FR1530448A - Analyseur d'échantillons par rayonnement radioactif - Google Patents

Analyseur d'échantillons par rayonnement radioactif

Info

Publication number: FR1530448A
Authority: FR; France
Prior art keywords: sample analyzer; radioactive sample; radioactive; analyzer; sample
Prior art date: 1966-09-29
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

FR78214A

Other languages

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Ube Corp

Original Assignee

Ube Industries Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1966-09-29

Filing date

1966-09-29

Publication date

1968-06-28

1966-09-29 Application filed by Ube Industries Ltd filed Critical Ube Industries Ltd

1966-09-29 Priority to FR78214A priority Critical patent/FR1530448A/fr

1968-06-28 Application granted granted Critical

1968-06-28 Publication of FR1530448A publication Critical patent/FR1530448A/fr

Status Expired legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/1006—Different kinds of radiation or particles different radiations, e.g. X and alpha
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/104—Different kinds of radiation or particles ions
- G01N2223/1045—Different kinds of radiation or particles ions alpha
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/202—Sources of radiation isotopes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc

Landscapes

Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)

FR78214A 1966-09-29 1966-09-29 Analyseur d'échantillons par rayonnement radioactif Expired FR1530448A (fr)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
FR78214A FR1530448A (fr)	1966-09-29	1966-09-29	Analyseur d'échantillons par rayonnement radioactif

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
FR78214A FR1530448A (fr)	1966-09-29	1966-09-29	Analyseur d'échantillons par rayonnement radioactif

Publications (1)

Publication Number	Publication Date
FR1530448A true FR1530448A (fr)	1968-06-28

Family

ID=8618147

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FR78214A Expired FR1530448A (fr)	1966-09-29	1966-09-29	Analyseur d'échantillons par rayonnement radioactif

Country Status (1)

Country	Link
FR (1)	FR1530448A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
WO2007074166A1 (fr) *	2005-12-29	2007-07-05	Commissariat A L'energie Atomique	Mesure d'epaisseur de film(s) present(s) en couche mince sur un support echantillon

1966
- 1966-09-29 FR FR78214A patent/FR1530448A/fr not_active Expired

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
WO2007074166A1 (fr) *	2005-12-29	2007-07-05	Commissariat A L'energie Atomique	Mesure d'epaisseur de film(s) present(s) en couche mince sur un support echantillon
FR2895792A1 (fr) *	2005-12-29	2007-07-06	Commissariat Energie Atomique	Mesure d'epaisseur de film(s) present(s) en couche mince sur un support echantillon

Publication	Publication Date	Title
SE330447B (sv)	1970-11-16	Vägningsanordning
BR6684866D0 (pt)	1973-08-09	Analise de particulas
AT293749B (de)	1971-10-25	Mikrotom
FR1508040A (fr)	1967-12-29	Microtome perfectionné
FR1469145A (fr)	1967-02-10	Analyseur sonique
FR1501359A (fr)	1967-11-10	Détecteur d'approche
FR1521431A (fr)	1968-04-19	étalon de fréquence atomique réglable
FR1513306A (fr)	1968-02-16	Perfectionnements aux installations d'analyses
AT277937B (de)	1970-01-12	Stabilisiertes Testreagens
FR1338320A (fr)	1963-09-27	Densimètre
CH467449A (de)	1969-01-15	Röntgenstrahlenmikroskop
CH466609A (de)	1968-12-15	Automatisches Analysiergerät
CH487396A (de)	1970-03-15	Wägevorrichtung
FR1552704A (fr)	1969-01-03	Passeur d'échantillons
CH472025A (de)	1969-04-30	Mehrkanal-Analysierautomat
CH452938A (fr)	1968-03-15	Analyseur de sommets
AT266774B (de)	1968-11-25	Befestigungseinrichtung von Kassetten
FR1452600A (fr)	1966-02-25	Bandes d'épreuve
CH450747A (de)	1968-01-31	Wiegeeinrichtung
AT290163B (de)	1971-05-25	Photometrischer Analysator
FR1485543A (fr)	1967-06-23	Cryostat
CH466596A (de)	1968-12-15	Wägevorrichtung
FR1510775A (fr)	1968-01-19	Perfectionnements aux circuits d'échantillonnage
CH422048A (fr)	1966-10-15	Tube analyseur d'image
FR1521225A (fr)	1968-04-12	Ultramicrotome