FR2681949B1 - Analyseur de faisceaux d'electrons. - Google Patents
Analyseur de faisceaux d'electrons.Info
- Publication number
- FR2681949B1 FR2681949B1 FR9112090A FR9112090A FR2681949B1 FR 2681949 B1 FR2681949 B1 FR 2681949B1 FR 9112090 A FR9112090 A FR 9112090A FR 9112090 A FR9112090 A FR 9112090A FR 2681949 B1 FR2681949 B1 FR 2681949B1
- Authority
- FR
- France
- Prior art keywords
- electron beam
- beam analyzer
- analyzer
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000010894 electron beam technology Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR9112090A FR2681949B1 (fr) | 1991-09-27 | 1991-09-27 | Analyseur de faisceaux d'electrons. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR9112090A FR2681949B1 (fr) | 1991-09-27 | 1991-09-27 | Analyseur de faisceaux d'electrons. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2681949A1 FR2681949A1 (fr) | 1993-04-02 |
| FR2681949B1 true FR2681949B1 (fr) | 1994-01-14 |
Family
ID=9417489
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR9112090A Expired - Fee Related FR2681949B1 (fr) | 1991-09-27 | 1991-09-27 | Analyseur de faisceaux d'electrons. |
Country Status (1)
| Country | Link |
|---|---|
| FR (1) | FR2681949B1 (fr) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2591036A1 (fr) * | 1985-12-04 | 1987-06-05 | Balteau | Dispositif de detection et de localisation de particules neutres, et applications |
| US4724321A (en) * | 1986-08-11 | 1988-02-09 | The United States Of America As Represented By The Secretary Of The Army | Beam intensity monitor for a high energy particle beam system |
-
1991
- 1991-09-27 FR FR9112090A patent/FR2681949B1/fr not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| FR2681949A1 (fr) | 1993-04-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |