FR1357367A - Spectromètre à rayons x - Google Patents

Spectromètre à rayons x

Info

Publication number
FR1357367A
FR1357367A FR935266A FR935266A FR1357367A FR 1357367 A FR1357367 A FR 1357367A FR 935266 A FR935266 A FR 935266A FR 935266 A FR935266 A FR 935266A FR 1357367 A FR1357367 A FR 1357367A
Authority
FR
France
Prior art keywords
ray spectrometer
spectrometer
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR935266A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of FR1357367A publication Critical patent/FR1357367A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR935266A 1962-05-18 1963-05-17 Spectromètre à rayons x Expired FR1357367A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1973762 1962-05-18

Publications (1)

Publication Number Publication Date
FR1357367A true FR1357367A (fr) 1964-04-03

Family

ID=12007626

Family Applications (1)

Application Number Title Priority Date Filing Date
FR935266A Expired FR1357367A (fr) 1962-05-18 1963-05-17 Spectromètre à rayons x

Country Status (2)

Country Link
US (1) US3242335A (fr)
FR (1) FR1357367A (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4492466A (en) * 1982-06-28 1985-01-08 At&T Bell Laboratories Cylindrical grating monochromator for synchrotron radiation
US4752685A (en) 1985-06-07 1988-06-21 Anelva Corporation Electronic spectrometer for identifying element conditions of a sample surface by utilizing an energy spectrum of charged particles
NL2005661C2 (en) * 2010-11-10 2012-05-14 Univ Delft Tech Instrument for measuring a diffraction pattern of a specimen.

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1865441A (en) * 1923-08-04 1932-07-05 Wappler Electric Company Inc Method of and apparatus for controlling the direction of x-rays
US2881327A (en) * 1955-10-14 1959-04-07 Philips Corp Method and apparatus for making x-ray measurements

Also Published As

Publication number Publication date
US3242335A (en) 1966-03-22

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