FR3046247B1 - Circuit integre pour detection d’un defaut d’isolation avec une armature conductrice - Google Patents

Circuit integre pour detection d’un defaut d’isolation avec une armature conductrice Download PDF

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Publication number
FR3046247B1
FR3046247B1 FR1563404A FR1563404A FR3046247B1 FR 3046247 B1 FR3046247 B1 FR 3046247B1 FR 1563404 A FR1563404 A FR 1563404A FR 1563404 A FR1563404 A FR 1563404A FR 3046247 B1 FR3046247 B1 FR 3046247B1
Authority
FR
France
Prior art keywords
detecting
integrated circuit
conductive frame
insulation fault
fault
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1563404A
Other languages
English (en)
Other versions
FR3046247A1 (fr
Inventor
Bertrand Chambion
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR1563404A priority Critical patent/FR3046247B1/fr
Priority to EP16826103.0A priority patent/EP3398407A1/fr
Priority to PCT/FR2016/053468 priority patent/WO2017115027A1/fr
Priority to US16/066,142 priority patent/US10845405B2/en
Publication of FR3046247A1 publication Critical patent/FR3046247A1/fr
Application granted granted Critical
Publication of FR3046247B1 publication Critical patent/FR3046247B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/50—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits
    • H05B45/52—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits in a parallel array of LEDs
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/50—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits
    • H05B45/54—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits in a series array of LEDs
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Led Devices (AREA)
FR1563404A 2015-12-28 2015-12-28 Circuit integre pour detection d’un defaut d’isolation avec une armature conductrice Expired - Fee Related FR3046247B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR1563404A FR3046247B1 (fr) 2015-12-28 2015-12-28 Circuit integre pour detection d’un defaut d’isolation avec une armature conductrice
EP16826103.0A EP3398407A1 (fr) 2015-12-28 2016-12-15 Circuit integre pour detection d'un defaut d'isolation avec une armature conductrice
PCT/FR2016/053468 WO2017115027A1 (fr) 2015-12-28 2016-12-15 Circuit integre pour detection d'un defaut d'isolation avec une armature conductrice
US16/066,142 US10845405B2 (en) 2015-12-28 2016-12-15 Integrated circuit intended for insulation defect detection and having a conductive armature

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1563404A FR3046247B1 (fr) 2015-12-28 2015-12-28 Circuit integre pour detection d’un defaut d’isolation avec une armature conductrice
FR1563404 2015-12-28

Publications (2)

Publication Number Publication Date
FR3046247A1 FR3046247A1 (fr) 2017-06-30
FR3046247B1 true FR3046247B1 (fr) 2018-06-15

Family

ID=55759751

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1563404A Expired - Fee Related FR3046247B1 (fr) 2015-12-28 2015-12-28 Circuit integre pour detection d’un defaut d’isolation avec une armature conductrice

Country Status (4)

Country Link
US (1) US10845405B2 (fr)
EP (1) EP3398407A1 (fr)
FR (1) FR3046247B1 (fr)
WO (1) WO2017115027A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3715884B1 (fr) * 2019-03-29 2025-05-28 Marelli Automotive Lighting Italy S.p.A. Unité d'éclairage d'automobile comprenant des sources de lumière à diode électroluminescente organique et son procédé de fonctionnement
DE102021200002A1 (de) * 2021-01-04 2022-07-07 Robert Bosch Gesellschaft mit beschränkter Haftung Vorrichtung und Verfahren zum Überwachen eines Halbleiterbauelements

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2782842B1 (fr) * 1998-08-25 2003-09-05 Commissariat Energie Atomique Dispositif comportant des composants electroniques dans des regions mutuellement insolees d'une couche de materiau semi-conducteur et procede de fabrication d'un tel dispositif
US8099254B2 (en) * 2008-01-11 2012-01-17 Minnesota Wire and Cable Elastomeric conductor and shield fault detection
FR2964793B1 (fr) * 2010-09-09 2014-04-11 Ipdia Dispositif d'interposition
FR2991502B1 (fr) 2012-05-29 2014-07-11 Commissariat Energie Atomique Procede de fabrication d'un circuit integre ayant des tranchees d'isolation avec des profondeurs distinctes
FR2992465B1 (fr) 2012-06-22 2015-03-20 Soitec Silicon On Insulator Procede de fabrication collective de leds et structure pour la fabrication collective de leds
KR101535825B1 (ko) * 2012-09-25 2015-07-10 엘지디스플레이 주식회사 표시장치 및 이의 라인결함 검출방법
FR3000838B1 (fr) * 2013-01-07 2015-01-02 St Microelectronics Rousset Procede de fabrication d’une memoire non volatile
US8941129B1 (en) 2013-07-19 2015-01-27 Bridgelux, Inc. Using an LED die to measure temperature inside silicone that encapsulates an LED array
FR3009474B1 (fr) * 2013-08-02 2015-07-31 Renault Sa Dispositif a diodes electroluminescentes

Also Published As

Publication number Publication date
US20190369157A1 (en) 2019-12-05
US10845405B2 (en) 2020-11-24
EP3398407A1 (fr) 2018-11-07
WO2017115027A1 (fr) 2017-07-06
FR3046247A1 (fr) 2017-06-30

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