FR2495331B1 - - Google Patents

Info

Publication number
FR2495331B1
FR2495331B1 FR8025247A FR8025247A FR2495331B1 FR 2495331 B1 FR2495331 B1 FR 2495331B1 FR 8025247 A FR8025247 A FR 8025247A FR 8025247 A FR8025247 A FR 8025247A FR 2495331 B1 FR2495331 B1 FR 2495331B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8025247A
Other languages
French (fr)
Other versions
FR2495331A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SOGUINTEL
Original Assignee
SOGUINTEL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SOGUINTEL filed Critical SOGUINTEL
Priority to FR8025247A priority Critical patent/FR2495331A1/fr
Publication of FR2495331A1 publication Critical patent/FR2495331A1/fr
Application granted granted Critical
Publication of FR2495331B1 publication Critical patent/FR2495331B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G01R31/275—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electronic Switches (AREA)
FR8025247A 1980-11-28 1980-11-28 Detecteur de defauts sur photocoupleur Granted FR2495331A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8025247A FR2495331A1 (fr) 1980-11-28 1980-11-28 Detecteur de defauts sur photocoupleur

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8025247A FR2495331A1 (fr) 1980-11-28 1980-11-28 Detecteur de defauts sur photocoupleur

Publications (2)

Publication Number Publication Date
FR2495331A1 FR2495331A1 (fr) 1982-06-04
FR2495331B1 true FR2495331B1 (2) 1983-02-04

Family

ID=9248430

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8025247A Granted FR2495331A1 (fr) 1980-11-28 1980-11-28 Detecteur de defauts sur photocoupleur

Country Status (1)

Country Link
FR (1) FR2495331A1 (2)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH607043A5 (2) * 1974-10-31 1978-11-30 Stanislav Vasilievic Ugolnikov

Also Published As

Publication number Publication date
FR2495331A1 (fr) 1982-06-04

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Legal Events

Date Code Title Description
ST Notification of lapse