FR2875304B1 - Sonde de mesure de caracteristiques d'un courant d'excitation d'un plasma, et reacteur a plasma associe - Google Patents

Sonde de mesure de caracteristiques d'un courant d'excitation d'un plasma, et reacteur a plasma associe

Info

Publication number
FR2875304B1
FR2875304B1 FR0409811A FR0409811A FR2875304B1 FR 2875304 B1 FR2875304 B1 FR 2875304B1 FR 0409811 A FR0409811 A FR 0409811A FR 0409811 A FR0409811 A FR 0409811A FR 2875304 B1 FR2875304 B1 FR 2875304B1
Authority
FR
France
Prior art keywords
probe
measurement
excitation current
plasma
plasma reactor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0409811A
Other languages
English (en)
Other versions
FR2875304A1 (fr
Inventor
Sebastien Dine
Jacques Jolly
Jean Bernard Pierre Larour
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Ecole Polytechnique
Original Assignee
Centre National de la Recherche Scientifique CNRS
Ecole Polytechnique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Ecole Polytechnique filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR0409811A priority Critical patent/FR2875304B1/fr
Priority to US11/663,129 priority patent/US7615985B2/en
Priority to EP05789496.6A priority patent/EP1794600B1/fr
Priority to PCT/EP2005/054599 priority patent/WO2006030024A1/fr
Priority to JP2007531750A priority patent/JP5209313B2/ja
Publication of FR2875304A1 publication Critical patent/FR2875304A1/fr
Application granted granted Critical
Publication of FR2875304B1 publication Critical patent/FR2875304B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/0006—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature
    • H05H1/0081—Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature by electric means

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Plasma Technology (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Chemical Vapour Deposition (AREA)
  • Drying Of Semiconductors (AREA)
FR0409811A 2004-09-16 2004-09-16 Sonde de mesure de caracteristiques d'un courant d'excitation d'un plasma, et reacteur a plasma associe Expired - Fee Related FR2875304B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR0409811A FR2875304B1 (fr) 2004-09-16 2004-09-16 Sonde de mesure de caracteristiques d'un courant d'excitation d'un plasma, et reacteur a plasma associe
US11/663,129 US7615985B2 (en) 2004-09-16 2005-09-15 Probe for measuring characteristics of an excitation current of a plasma, and associated plasma reactor
EP05789496.6A EP1794600B1 (fr) 2004-09-16 2005-09-15 Sonde de mesure de caracteristiques d'un courant d'excitation d'un plasma, et reacteur a plasma associe.
PCT/EP2005/054599 WO2006030024A1 (fr) 2004-09-16 2005-09-15 Sonde de mesure de caracteristiques d'un courant d'excitation d'un plasma, et reacteur a plasma associe.
JP2007531750A JP5209313B2 (ja) 2004-09-16 2005-09-15 プラズマの励起電流の特性を測定するためのプローブ、および関連するプラズマ反応器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0409811A FR2875304B1 (fr) 2004-09-16 2004-09-16 Sonde de mesure de caracteristiques d'un courant d'excitation d'un plasma, et reacteur a plasma associe

Publications (2)

Publication Number Publication Date
FR2875304A1 FR2875304A1 (fr) 2006-03-17
FR2875304B1 true FR2875304B1 (fr) 2006-12-22

Family

ID=34949006

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0409811A Expired - Fee Related FR2875304B1 (fr) 2004-09-16 2004-09-16 Sonde de mesure de caracteristiques d'un courant d'excitation d'un plasma, et reacteur a plasma associe

Country Status (5)

