FR3141278B1 - Pointe d’alignement pour dispositif de caractérisation - Google Patents
Pointe d’alignement pour dispositif de caractérisationInfo
- Publication number
- FR3141278B1 FR3141278B1 FR2210926A FR2210926A FR3141278B1 FR 3141278 B1 FR3141278 B1 FR 3141278B1 FR 2210926 A FR2210926 A FR 2210926A FR 2210926 A FR2210926 A FR 2210926A FR 3141278 B1 FR3141278 B1 FR 3141278B1
- Authority
- FR
- France
- Prior art keywords
- characterization device
- alignment
- alignment tip
- tip
- head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G12—INSTRUMENT DETAILS
- G12B—CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILS OF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR
- G12B5/00—Adjusting position or attitude, e.g. level, of instruments or other apparatus, or of parts thereof; Compensating for the effects of tilting or acceleration, e.g. for optical apparatus
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/08—Probe characteristics
- G01Q70/10—Shape or taper
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/08—Probe characteristics
- G01Q70/14—Particular materials
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
L’invention concerne une pointe d’alignement (1) pour un dispositif de caractérisation d’échantillons, la pointe d’alignement comprenant : - une tête d’alignement (2) ayant une forme essentiellement sphérique, et - un corps (3) relié à la tête d’alignement (3), configuré pour être mis en place dans un support d’échantillon. Figure pour abrégé : [ Fig. 1 ]
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR2210926A FR3141278B1 (fr) | 2022-10-21 | 2022-10-21 | Pointe d’alignement pour dispositif de caractérisation |
| US19/113,170 US20260100239A1 (en) | 2022-10-21 | 2023-10-19 | Alignment tip for a characterization device |
| JP2025522799A JP2025535819A (ja) | 2022-10-21 | 2023-10-19 | 特性評価デバイスのための位置合わせチップ |
| EP23794280.0A EP4605936A1 (fr) | 2022-10-21 | 2023-10-19 | Pointe d'alignement pour dispositif de caractérisation |
| PCT/EP2023/079131 WO2024083974A1 (fr) | 2022-10-21 | 2023-10-19 | Pointe d'alignement pour dispositif de caractérisation |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR2210926A FR3141278B1 (fr) | 2022-10-21 | 2022-10-21 | Pointe d’alignement pour dispositif de caractérisation |
| FR2210926 | 2022-10-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR3141278A1 FR3141278A1 (fr) | 2024-04-26 |
| FR3141278B1 true FR3141278B1 (fr) | 2025-10-10 |
Family
ID=86469133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR2210926A Active FR3141278B1 (fr) | 2022-10-21 | 2022-10-21 | Pointe d’alignement pour dispositif de caractérisation |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20260100239A1 (fr) |
| EP (1) | EP4605936A1 (fr) |
| JP (1) | JP2025535819A (fr) |
| FR (1) | FR3141278B1 (fr) |
| WO (1) | WO2024083974A1 (fr) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10260058A1 (de) * | 2002-12-19 | 2004-07-15 | Universität des Saarlandes | Vorrichtung zur Positionierung einer zu untersuchenden Probe |
| US8577495B2 (en) * | 2010-11-22 | 2013-11-05 | GM Global Technology Operations LLC | Automatic calibration and compensation for a CNC machine table and an associated probe |
| DE102016202582A1 (de) * | 2016-02-19 | 2017-08-24 | Carl Zeiss Microscopy Gmbh | Verstelleinrichtung einer Probenhalterung, Mikroskop mit Verstelleinrichtung und Verfahren |
| CN111257359B (zh) * | 2018-11-30 | 2021-03-02 | 浙江大学 | 样品对准转轴轴线的调整方法 |
-
2022
- 2022-10-21 FR FR2210926A patent/FR3141278B1/fr active Active
-
2023
- 2023-10-19 EP EP23794280.0A patent/EP4605936A1/fr active Pending
- 2023-10-19 JP JP2025522799A patent/JP2025535819A/ja active Pending
- 2023-10-19 WO PCT/EP2023/079131 patent/WO2024083974A1/fr not_active Ceased
- 2023-10-19 US US19/113,170 patent/US20260100239A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024083974A1 (fr) | 2024-04-25 |
| EP4605936A1 (fr) | 2025-08-27 |
| US20260100239A1 (en) | 2026-04-09 |
| JP2025535819A (ja) | 2025-10-28 |
| FR3141278A1 (fr) | 2024-04-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PLFP | Fee payment |
Year of fee payment: 2 |
|
| PLSC | Publication of the preliminary search report |
Effective date: 20240426 |
|
| PLFP | Fee payment |
Year of fee payment: 3 |
|
| PLFP | Fee payment |
Year of fee payment: 4 |