FR2958076B1 - Procede de formation de vias electriques - Google Patents
Procede de formation de vias electriquesInfo
- Publication number
- FR2958076B1 FR2958076B1 FR1052110A FR1052110A FR2958076B1 FR 2958076 B1 FR2958076 B1 FR 2958076B1 FR 1052110 A FR1052110 A FR 1052110A FR 1052110 A FR1052110 A FR 1052110A FR 2958076 B1 FR2958076 B1 FR 2958076B1
- Authority
- FR
- France
- Prior art keywords
- forming electric
- electric vias
- vias
- forming
- electric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/021—Manufacture or treatment of interconnections within wafers or substrates
- H10W20/023—Manufacture or treatment of interconnections within wafers or substrates the interconnections being through-semiconductor vias
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/021—Manufacture or treatment of interconnections within wafers or substrates
- H10W20/023—Manufacture or treatment of interconnections within wafers or substrates the interconnections being through-semiconductor vias
- H10W20/0245—Manufacture or treatment of interconnections within wafers or substrates the interconnections being through-semiconductor vias comprising use of blind vias during the manufacture
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1052110A FR2958076B1 (fr) | 2010-03-24 | 2010-03-24 | Procede de formation de vias electriques |
| US13/070,774 US8298942B2 (en) | 2010-03-24 | 2011-03-24 | Method for forming electric vias |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1052110A FR2958076B1 (fr) | 2010-03-24 | 2010-03-24 | Procede de formation de vias electriques |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2958076A1 FR2958076A1 (fr) | 2011-09-30 |
| FR2958076B1 true FR2958076B1 (fr) | 2012-08-17 |
Family
ID=42990232
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR1052110A Expired - Fee Related FR2958076B1 (fr) | 2010-03-24 | 2010-03-24 | Procede de formation de vias electriques |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8298942B2 (fr) |
| FR (1) | FR2958076B1 (fr) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8614145B2 (en) * | 2011-12-14 | 2013-12-24 | Sematech, Inc. | Through substrate via formation processing using sacrificial material |
| FR3037720A1 (fr) * | 2015-06-19 | 2016-12-23 | St Microelectronics Crolles 2 Sas | Composant electronique et son procede de fabrication |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5618752A (en) * | 1995-06-05 | 1997-04-08 | Harris Corporation | Method of fabrication of surface mountable integrated circuits |
| JP4365750B2 (ja) * | 2004-08-20 | 2009-11-18 | ローム株式会社 | 半導体チップの製造方法、および半導体装置の製造方法 |
| US7396732B2 (en) * | 2004-12-17 | 2008-07-08 | Interuniversitair Microelektronica Centrum Vzw (Imec) | Formation of deep trench airgaps and related applications |
| JP5563186B2 (ja) * | 2007-03-30 | 2014-07-30 | ピーエスフォー ルクスコ エスエイアールエル | 半導体装置及びその製造方法 |
| US7960290B2 (en) * | 2007-05-02 | 2011-06-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of fabricating a semiconductor device |
| US8853830B2 (en) * | 2008-05-14 | 2014-10-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | System, structure, and method of manufacturing a semiconductor substrate stack |
| US8138036B2 (en) * | 2008-08-08 | 2012-03-20 | International Business Machines Corporation | Through silicon via and method of fabricating same |
| US8035198B2 (en) * | 2008-08-08 | 2011-10-11 | International Business Machines Corporation | Through wafer via and method of making same |
| US7923369B2 (en) * | 2008-11-25 | 2011-04-12 | Freescale Semiconductor, Inc. | Through-via and method of forming |
| US8242604B2 (en) * | 2009-10-28 | 2012-08-14 | International Business Machines Corporation | Coaxial through-silicon via |
| US8492901B2 (en) * | 2009-11-06 | 2013-07-23 | International Business Machines Corporation | Metal oxide semiconductor (MOS)-compatible high-aspect ratio through-wafer vias and low-stress configuration thereof |
-
2010
- 2010-03-24 FR FR1052110A patent/FR2958076B1/fr not_active Expired - Fee Related
-
2011
- 2011-03-24 US US13/070,774 patent/US8298942B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| FR2958076A1 (fr) | 2011-09-30 |
| US8298942B2 (en) | 2012-10-30 |
| US20110237068A1 (en) | 2011-09-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |
Effective date: 20131129 |