FR3108176B1 - Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique. - Google Patents

Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique. Download PDF

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Publication number
FR3108176B1
FR3108176B1 FR2002362A FR2002362A FR3108176B1 FR 3108176 B1 FR3108176 B1 FR 3108176B1 FR 2002362 A FR2002362 A FR 2002362A FR 2002362 A FR2002362 A FR 2002362A FR 3108176 B1 FR3108176 B1 FR 3108176B1
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FR
France
Prior art keywords
face
surface defects
optical fiber
detecting surface
reference images
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Active
Application number
FR2002362A
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English (en)
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FR3108176A1 (fr
Inventor
Yannick Laperriere
Julien Maille
Eric Tanguy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Data Pixel SAS
Original Assignee
Data Pixel SAS
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Publication date
Application filed by Data Pixel SAS filed Critical Data Pixel SAS
Priority to FR2002362A priority Critical patent/FR3108176B1/fr
Priority to US17/191,906 priority patent/US11808991B2/en
Priority to CN202110256078.XA priority patent/CN113379670A/zh
Publication of FR3108176A1 publication Critical patent/FR3108176A1/fr
Application granted granted Critical
Publication of FR3108176B1 publication Critical patent/FR3108176B1/fr
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Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/36—Mechanical coupling means
    • G02B6/38—Mechanical coupling means having fibre to fibre mating means
    • G02B6/3807—Dismountable connectors, i.e. comprising plugs
    • G02B6/3833—Details of mounting fibres in ferrules; Assembly methods; Manufacture
    • G02B6/385—Accessories for testing or observation of connectors
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Evolutionary Computation (AREA)
  • Computational Linguistics (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Molecular Biology (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Physics (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

L’invention concerne un dispositif de détection (10) de défauts de surface (62-65) sur une face terminale (16) d’une fibre optique (14), ledit dispositif comportant :- un microscope numérique (15) configuré pour capter une image (img1) d’une face terminale (16) ; et- des moyens d’analyse (25) de ladite image (img1), configurés pour détecter des défauts de surface présents sur la face terminale (16), les moyens d’analyse intégrant un réseau de neurones (26) de type « U-Net » dont la phase d’apprentissage a été réalisée par l’intermédiaire d’un augmenteur ; ledit augmenteur étant configuré pour créer des images d’apprentissage, destinée à entrainer ledit réseau de neurones (26), à partir d’images de référence ; lesdites images d’apprentissage étant obtenues à partir desdites images de référence en appliquant uniquement des retournements, des rotations et/ou des variations de luminosité, de contraste ou de teinte sur lesdites images de référence. Figure pour abrégé : Fig 1
FR2002362A 2020-03-10 2020-03-10 Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique. Active FR3108176B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR2002362A FR3108176B1 (fr) 2020-03-10 2020-03-10 Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique.
US17/191,906 US11808991B2 (en) 2020-03-10 2021-03-04 Device of detection of surface defects on at least one terminal surface of at least one optical fiber
CN202110256078.XA CN113379670A (zh) 2020-03-10 2021-03-09 检测至少一个光纤的至少一个端面上的表面缺陷的装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2002362A FR3108176B1 (fr) 2020-03-10 2020-03-10 Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique.
FR2002362 2020-03-10

Publications (2)

Publication Number Publication Date
FR3108176A1 FR3108176A1 (fr) 2021-09-17
FR3108176B1 true FR3108176B1 (fr) 2022-09-02

Family

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Application Number Title Priority Date Filing Date
FR2002362A Active FR3108176B1 (fr) 2020-03-10 2020-03-10 Dispositif de détection de défauts de surface sur au moins une face terminale d’au moins une fibre optique.

Country Status (3)

Country Link
US (1) US11808991B2 (fr)
CN (1) CN113379670A (fr)
FR (1) FR3108176B1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114782391B (zh) * 2022-04-29 2025-07-15 广州大学 少样本工业图像缺陷检测模型构建方法、系统及装置
CN116912205B (zh) * 2023-07-13 2024-03-08 上海频准激光科技有限公司 一种基于神经网络模型的光纤熔接质量预测方法
US20250078238A1 (en) * 2023-08-31 2025-03-06 Exfo Inc. Enhanced optical fiber inspection using image segmentation
CN120064161B (zh) * 2025-03-07 2025-12-02 广州计量检测技术研究院 光纤端面检测仪校准装置及制作方法
CN121190862A (zh) * 2025-09-25 2025-12-23 上海感图网络科技有限公司 光纤阵列单元缺陷检测与显示方法、设备及存储介质

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5179419A (en) 1991-11-22 1993-01-12 At&T Bell Laboratories Methods of detecting, classifying and quantifying defects in optical fiber end faces
US6751017B2 (en) 2002-03-19 2004-06-15 Westover Scientific, Inc. Microscope for backplane ribbon fiber analysis
US7312859B2 (en) 2004-01-30 2007-12-25 Promet International, Inc. Optical fiber inspection device
US7336884B2 (en) 2006-07-20 2008-02-26 Lightel Technologies Inc. Adaptive device for shifting imaging axis across fiber-optic endfaces in multi-fiber connector for inspection
WO2014205214A1 (fr) * 2013-06-19 2014-12-24 Afl Telecommunications Llc Sélection de mode automatique dans des images d'extrémité de fibre optique
US10540768B2 (en) * 2015-09-30 2020-01-21 Samsung Electronics Co., Ltd. Apparatus and method to segment object from image
US10096109B1 (en) * 2017-03-31 2018-10-09 The Board Of Trustees Of The Leland Stanford Junior University Quality of medical images using multi-contrast and deep learning
US11069030B2 (en) * 2018-03-22 2021-07-20 Adobe, Inc. Aesthetics-guided image enhancement
EP3788348B1 (fr) 2018-05-02 2023-08-02 Corning Research & Development Corporation Procédés de détection de contaminants sur des connecteurs de fibres optiques
CN108665457B (zh) * 2018-05-16 2023-12-19 腾讯医疗健康(深圳)有限公司 图像识别方法、装置、存储介质及计算机设备
DE102018114005A1 (de) * 2018-06-12 2019-12-12 Carl Zeiss Jena Gmbh Materialprüfung von optischen Prüflingen
JP2020020997A (ja) * 2018-08-02 2020-02-06 古河電気工業株式会社 融着接続システム、融着接続機及び光ファイバ種判別方法
CN109613002B (zh) * 2018-11-21 2020-06-26 腾讯科技（深圳）有限公司 一种玻璃缺陷检测方法、装置和存储介质
US11821808B2 (en) * 2019-08-30 2023-11-21 Exfo Inc. Signature recognition on optical-fiber connector endfaces
WO2021067635A1 (fr) * 2019-10-01 2021-04-08 The Regents Of The University Of California Procédé d'identification de variations chimiques et structurales par spectroscopie térahertz dans le domaine temporel
US11436725B2 (en) * 2019-11-15 2022-09-06 Arizona Board Of Regents On Behalf Of Arizona State University Systems, methods, and apparatuses for implementing a self-supervised chest x-ray image analysis machine-learning model utilizing transferable visual words

Also Published As

Publication number Publication date
FR3108176A1 (fr) 2021-09-17
CN113379670A (zh) 2021-09-10
US11808991B2 (en) 2023-11-07
US20210286133A1 (en) 2021-09-16

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