ES8302911A1 - Una instalacion y un metodo pra analizar un objeto. - Google Patents

Una instalacion y un metodo pra analizar un objeto.

Info

Publication number
ES8302911A1
ES8302911A1 ES505606A ES505606A ES8302911A1 ES 8302911 A1 ES8302911 A1 ES 8302911A1 ES 505606 A ES505606 A ES 505606A ES 505606 A ES505606 A ES 505606A ES 8302911 A1 ES8302911 A1 ES 8302911A1
Authority
ES
Spain
Prior art keywords
region
rejectable
respect
regions
defect analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES505606A
Other languages
English (en)
Other versions
ES505606A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Northrop Grumman Space and Mission Systems Corp
Original Assignee
TRW Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TRW Inc filed Critical TRW Inc
Publication of ES8302911A1 publication Critical patent/ES8302911A1/es
Publication of ES505606A0 publication Critical patent/ES505606A0/es
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/187—Segmentation; Edge detection involving region growing; involving region merging; involving connected component labelling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N2021/646—Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20076—Probabilistic image processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Abstract

_(PROCEDIMIENTO E INSTALACION PARA LA DETECCION DE DEFECTOS EN COMPONENTES METALICOS . EL SISTEMA INCLUYE MEDIOS DE FORMACION DE IMAGEN PARA PROPORCIONAR SEÑALES REPRESENTATIVAS DE ELEMENTOS DE IMAGEN DICRETOS CONTENIDOS EN DICHA IMAGEN; MEDIOS PARA SELECCIONAR AQUELLAS SEÑALES CORRESPONDIENTES A CIERTOS ELEMENTOS DE IMAGEN; MEDIOS PARA TRATAR LAS SEÑALES SELECCIONADAS, DEFINIENDO LA GEOMETRIA DE UNA O MAS REGIONES DE ELEMENTOS DE IMAGEN CONTIGUOS; MEDIO PARA COMPARAR LA GEOMETRIA DE UNA O MAS REGIONES CON UNOS PARAMETROS PREFIJADOS CON EL FIN DE ANALIZAR CADA REGION RESPECTO A LOS PARAMETROS Y DAR UNA SALIDA INDICATIVA DEL RESULTADO DE LA COMPARACION DE LA REGION CON LOS PARAMETROS.
ES505606A 1980-09-19 1981-09-18 Una instalacion y un metodo pra analizar un objeto. Granted ES505606A0 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18865180A 1980-09-19 1980-09-19

Publications (2)

Publication Number Publication Date
ES8302911A1 true ES8302911A1 (es) 1982-12-01
ES505606A0 ES505606A0 (es) 1982-12-01

Family

ID=22694021

Family Applications (1)

Application Number Title Priority Date Filing Date
ES505606A Granted ES505606A0 (es) 1980-09-19 1981-09-18 Una instalacion y un metodo pra analizar un objeto.

Country Status (8)

Country Link
EP (1) EP0048568A3 (es)
JP (1) JPS57118145A (es)
AU (1) AU7517681A (es)
BR (1) BR8105987A (es)
CA (1) CA1175555A (es)
ES (1) ES505606A0 (es)
IL (1) IL63781A (es)
MX (1) MX151484A (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2049163A2 (es) * 1991-01-14 1994-04-01 Westinghouse Electric Corp Metodo y aparato para la inspeccion de pastillas de combustible nuclear de configuracion cilindrica.

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
US4542527A (en) * 1982-05-17 1985-09-17 Tokyo Shibaura Denki Kabushiki Kaisha Image processing device for continuously extracting features of small regions of an image
FR2571519B1 (fr) * 1984-10-04 1986-12-26 Mounet Jean Francois Systeme de traitement de donnees
JPH0772718B2 (ja) * 1985-02-15 1995-08-02 株式会社日立製作所 外観検査装置
IL79098A0 (en) * 1985-07-15 1986-09-30 Visionetics Corp Fine flaw detector for printed circuit boards
US4918739A (en) * 1988-08-12 1990-04-17 Maraven, S.A. Process and system for digital analysis of images applied to stratigraphic data
GB2222879A (en) * 1988-09-15 1990-03-21 Gkn Technology Ltd Crack detecting apparatus
GB9008632D0 (en) * 1990-04-17 1990-06-13 Leicester Polytechnic Inspecting garments
JPH0820380B2 (ja) * 1990-07-30 1996-03-04 参天製薬株式会社 樹脂成形品の検査装置
IT1246047B (it) * 1990-12-21 1994-11-07 Pirelli Prod Diversificati Procedimento ed apparecchiatura per individuare difettosita' supeficiali su strati e/o manicotti in materiale elastomerico
JPH0678895B2 (ja) * 1991-01-24 1994-10-05 肇産業株式会社 欠陥判別方法
GB9105358D0 (en) * 1991-03-13 1991-04-24 Secr Defence Anomaly detector
EP0572336B1 (en) * 1992-05-29 2001-03-14 Eastman Kodak Company Coating density analyzer and method using image processing
US5304519A (en) * 1992-10-28 1994-04-19 Praxair S.T. Technology, Inc. Powder feed composition for forming a refraction oxide coating, process used and article so produced
FI100366B (fi) * 1994-09-01 1997-11-14 Spectra Physics Visiontech Oy Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta
EP1016862A1 (de) * 1998-12-28 2000-07-05 Siemens Aktiengesellschaft Verfahren sowie Vorrichtung zur Qualitätsüberprüfung einer Beschichtung
US8775436B1 (en) * 2004-03-19 2014-07-08 Google Inc. Image selection for news search
US8208711B2 (en) * 2007-09-07 2012-06-26 General Electric Company Method for automatic identification of defects in turbine engine blades
CN102384839A (zh) * 2010-09-06 2012-03-21 信义超薄玻璃(东莞)有限公司 获取玻璃光学性能的装置
CN103175848B (zh) * 2013-02-05 2015-01-14 厦门大学 一种rcf型铣刀刃部崩缺在线检测方法
CN103473781B (zh) * 2013-09-22 2016-03-23 长安大学 一种公路岩体边坡图像中节理裂纹的分割方法
CN119147543B (zh) * 2024-09-13 2026-04-28 珠海格力电器股份有限公司 空调器翅片的缺陷检测方法及装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3694658A (en) * 1970-10-22 1972-09-26 Morvue Inc Veneer inspection system
US3729619A (en) * 1971-03-04 1973-04-24 Steel Corp Apparatus for surface inspection of moving material with defect type recognition
US4183013A (en) * 1976-11-29 1980-01-08 Coulter Electronics, Inc. System for extracting shape features from an image
US4237539A (en) * 1977-11-21 1980-12-02 E. I. Du Pont De Nemours And Company On-line web inspection system
DE3027373A1 (de) * 1979-07-20 1981-03-19 Hitachi, Ltd., Tokyo Verfahren und einrichtung zur oberflaechenpruefung
JPS5677704A (en) * 1979-11-30 1981-06-26 Hitachi Ltd Inspection system for surface defect of substance

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2049163A2 (es) * 1991-01-14 1994-04-01 Westinghouse Electric Corp Metodo y aparato para la inspeccion de pastillas de combustible nuclear de configuracion cilindrica.

Also Published As

Publication number Publication date
AU7517681A (en) 1982-03-25
MX151484A (es) 1984-12-03
CA1175555A (en) 1984-10-02
EP0048568A3 (en) 1983-09-21
BR8105987A (pt) 1982-06-08
IL63781A (en) 1985-03-31
JPS57118145A (en) 1982-07-22
ES505606A0 (es) 1982-12-01
EP0048568A2 (en) 1982-03-31

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