FR939544A - Perfectionnement aux microscopes électroniques - Google Patents

Perfectionnement aux microscopes électroniques

Info

Publication number: FR939544A
Authority: FR; France
Prior art keywords: electron microscopes; advanced training; training; advanced; microscopes
Prior art date: 1946-01-05
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

Other languages

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Koninklijke Philips NV

Original Assignee

Philips Gloeilampenfabrieken NV

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1946-01-05

Filing date

1947-01-06

Publication date

1948-11-17

1947-01-06 Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV

1948-11-17 Application granted granted Critical

1948-11-17 Publication of FR939544A publication Critical patent/FR939544A/fr

Status Expired legal-status Critical Current

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement

Landscapes

Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Optical Head (AREA)
Lenses (AREA)
Electron Sources, Ion Sources (AREA)

FR939544D 1946-01-05 1947-01-06 Perfectionnement aux microscopes électroniques Expired FR939544A (fr)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
NL646019X		1946-01-05

Publications (1)

Publication Number	Publication Date
FR939544A true FR939544A (fr)	1948-11-17

Family

ID=19791928

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FR939544D Expired FR939544A (fr)	1946-01-05	1947-01-06	Perfectionnement aux microscopes électroniques

Country Status (4)

Country	Link
US (1)	US2494442A (fr)
DE (1)	DE887685C (fr)
FR (1)	FR939544A (fr)
GB (1)	GB646019A (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US2626358A (en) *	1949-08-12	1953-01-20	Canal Ind Company	Electron microscope focusing device
US2714678A (en) *	1950-09-03	1955-08-02	Siemens Ag	Electron microscopes
NL98715C (fr) *	1953-09-04
NL93272C (fr) *	1957-01-15
NL271119A (fr) *	1961-07-10
NL280940A (fr) *	1961-07-15
NL288034A (fr) *	1962-01-23
GB962086A (en) *	1962-03-27	1964-06-24	Hitachi Ltd	Energy-selecting electron microscopes
GB961112A (en) *	1962-03-27	1964-06-17	Hitachi Ltd	Energy-selecting electron microscopes
DE1614125B1 (de) *	1967-02-24	1972-12-07	Max Planck Gesellschaft	Korpuskularstrahlgeraet zur wahlweisen abbildung eines praeparats oder seiner beugungsdiagramms, insbesondere elektromikroskop
GB1304944A (fr) *	1970-06-29	1973-01-31
JPS5136196B2 (fr) *	1972-05-22	1976-10-07
DE2742264C3 (de) *	1977-09-20	1981-04-30	Fa. Carl Zeiss, 7920 Heidenheim	Verfahren zur Abbildung eines Objektes mit geringer Vergrößerung mittels eines Korpuskularstrahlgeräts, insbesondere eines Elektronen-Mikroskops und Korpuskularstrahlgerät zur Durchführung des Verfahrens
US4210806A (en) *	1979-01-18	1980-07-01	International Business Machines Corporation	High brightness electron probe beam and method
US4376249A (en) *	1980-11-06	1983-03-08	International Business Machines Corporation	Variable axis electron beam projection system
US6201251B1 (en) *	1998-08-28	2001-03-13	Nikon Corporation	Compensation of space charge in a particle beam system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CH165549A (de) *	1931-05-30	1933-11-30	Siemens Ag	Einrichtung zum Abbilden von Gegenständen.
DE680284C (de) *	1932-03-17	1939-08-25	Bodo Von Borries Dr Ing	Magnetische Sammellinse kurzer Feldlaenge
DE713740C (de) *	1936-01-31	1941-11-14	Aeg	Verfahren zur elektronenoptischen Untersuchung von Kristallgemischen unter Ausnutzung der in dem Kristallgemisch erfolgenden Elektronenbeugung
US2233264A (en) *	1938-12-27	1941-02-25	Rca Corp	Electron lens
US2396624A (en) *	1940-03-11	1946-03-12	Borries Bodo Von	Electronic microscope

1947
- 1947-01-02 GB GB143/47A patent/GB646019A/en not_active Expired
- 1947-01-06 FR FR939544D patent/FR939544A/fr not_active Expired
- 1947-01-31 US US725669A patent/US2494442A/en not_active Expired - Lifetime
1948
- 1948-11-05 DE DEP20767A patent/DE887685C/de not_active Expired

Also Published As

Publication number	Publication date
US2494442A (en)	1950-01-10
DE887685C (de)	1953-08-27
GB646019A (en)	1950-11-15

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