FR2967785B1 - Systeme et procede pour tester un circuit integre a radiofrequence - Google Patents

Systeme et procede pour tester un circuit integre a radiofrequence

Info

Publication number
FR2967785B1
FR2967785B1 FR1103571A FR1103571A FR2967785B1 FR 2967785 B1 FR2967785 B1 FR 2967785B1 FR 1103571 A FR1103571 A FR 1103571A FR 1103571 A FR1103571 A FR 1103571A FR 2967785 B1 FR2967785 B1 FR 2967785B1
Authority
FR
France
Prior art keywords
circuit
testing
chip
frequency
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1103571A
Other languages
English (en)
Other versions
FR2967785A1 (fr
Inventor
Johann Peter Forstner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of FR2967785A1 publication Critical patent/FR2967785A1/fr
Application granted granted Critical
Publication of FR2967785B1 publication Critical patent/FR2967785B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)

Abstract

Dans un mode de réalisation, un procédé pour tester un circuit intégré à radiofréquence comporte le fait de produire des signaux de test à haute fréquence en utilisant le circuit de test sur puce, de mesurer les niveaux de signal en utilisant des détecteurs de puissance sur puce et de commander et de surveiller le circuit de test sur puce en utilisant des signaux basse fréquence. Le circuit RFIC est configuré pour fonctionner à haute fréquence, et un circuit de test sur puce qui comporte un circuit de production de fréquence et configuré pour fonctionner pendant des modes de test
FR1103571A 2010-11-23 2011-11-23 Systeme et procede pour tester un circuit integre a radiofrequence Active FR2967785B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/952,261 US8686736B2 (en) 2010-11-23 2010-11-23 System and method for testing a radio frequency integrated circuit

Publications (2)

Publication Number Publication Date
FR2967785A1 FR2967785A1 (fr) 2012-05-25
FR2967785B1 true FR2967785B1 (fr) 2013-04-19

Family

ID=46021520

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1103571A Active FR2967785B1 (fr) 2010-11-23 2011-11-23 Systeme et procede pour tester un circuit integre a radiofrequence

Country Status (6)

Country Link
US (4) US8686736B2 (fr)
JP (1) JP5346070B2 (fr)
KR (1) KR101331722B1 (fr)
CN (1) CN102540052B (fr)
DE (1) DE102011086818B4 (fr)
FR (1) FR2967785B1 (fr)

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Also Published As

Publication number Publication date
US8686736B2 (en) 2014-04-01
CN102540052B (zh) 2015-07-08
US20190137564A1 (en) 2019-05-09
JP5346070B2 (ja) 2013-11-20
KR101331722B1 (ko) 2013-11-26
US20120126821A1 (en) 2012-05-24
DE102011086818A1 (de) 2012-05-24
FR2967785A1 (fr) 2012-05-25
DE102011086818B4 (de) 2017-06-29
JP2012112962A (ja) 2012-06-14
KR20120055486A (ko) 2012-05-31
US9166706B2 (en) 2015-10-20
US10605856B2 (en) 2020-03-31
US20160041221A1 (en) 2016-02-11
CN102540052A (zh) 2012-07-04
US10175292B2 (en) 2019-01-08
US20140187170A1 (en) 2014-07-03

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