FR3152191B1 - Pixel de détection de fréquence - Google Patents

Pixel de détection de fréquence

Info

Publication number
FR3152191B1
FR3152191B1 FR2308798A FR2308798A FR3152191B1 FR 3152191 B1 FR3152191 B1 FR 3152191B1 FR 2308798 A FR2308798 A FR 2308798A FR 2308798 A FR2308798 A FR 2308798A FR 3152191 B1 FR3152191 B1 FR 3152191B1
Authority
FR
France
Prior art keywords
node
frequency detection
detection pixel
photodiode
coupling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR2308798A
Other languages
English (en)
Other versions
FR3152191A1 (fr
Inventor
Gaelle Palmigiani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR2308798A priority Critical patent/FR3152191B1/fr
Priority to US18/807,227 priority patent/US20250063265A1/en
Priority to CN202411128821.3A priority patent/CN119492450A/zh
Publication of FR3152191A1 publication Critical patent/FR3152191A1/fr
Application granted granted Critical
Publication of FR3152191B1 publication Critical patent/FR3152191B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/46Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/803Pixels having integrated switching, control, storage or amplification elements
    • H10F39/8033Photosensitive area
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/813Electronic components shared by multiple pixels, e.g. one amplifier shared by two pixels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/199Back-illuminated image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/802Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
    • H10F39/8027Geometry of the photosensitive area

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

Pixel de détection de fréquence La présente description concerne un pixel (PIX2) comprenant un premier noeud (202), un deuxième noeud (200) configuré pour recevoir un premier potentiel continu (Vdd2) et une pluralité de voies d'acquisition (CH1, CH2) comprenant chacune : une photodiode (PD1, PD2) adaptée à détecter un rayonnement (SIGL) dans une première gamme de longueurs d'onde ; un élément capacitif (Cc1, Cc2) couplant la photodiode au premier noeud (202) ; et un élément résistif (R1, R2) couplant une première borne (K1, K2) de la photodiode (PD1, PD2) au deuxième noeud (200). Figure pour l'abrégé : Fig. 2
FR2308798A 2023-08-18 2023-08-18 Pixel de détection de fréquence Active FR3152191B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR2308798A FR3152191B1 (fr) 2023-08-18 2023-08-18 Pixel de détection de fréquence
US18/807,227 US20250063265A1 (en) 2023-08-18 2024-08-16 Frequency detection pixel
CN202411128821.3A CN119492450A (zh) 2023-08-18 2024-08-16 频率检测像素

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2308798A FR3152191B1 (fr) 2023-08-18 2023-08-18 Pixel de détection de fréquence
FR2308798 2023-08-18

Publications (2)

Publication Number Publication Date
FR3152191A1 FR3152191A1 (fr) 2025-02-21
FR3152191B1 true FR3152191B1 (fr) 2026-01-30

Family

ID=89474793

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2308798A Active FR3152191B1 (fr) 2023-08-18 2023-08-18 Pixel de détection de fréquence

Country Status (3)

Country Link
US (1) US20250063265A1 (fr)
CN (1) CN119492450A (fr)
FR (1) FR3152191B1 (fr)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011159757A (ja) * 2010-01-29 2011-08-18 Sony Corp 固体撮像装置とその製造方法、固体撮像装置の駆動方法、及び電子機器
EP3124992B1 (fr) * 2015-07-27 2017-07-12 Sick Ag Récepteur de lumière ayant des photodiodes à avalanche en mode geiger et procédé de lecture

Also Published As

Publication number Publication date
FR3152191A1 (fr) 2025-02-21
US20250063265A1 (en) 2025-02-20
CN119492450A (zh) 2025-02-21

Similar Documents

Publication Publication Date Title
US20180180470A1 (en) Light receiver having a plurality of avalanche photodiode elements and method for detecting light
JP6212605B2 (ja) ガイガーモードのアバランシェフォトダイオードを有する受光器及び読み出し方法
JP2009055479A (ja) イメージセンサ及び電磁波イメージング装置
WO2003071230A2 (fr) Circuit de mesure à condensateurs de détection pontés
EP3465236B1 (fr) Dispositif de detection capacitive a garde nulle
US20110133059A1 (en) Photo detector having coupling capacitor
EP3796035B1 (fr) Array de photodétecteurs spad avec rétractation active et contrôle de sortie
US7595476B2 (en) Electrical circuit, apparatus and method for the demodulation of an intensity-modulated signal
FR3152191B1 (fr) Pixel de détection de fréquence
EP3410600B1 (fr) Agencement d'amplificateur et agencement de capteurs comportant un tel agencement d'amplificateur
JPH04168876A (ja) 積分器及び画像読取装置
Li et al. SPAD-based LiDAR with real-time accuracy calibration and laser power regulation
JPS59185432A (ja) 光受信回路
EP1136798B1 (fr) Photodetecteur
EP0565116A3 (fr) Circuit de polarisation pour une photodiode
JPH01289381A (ja) 増幅型固体撮像装置
US3552863A (en) Method and apparatus for comparing the transmittance of a sample and a standard
KR20110065285A (ko) 커플링 커패시터를 포함하는 광검출기
JP4633991B2 (ja) 信号読出回路
JP2001510659A (ja) 線形性を向上させた光に起因する電荷の積分回路
EP1081858A2 (fr) Convertisseur courant-tension
US5453783A (en) General absolute value circuit
JP2003518798A (ja) ダイオードマルチプレクサ回路及びこれを組み込んだ電子装置
JPH1188770A (ja) イメージセンサ装置
US10935423B2 (en) Light-to-digital converter

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 2

PLSC Publication of the preliminary search report

Effective date: 20250221

RM Correction of a material error

Effective date: 20250325

PLFP Fee payment

Year of fee payment: 3