FR2876182B1 - Dispositif spectrometrique de coherence - Google Patents

Dispositif spectrometrique de coherence

Info

Publication number
FR2876182B1
FR2876182B1 FR0452236A FR0452236A FR2876182B1 FR 2876182 B1 FR2876182 B1 FR 2876182B1 FR 0452236 A FR0452236 A FR 0452236A FR 0452236 A FR0452236 A FR 0452236A FR 2876182 B1 FR2876182 B1 FR 2876182B1
Authority
FR
France
Prior art keywords
coherence
spectrometric device
spectrometric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0452236A
Other languages
English (en)
Other versions
FR2876182A1 (fr
Inventor
Lionel Canioni
Stephane Santran
Bruno Bousquet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR0452236A priority Critical patent/FR2876182B1/fr
Priority to US11/664,244 priority patent/US7701583B2/en
Priority to EP05807814A priority patent/EP1794556A1/fr
Priority to PCT/FR2005/002420 priority patent/WO2006037880A1/fr
Priority to JP2007534051A priority patent/JP2008514945A/ja
Publication of FR2876182A1 publication Critical patent/FR2876182A1/fr
Application granted granted Critical
Publication of FR2876182B1 publication Critical patent/FR2876182B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4406Fluorescence spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/45Interferometric spectrometry
    • G01J3/453Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4531Devices without moving parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/45Interferometric spectrometry
    • G01J3/453Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4532Devices of compact or symmetric construction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6417Spectrofluorimetric devices

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FR0452236A 2004-10-01 2004-10-01 Dispositif spectrometrique de coherence Expired - Fee Related FR2876182B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR0452236A FR2876182B1 (fr) 2004-10-01 2004-10-01 Dispositif spectrometrique de coherence
US11/664,244 US7701583B2 (en) 2004-10-01 2005-09-30 Coherence spectrometry devices
EP05807814A EP1794556A1 (fr) 2004-10-01 2005-09-30 Dispositif spectrometrique de coherence
PCT/FR2005/002420 WO2006037880A1 (fr) 2004-10-01 2005-09-30 Dispositif spectrometrique de coherence
JP2007534051A JP2008514945A (ja) 2004-10-01 2005-09-30 コヒーレンス分光分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0452236A FR2876182B1 (fr) 2004-10-01 2004-10-01 Dispositif spectrometrique de coherence

Publications (2)

Publication Number Publication Date
FR2876182A1 FR2876182A1 (fr) 2006-04-07
FR2876182B1 true FR2876182B1 (fr) 2008-10-31

Family

ID=34949058

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0452236A Expired - Fee Related FR2876182B1 (fr) 2004-10-01 2004-10-01 Dispositif spectrometrique de coherence

Country Status (5)

Country Link
US (1) US7701583B2 (fr)
EP (1) EP1794556A1 (fr)
JP (1) JP2008514945A (fr)
FR (1) FR2876182B1 (fr)
WO (1) WO2006037880A1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8836723B2 (en) 2010-06-18 2014-09-16 Vantage Surgical Systems, Inc. Augmented reality methods and systems including optical merging of a plurality of component optical images
CN104656252B (zh) * 2015-02-13 2017-03-15 西安建筑科技大学 一种带有倾斜元件的大孔径红外成像装置
US9970819B2 (en) * 2015-03-23 2018-05-15 Si-Ware Systems High performance parallel spectrometer device
CN111220271B (zh) * 2020-01-17 2021-04-13 中国科学院长春光学精密机械与物理研究所 一种基于光栅-空间光分束阵列的分光模块
CN119666152B (zh) * 2024-12-12 2026-01-06 北京空间机电研究所 一种基于影像的激光布里渊散射谱的高精度重构系统

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB712092A (en) * 1950-04-20 1954-07-21 Nat Res Dev Spectrophotometers
US4183669A (en) * 1977-09-06 1980-01-15 Laser Precision Corporartion Dual beam Fourier spectrometer
JPS5744823A (en) * 1980-08-30 1982-03-13 Shimadzu Corp Fourier spectroscope device
EP0135761B1 (fr) * 1983-08-30 1991-06-05 The Perkin-Elmer Corporation Spectrophotomètre
EP0146768B1 (fr) * 1983-12-22 1989-02-01 Deutsches Zentrum für Luft- und Raumfahrt e.V Interféromètre
EP0171836B1 (fr) * 1984-07-18 1992-04-01 Philips Electronics Uk Limited Interféromètre
GB2163548B (en) * 1984-08-09 1987-11-25 Perkin Elmer Ltd Interferometric apparatus particularly for use in ft spectrophotometer
JPS63289426A (ja) * 1987-05-22 1988-11-25 Hitachi Ltd フ−リエ変換分光分析計
DE59100331D1 (de) * 1990-02-21 1993-10-07 Deutsche Forsch Luft Raumfahrt Interferometer nach Michelson zur Erzeugung optischer Wegunterschiede.
JP3134262B2 (ja) * 1991-05-16 2001-02-13 科学技術振興事業団 四角コモンパス干渉計フーリエ変換分光装置
JPH04268423A (ja) * 1991-02-22 1992-09-24 Jeol Ltd 小設置面積干渉計
JPH07260584A (ja) * 1994-03-16 1995-10-13 Toshiba Corp マイケルソン干渉計
DE4431412C1 (de) * 1994-08-24 1996-03-14 William Newton Vorrichtung zur Durchführung spektroskopischer Messungen
US5777736A (en) * 1996-07-19 1998-07-07 Science Applications International Corporation High etendue imaging fourier transform spectrometer
US5898459A (en) * 1997-03-26 1999-04-27 Lectrolarm Custom Systems, Inc. Multi-camera programmable pan-and-tilt apparatus
JPH10318924A (ja) * 1997-05-19 1998-12-04 Olympus Optical Co Ltd パルスレーザを備えた光学装置
DE19933290A1 (de) * 1999-04-09 2001-03-08 Campus Technologies Ag Zug Vorrichtung und Verfahren zur optischen Spektroskopie
CA2302994A1 (fr) 2000-03-24 2001-09-24 Evgeny V. Ivanov Spectrometre par transformation de fourier statique avec pouvoir ameliore de resolution
US6665075B2 (en) * 2000-11-14 2003-12-16 Wm. Marshurice University Interferometric imaging system and method
DE10159722B4 (de) * 2001-12-05 2008-02-07 Bruker Optik Gmbh Abbildendes FTIR-Spektrometer
US7502117B1 (en) * 2005-12-07 2009-03-10 Itt Manufacturing Enterprises, Inc. Interferometer with ghost suppression

Also Published As

Publication number Publication date
US7701583B2 (en) 2010-04-20
EP1794556A1 (fr) 2007-06-13
JP2008514945A (ja) 2008-05-08
US20080117435A1 (en) 2008-05-22
FR2876182A1 (fr) 2006-04-07
WO2006037880A1 (fr) 2006-04-13

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Effective date: 20130628