FR2980272B1 - Caracterisation de la gigue d'un signal d'horloge - Google Patents

Caracterisation de la gigue d'un signal d'horloge

Info

Publication number
FR2980272B1
FR2980272B1 FR1158219A FR1158219A FR2980272B1 FR 2980272 B1 FR2980272 B1 FR 2980272B1 FR 1158219 A FR1158219 A FR 1158219A FR 1158219 A FR1158219 A FR 1158219A FR 2980272 B1 FR2980272 B1 FR 2980272B1
Authority
FR
France
Prior art keywords
gigue
characterization
clock signal
clock
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1158219A
Other languages
English (en)
Other versions
FR2980272A1 (fr
Inventor
Herve Le-Gall
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Grenoble 2 SAS
Original Assignee
STMicroelectronics Grenoble 2 SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Grenoble 2 SAS filed Critical STMicroelectronics Grenoble 2 SAS
Priority to FR1158219A priority Critical patent/FR2980272B1/fr
Priority to US13/613,200 priority patent/US20130070830A1/en
Publication of FR2980272A1 publication Critical patent/FR2980272A1/fr
Application granted granted Critical
Publication of FR2980272B1 publication Critical patent/FR2980272B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Dc Digital Transmission (AREA)
  • Manipulation Of Pulses (AREA)
  • Tests Of Electronic Circuits (AREA)
FR1158219A 2011-09-15 2011-09-15 Caracterisation de la gigue d'un signal d'horloge Expired - Fee Related FR2980272B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1158219A FR2980272B1 (fr) 2011-09-15 2011-09-15 Caracterisation de la gigue d'un signal d'horloge
US13/613,200 US20130070830A1 (en) 2011-09-15 2012-09-13 Characterization of the jitter of a clock signal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1158219A FR2980272B1 (fr) 2011-09-15 2011-09-15 Caracterisation de la gigue d'un signal d'horloge

Publications (2)

Publication Number Publication Date
FR2980272A1 FR2980272A1 (fr) 2013-03-22
FR2980272B1 true FR2980272B1 (fr) 2013-10-11

Family

ID=45809072

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1158219A Expired - Fee Related FR2980272B1 (fr) 2011-09-15 2011-09-15 Caracterisation de la gigue d'un signal d'horloge

Country Status (2)

Country Link
US (1) US20130070830A1 (fr)
FR (1) FR2980272B1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9952281B2 (en) 2013-07-04 2018-04-24 Nvidia Corporation Clock jitter and power supply noise analysis
CN112217707B (zh) * 2020-11-10 2022-03-04 北京百瑞互联技术有限公司 集成电路时钟树网络质量评估方法、装置和介质
CN114690213B (zh) * 2022-05-30 2022-09-30 长沙金维信息技术有限公司 卫星导航接收机的基带时钟抖动分析方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5693079A (en) * 1979-12-27 1981-07-28 Iwatsu Electric Co Ltd Measurement of time duration
US6661266B1 (en) * 2000-11-08 2003-12-09 Texas Instruments Incorporated All digital built-in self-test circuit for phase-locked loops
US7439724B2 (en) * 2003-08-11 2008-10-21 International Business Machines Corporation On-chip jitter measurement circuit
FR2899404A1 (fr) * 2006-03-28 2007-10-05 St Microelectronics Sa Estimation de gigue d'un signal d'horloge
US7844650B2 (en) * 2006-05-26 2010-11-30 Pmc Sierra Inc. Pulse output direct digital synthesis circuit
US7912166B2 (en) * 2007-10-10 2011-03-22 Faraday Technology Corp. Built-in jitter measurement circuit
US8193963B2 (en) * 2010-09-02 2012-06-05 Taiwan Semiconductor Manufacturing Co., Ltd. Method and system for time to digital conversion with calibration and correction loops

Also Published As

Publication number Publication date
US20130070830A1 (en) 2013-03-21
FR2980272A1 (fr) 2013-03-22

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20150529