transparent material using lasers
FR2078535A5 (es) * 1970-02-16 1971-11-05 British Aircraft Corp Ltd
US3759620A (en) * 1972-05-30 1973-09-18 Philco Ford Corp Flaw detection and marking apparatus
GB1526930A (en) * 1974-12-19 1978-10-04 Bfg Glassgroup Process and apparatus for testing glass
US4038554A (en) * 1976-03-09 1977-07-26 Columbia Research Corporation Detection of flaws in a moving web of transparent material
US4097151A (en) * 1976-03-16 1978-06-27 Ppg Industries, Inc. Method of and apparatus for locating B type and point type defects in a glass ribbon
US4203672A (en) * 1976-11-18 1980-05-20 E. I. Du Pont De Nemours And Company Scanning beam displacement compensation control system
DE3034901A1 (de) * 1979-09-17 1981-04-30 Intec Corp., Trumbull, Conn. Automatische taststrahlpostitioniereinrichtung
US4306808A (en) * 1979-12-14 1981-12-22 Ford Aerospace & Communications Corp. Glass flaw inspection system

Also Published As

Publication number Publication date
DE3610484C2 (de) 1998-09-17
GB2173294A (en) 1986-10-08
AT399596B (de) 1995-06-26
FR2579750B1 (fr) 1988-11-10
NL8600790A (nl) 1986-11-03
NL194480C (nl) 2002-05-03
PT82302B (pt) 1992-06-30
DE3610484A1 (de) 1986-10-09
LU86375A1 (fr) 1986-06-24
GB2173294B (en) 1988-10-12
IT1189618B (it) 1988-02-04
IT8667222A0 (it) 1986-03-20
PT82302A (en) 1986-04-01
NL194480B (nl) 2002-01-02
ATA84086A (de) 1994-10-15
BE904465A (fr) 1986-09-24
FR2579750A1 (fr) 1986-10-03
GB8508590D0 (en) 1985-05-09
ES8707340A1 (es) 1987-07-16

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20040507