FR1117963A - Dispositif d'examen des substances cristallines par diffraction des rayons chi et procédé de réglage du goniomètre de diffraction - Google Patents

Dispositif d'examen des substances cristallines par diffraction des rayons chi et procédé de réglage du goniomètre de diffraction

Info

Publication number
FR1117963A
FR1117963A FR1117963DA FR1117963A FR 1117963 A FR1117963 A FR 1117963A FR 1117963D A FR1117963D A FR 1117963DA FR 1117963 A FR1117963 A FR 1117963A
Authority
FR
France
Prior art keywords
diffraction
chi
adjusting
goniometer
crystalline substances
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of FR1117963A publication Critical patent/FR1117963A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR1117963D 1954-01-18 1955-01-18 Dispositif d'examen des substances cristallines par diffraction des rayons chi et procédé de réglage du goniomètre de diffraction Expired FR1117963A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US404518A US2709752A (en) 1954-01-18 1954-01-18 Method of aligning an X-ray diffraction goniometer and apparatus therefor

Publications (1)

Publication Number Publication Date
FR1117963A true FR1117963A (fr) 1956-05-30

Family

ID=23599923

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1117963D Expired FR1117963A (fr) 1954-01-18 1955-01-18 Dispositif d'examen des substances cristallines par diffraction des rayons chi et procédé de réglage du goniomètre de diffraction

Country Status (6)

Country Link
US (1) US2709752A (fr)
BE (1) BE534930A (fr)
CH (1) CH332875A (fr)
DE (1) DE1096637B (fr)
FR (1) FR1117963A (fr)
GB (1) GB777275A (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2944153A (en) * 1955-04-04 1960-07-05 Philips Corp Energy calibration source holder
US3005098A (en) * 1958-03-31 1961-10-17 Gen Electric X-ray emission analysis
DE1140740B (de) * 1960-10-04 1962-12-06 Continental Elektro Ind Ag Einrichtung zum Nachweis der Reflexionsrichtung eines nicht sichtbaren Strahlenbuendels, insbesondere eines Neutronenstrahlenbuendels
US3331978A (en) * 1962-05-28 1967-07-18 Varian Associates Electron beam x-ray generator with movable, fluid-cooled target
US3489896A (en) * 1966-11-01 1970-01-13 Ashland Oil Inc Alignment tool or device for cooling blade
JP7616659B2 (ja) * 2021-11-18 2025-01-17 株式会社リガク 補正量特定装置、方法、プログラムおよび治具

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1589833A (en) * 1923-12-21 1926-06-22 Behnken Hermann Measuring device for the examination of electromagnetic waves
DE616314C (de) * 1928-05-30 1935-07-31 Siemens Reiniger Werke Akt Ges Blendenvorrichtung fuer Roentgenroehren
US2452045A (en) * 1945-08-08 1948-10-26 Friedman Herbert X-ray apparatus and method for crystal analysis
US2449066A (en) * 1946-07-19 1948-09-14 Friedman Herbert Analysis by fluorescent X-ray excitation
US2514791A (en) * 1947-02-15 1950-07-11 Philips Lab Inc X-ray collimating system
US2559972A (en) * 1950-07-28 1951-07-10 Research Corp Formation of x-ray images by refractive focusing

Also Published As

Publication number Publication date
US2709752A (en) 1955-05-31
CH332875A (de) 1958-11-15
GB777275A (en) 1957-06-19
DE1096637B (de) 1961-01-05
BE534930A (fr) 1955-07-18

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