FR2312031A2 - Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires - Google Patents

Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires

Info

Publication number
FR2312031A2
FR2312031A2 FR7516206A FR7516206A FR2312031A2 FR 2312031 A2 FR2312031 A2 FR 2312031A2 FR 7516206 A FR7516206 A FR 7516206A FR 7516206 A FR7516206 A FR 7516206A FR 2312031 A2 FR2312031 A2 FR 2312031A2
Authority
FR
France
Prior art keywords
primary
intensity
energy
monokinetic
electrons
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7516206A
Other languages
English (en)
Other versions
FR2312031B2 (fr
Inventor
Claude Le Gressus
Daniel Massignon
Rene Sopizet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR7516206A priority Critical patent/FR2312031A2/fr
Priority to DE19752546053 priority patent/DE2546053A1/de
Priority to GB42084/75A priority patent/GB1530277A/en
Priority to US05/641,240 priority patent/US4034220A/en
Priority to CA242,530A priority patent/CA1048163A/fr
Priority to IL48721A priority patent/IL48721A/xx
Priority to CH1677775A priority patent/CH592306A5/xx
Priority to JP15966475A priority patent/JPS557179B2/ja
Priority to SE7514717A priority patent/SE413556B/xx
Priority to NL7515242A priority patent/NL7515242A/xx
Priority to ES444049A priority patent/ES444049A1/es
Publication of FR2312031A2 publication Critical patent/FR2312031A2/fr
Application granted granted Critical
Publication of FR2312031B2 publication Critical patent/FR2312031B2/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7516206A 1975-01-02 1975-05-23 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires Granted FR2312031A2 (fr)

Priority Applications (11)

Application Number Priority Date Filing Date Title
FR7516206A FR2312031A2 (fr) 1975-05-23 1975-05-23 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires
DE19752546053 DE2546053A1 (de) 1975-01-02 1975-10-14 Verfahren und vorrichtung zur analyse durch spektralanalyse der energie von sekundaerelektronen
GB42084/75A GB1530277A (en) 1975-01-02 1975-10-14 Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
US05/641,240 US4034220A (en) 1975-01-02 1975-12-16 Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
CA242,530A CA1048163A (fr) 1975-01-02 1975-12-22 Appareil et methode d'analyse elementaire et chimique d'un echantillon par analyse spectrale de l'energie des electrons secondaires.
CH1677775A CH592306A5 (fr) 1975-01-02 1975-12-24
IL48721A IL48721A (en) 1975-01-02 1975-12-24 Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of thesecondary electrons
JP15966475A JPS557179B2 (fr) 1975-01-02 1975-12-29
SE7514717A SE413556B (sv) 1975-01-02 1975-12-29 Sett for analys av ett elektronbestralat prov medelst utsenda sekunderelektroner samt anordning for genomforande av settet
NL7515242A NL7515242A (nl) 1975-01-02 1975-12-31 Werkwijze en inrichting voor spectraal-analyse.
ES444049A ES444049A1 (es) 1975-01-02 1976-01-02 Procedimiento y dispositivo de analisis elemental y quimico de una muestra.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7516206A FR2312031A2 (fr) 1975-05-23 1975-05-23 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires

Publications (2)

Publication Number Publication Date
FR2312031A2 true FR2312031A2 (fr) 1976-12-17
FR2312031B2 FR2312031B2 (fr) 1978-02-03

Family

ID=9155624

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7516206A Granted FR2312031A2 (fr) 1975-01-02 1975-05-23 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires

Country Status (1)

Country Link
FR (1) FR2312031A2 (fr)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1192816A (en) * 1966-10-17 1970-05-20 Hitachi Ltd Scanning Type Electron Microscope

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1192816A (en) * 1966-10-17 1970-05-20 Hitachi Ltd Scanning Type Electron Microscope

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ARTICLE DE C. LE GRESSERS ET AL: "OPTIQUE ELECTRONIQUE-NOUVELLE METHODE D'ANALYSE DU SPECTRE DES ELECTRONS SECONDAIRES" *
REVUE FR "COMPTES RENDUS DE L'ACADEMIE DES SCIENCES", PARIS, SERIE B, TOME 280 NUMERO 14, 14 AVRIL 1975, PAGES 439 A 442 *

Also Published As

Publication number Publication date
FR2312031B2 (fr) 1978-02-03

Similar Documents

Publication Publication Date Title
ES444049A1 (es) Procedimiento y dispositivo de analisis elemental y quimico de una muestra.
Bordoni Channel electron multiplier efficiency for 10–1000 eV electrons
US4158775A (en) High resolution threshold photoelectron spectroscopy by electron attachment
US3840743A (en) Ion microanalyzer
US2559688A (en) Absorption spectrometry with use of radio-frequency modulated light source
ES454412A1 (es) Dispositivo de analisis por espectrometria fotoelectronica de una muestra de material aislante.
FR2296847A1 (fr) Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires
CN109755096B (zh) 筛选式飞行时间质谱仪及检测方法
US2944146A (en) Mass spectrometer
JPH0334253A (ja) イオン検出器
US3935454A (en) Electron collection in electron spectrometers
GB2148050A (en) Ac-modulation quadrupole mass spectrometer
US2463545A (en) Mass spectrometry
US3585385A (en) Method and apparatus for heat treating a material and monitoring the material content x-ray spectrographically
JPS6445047A (en) Measuring device for cathode luminesence
SE8403318D0 (sv) Spektrometer
US2463544A (en) Mass spectrometry
SU830597A1 (ru) Способ детектировани сигналаВ PACTPOBOM элЕКТРОННОМ МиКРОСКОпЕ
JPS52149193A (en) Method of and apparatus for analyzing cathode luminescence
SU1307493A1 (ru) Способ анализа ионов в гиперболоидном масс-спектрометре типа ионной ловушки
SU1688304A1 (ru) Способ анализа ионов в гиперболоидном масс-спектрометре типа трехмерной ловушки
US2842673A (en) New type electronics tube
SU705346A1 (ru) Измеритель ускорений
JPS55121140A (en) Photoelectric spectroscope
SU805076A1 (ru) Способ определени амплитудно- чАСТОТНОй ХАРАКТЕРиСТиКи фОТО-уМНОжиТЕл