Country Link
US (1) US7615985B2 (fr)
EP (1) EP1794600B1 (fr)
JP (1) JP5209313B2 (fr)
FR (1) FR2875304B1 (fr)
WO (1) WO2006030024A1 (fr)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
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US7722778B2 (en) * 2006-06-28 2010-05-25 Lam Research Corporation Methods and apparatus for sensing unconfinement in a plasma processing chamber
WO2010094002A2 (fr) * 2009-02-13 2010-08-19 Applied Materials, Inc. Bus rf et bus retour rf pour électrode de chambre plasma
US8501631B2 (en) 2009-11-19 2013-08-06 Lam Research Corporation Plasma processing system control based on RF voltage
US9114666B2 (en) 2012-02-22 2015-08-25 Lam Research Corporation Methods and apparatus for controlling plasma in a plasma processing system
US9197196B2 (en) 2012-02-22 2015-11-24 Lam Research Corporation State-based adjustment of power and frequency
US9462672B2 (en) 2012-02-22 2016-10-04 Lam Research Corporation Adjustment of power and frequency based on three or more states
US9295148B2 (en) 2012-12-14 2016-03-22 Lam Research Corporation Computation of statistics for statistical data decimation
US9842725B2 (en) 2013-01-31 2017-12-12 Lam Research Corporation Using modeling to determine ion energy associated with a plasma system
US10325759B2 (en) 2012-02-22 2019-06-18 Lam Research Corporation Multiple control modes
US9368329B2 (en) 2012-02-22 2016-06-14 Lam Research Corporation Methods and apparatus for synchronizing RF pulses in a plasma processing system
US9171699B2 (en) 2012-02-22 2015-10-27 Lam Research Corporation Impedance-based adjustment of power and frequency
US9320126B2 (en) 2012-12-17 2016-04-19 Lam Research Corporation Determining a value of a variable on an RF transmission model
US9390893B2 (en) 2012-02-22 2016-07-12 Lam Research Corporation Sub-pulsing during a state
US9502216B2 (en) 2013-01-31 2016-11-22 Lam Research Corporation Using modeling to determine wafer bias associated with a plasma system
US10128090B2 (en) 2012-02-22 2018-11-13 Lam Research Corporation RF impedance model based fault detection
US10157729B2 (en) 2012-02-22 2018-12-18 Lam Research Corporation Soft pulsing
US9408288B2 (en) 2012-09-14 2016-08-02 Lam Research Corporation Edge ramping
US20140202634A1 (en) * 2013-01-23 2014-07-24 Applied Materials, Inc. Radial transmission line based plasma source
US9620337B2 (en) 2013-01-31 2017-04-11 Lam Research Corporation Determining a malfunctioning device in a plasma system
US9779196B2 (en) 2013-01-31 2017-10-03 Lam Research Corporation Segmenting a model within a plasma system
US9107284B2 (en) * 2013-03-13 2015-08-11 Lam Research Corporation Chamber matching using voltage control mode
US9119283B2 (en) 2013-03-14 2015-08-25 Lam Research Corporation Chamber matching for power control mode
US9502221B2 (en) 2013-07-26 2016-11-22 Lam Research Corporation Etch rate modeling and use thereof with multiple parameters for in-chamber and chamber-to-chamber matching
US9594105B2 (en) 2014-01-10 2017-03-14 Lam Research Corporation Cable power loss determination for virtual metrology
US10950421B2 (en) 2014-04-21 2021-03-16 Lam Research Corporation Using modeling for identifying a location of a fault in an RF transmission system for a plasma system
US9536749B2 (en) 2014-12-15 2017-01-03 Lam Research Corporation Ion energy control by RF pulse shape
WO2020103031A1 (fr) * 2018-11-21 2020-05-28 Huawei Technologies Co., Ltd. Sonde, sonde de réseau, détecteur et procédé
US11678429B2 (en) * 2019-10-30 2023-06-13 Ryan Paul Fellows Inertial electrostatic confinement fusion device
US12057296B2 (en) * 2021-02-22 2024-08-06 COMET Technologies USA, Inc. Electromagnetic field sensing device
EP4250335A1 (fr) * 2022-03-25 2023-09-27 Impedans Ltd Appareil de détection non invasive de spectre de courant de fréquence radio circulant dans une chambre de traitement au plasma
CN116850461B (zh) * 2023-07-14 2024-06-18 济南一渚医疗科技有限公司 一种荷电粒子的调谐方法及装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5834931A (en) * 1996-10-31 1998-11-10 Sematech, Inc. RF current sensor
US6239587B1 (en) * 1997-01-03 2001-05-29 Texas Instruments Incorporated Probe for monitoring radio frequency voltage and current
US5808415A (en) * 1997-03-19 1998-09-15 Scientific Systems Research Limited Apparatus for sensing RF current delivered to a plasma with two inductive loops
US6449568B1 (en) * 1998-02-27 2002-09-10 Eni Technology, Inc. Voltage-current sensor with high matching directivity
US6501285B1 (en) * 2000-06-20 2002-12-31 Scientific Systems Research Limited RF current sensor
AU2002236599A1 (en) * 2001-01-08 2002-07-16 Tokyo Electron Limited Capacity coupled rf voltage probe
JP4030766B2 (ja) * 2002-01-30 2008-01-09 アルプス電気株式会社 プラズマ処理装置
AU2003217595A1 (en) * 2002-02-28 2003-09-16 Tokyo Electron Limited Integrated vi probe
JP3977114B2 (ja) * 2002-03-25 2007-09-19 株式会社ルネサステクノロジ プラズマ処理装置

Also Published As

Publication number Publication date
US7615985B2 (en) 2009-11-10
FR2875304A1 (fr) 2006-03-17
EP1794600A1 (fr) 2007-06-13
JP5209313B2 (ja) 2013-06-12
US20070252580A1 (en) 2007-11-01
JP2008513940A (ja) 2008-05-01
WO2006030024A1 (fr) 2006-03-23
EP1794600B1 (fr) 2015-04-08

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