FR2801421B1 - Transistor mos a drain etendu - Google Patents
Transistor mos a drain etenduInfo
- Publication number
- FR2801421B1 FR2801421B1 FR9914484A FR9914484A FR2801421B1 FR 2801421 B1 FR2801421 B1 FR 2801421B1 FR 9914484 A FR9914484 A FR 9914484A FR 9914484 A FR9914484 A FR 9914484A FR 2801421 B1 FR2801421 B1 FR 2801421B1
- Authority
- FR
- France
- Prior art keywords
- mos transistor
- extended drain
- drain mos
- extended
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/0221—Manufacture or treatment of FETs having insulated gates [IGFET] having asymmetry in the channel direction, e.g. lateral high-voltage MISFETs having drain offset region or extended-drain MOSFETs [EDMOS]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/601—Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs
- H10D30/603—Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs having asymmetry in the channel direction, e.g. lateral high-voltage MISFETs having drain offset region or extended drain IGFETs [EDMOS]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/01—Manufacture or treatment
- H10D64/021—Manufacture or treatment using multiple gate spacer layers, e.g. bilayered sidewall spacers
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR9914484A FR2801421B1 (fr) | 1999-11-18 | 1999-11-18 | Transistor mos a drain etendu |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR9914484A FR2801421B1 (fr) | 1999-11-18 | 1999-11-18 | Transistor mos a drain etendu |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2801421A1 FR2801421A1 (fr) | 2001-05-25 |
| FR2801421B1 true FR2801421B1 (fr) | 2003-10-24 |
Family
ID=9552242
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR9914484A Expired - Fee Related FR2801421B1 (fr) | 1999-11-18 | 1999-11-18 | Transistor mos a drain etendu |
Country Status (1)
| Country | Link |
|---|---|
| FR (1) | FR2801421B1 (fr) |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6476768A (en) * | 1987-09-18 | 1989-03-22 | Nec Corp | Semiconductor device and manufacture thereof |
| KR950000141B1 (ko) * | 1990-04-03 | 1995-01-10 | 미쓰비시 뎅끼 가부시끼가이샤 | 반도체 장치 및 그 제조방법 |
| US5168072A (en) * | 1990-10-12 | 1992-12-01 | Texas Instruments Incorporated | Method of fabricating an high-performance insulated-gate field-effect transistor |
| US5661048A (en) * | 1995-03-21 | 1997-08-26 | Motorola, Inc. | Method of making an insulated gate semiconductor device |
| US5759897A (en) * | 1996-09-03 | 1998-06-02 | Advanced Micro Devices, Inc. | Method of making an asymmetrical transistor with lightly and heavily doped drain regions and ultra-heavily doped source region |
| US5744371A (en) * | 1996-10-01 | 1998-04-28 | Kadosh; Daniel | Asymmetrical p-channel transistor having a boron migration barrier and LDD implant only in the drain region |
| US5789298A (en) * | 1996-11-04 | 1998-08-04 | Advanced Micro Devices, Inc. | High performance mosfet structure having asymmetrical spacer formation and method of making the same |
| US5904529A (en) * | 1997-08-25 | 1999-05-18 | Advanced Micro Devices, Inc. | Method of making an asymmetrical IGFET and providing a field dielectric between active regions of a semiconductor substrate |
-
1999
- 1999-11-18 FR FR9914484A patent/FR2801421B1/fr not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| FR2801421A1 (fr) | 2001-05-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |
Effective date: 20090731 |