GB9727281D0 - Method apparatus for testing optical/electronic integrated circuits - Google Patents

Method apparatus for testing optical/electronic integrated circuits

Info

Publication number
GB9727281D0
GB9727281D0 GBGB9727281.9A GB9727281A GB9727281D0 GB 9727281 D0 GB9727281 D0 GB 9727281D0 GB 9727281 A GB9727281 A GB 9727281A GB 9727281 D0 GB9727281 D0 GB 9727281D0
Authority
GB
United Kingdom
Prior art keywords
integrated circuits
electronic integrated
method apparatus
testing optical
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB9727281.9A
Other versions
GB2332775A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LSI Corp
Original Assignee
LSI Logic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LSI Logic Corp filed Critical LSI Logic Corp
Priority to GB9727281A priority Critical patent/GB2332775A/en
Publication of GB9727281D0 publication Critical patent/GB9727281D0/en
Publication of GB2332775A publication Critical patent/GB2332775A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
GB9727281A 1997-12-23 1997-12-23 Testing optical/electronic integrated circuits Withdrawn GB2332775A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9727281A GB2332775A (en) 1997-12-23 1997-12-23 Testing optical/electronic integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9727281A GB2332775A (en) 1997-12-23 1997-12-23 Testing optical/electronic integrated circuits

Publications (2)

Publication Number Publication Date
GB9727281D0 true GB9727281D0 (en) 1998-02-25
GB2332775A GB2332775A (en) 1999-06-30

Family

ID=10824192

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9727281A Withdrawn GB2332775A (en) 1997-12-23 1997-12-23 Testing optical/electronic integrated circuits

Country Status (1)

Country Link
GB (1) GB2332775A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6756244B2 (en) 2002-01-29 2004-06-29 Hewlett-Packard Development Company, L.P. Interconnect structure
US7391005B2 (en) 2002-10-25 2008-06-24 Gennum Corporation Direct attach optical receiver module and method of testing
JP4847440B2 (en) * 2004-03-08 2011-12-28 シオプティカル インコーポレーテッド Opto-electronic test apparatus and method at wafer level
CN100570386C (en) * 2004-03-08 2009-12-16 斯欧普迪克尔股份有限公司 Wafer-level optoelectronic testing apparatus and method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06232234A (en) * 1993-01-29 1994-08-19 Mitsubishi Electric Corp Light sensing element
US5631571A (en) * 1996-04-03 1997-05-20 The United States Of America As Represented By The Secretary Of The Air Force Infrared receiver wafer level probe testing

Also Published As

Publication number Publication date
GB2332775A (en) 1999-06-30

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)