FR1432035A - Perfectionnements aux méthodes de contrôle de semiconducteurs - Google Patents

Perfectionnements aux méthodes de contrôle de semiconducteurs

Info

Publication number
FR1432035A
FR1432035A FR10634A FR10634A FR1432035A FR 1432035 A FR1432035 A FR 1432035A FR 10634 A FR10634 A FR 10634A FR 10634 A FR10634 A FR 10634A FR 1432035 A FR1432035 A FR 1432035A
Authority
FR
France
Prior art keywords
testing methods
semiconductor testing
semiconductor
methods
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR10634A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US355688A external-priority patent/US3379625A/en
Application filed by General Electric Co filed Critical General Electric Co
Priority to FR10634A priority Critical patent/FR1432035A/fr
Application granted granted Critical
Publication of FR1432035A publication Critical patent/FR1432035A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
    • H10P74/235—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes comprising optical enhancement of defects or not-directly-visible states
FR10634A 1964-03-30 1965-03-25 Perfectionnements aux méthodes de contrôle de semiconducteurs Expired FR1432035A (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR10634A FR1432035A (fr) 1964-03-30 1965-03-25 Perfectionnements aux méthodes de contrôle de semiconducteurs

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US355688A US3379625A (en) 1964-03-30 1964-03-30 Semiconductor testing
FR10634A FR1432035A (fr) 1964-03-30 1965-03-25 Perfectionnements aux méthodes de contrôle de semiconducteurs

Publications (1)

Publication Number Publication Date
FR1432035A true FR1432035A (fr) 1966-03-18

Family

ID=26162646

Family Applications (1)

Application Number Title Priority Date Filing Date
FR10634A Expired FR1432035A (fr) 1964-03-30 1965-03-25 Perfectionnements aux méthodes de contrôle de semiconducteurs

Country Status (1)

Country Link
FR (1) FR1432035A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2041035A1 (de) * 1970-08-18 1972-02-24 Siemens Ag Verfahren zum gleichzeitigen Erzeugen einer Vielzahl von gleichen Halbleiterbauelementen mit pn-UEbergang aus einer einzigen Halbleiterscheibe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2041035A1 (de) * 1970-08-18 1972-02-24 Siemens Ag Verfahren zum gleichzeitigen Erzeugen einer Vielzahl von gleichen Halbleiterbauelementen mit pn-UEbergang aus einer einzigen Halbleiterscheibe

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