GR1000643B - Συστημα ελεγχου βραχυκυκλωματων πλαισιου αγωγων. - Google Patents

Συστημα ελεγχου βραχυκυκλωματων πλαισιου αγωγων.

Info

Publication number
GR1000643B
GR1000643B GR890100112A GR890100112A GR1000643B GR 1000643 B GR1000643 B GR 1000643B GR 890100112 A GR890100112 A GR 890100112A GR 890100112 A GR890100112 A GR 890100112A GR 1000643 B GR1000643 B GR 1000643B
Authority
GR
Greece
Prior art keywords
test
lead frame
board
frame short
display
Prior art date
Application number
GR890100112A
Other languages
English (en)
Other versions
GR890100112A (en
Inventor
R Ernest
Ernest R Haberland
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of GR890100112A publication Critical patent/GR890100112A/el
Publication of GR1000643B publication Critical patent/GR1000643B/el

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

Στο παρόν, περιγράφεται μέθοδος και συσκευή που έχουν σκοπό την εκτέλεση μη καταστρεπτικής ηλεκτρονικής δοκιμασίας πακέτων υβριδικών κυκλωμάτων πριν τοποθετηθούν στο πακέτο τα εξαρτήματα και συνδεθούν με τους εκτεινόμενους προς τα έξω αγωγούς. Η διαδικασία δοκιμής που περιγράφεται στο παρόν, περιλαμβάνει την διεύλευση ζεύγους προσκείμενων αγωγών πάνω από ενεργοποιημένο βρόχο ή σπείρα δοκιμής, χαραγμένο σε μία πλακέτα. Η πλακέτα προσαρμόζεται σε μία πλάκα και η όλη συστοιχία συνδέεται με τους ακροδέκτες ενός μετρητού Q. Καθώς το κυκλωματικό πακέτο διέρχεται πάνω από τον ανοικτό βρόχο δοκιμής, εμφανίζουν χαμηλό Q. Αντιθέτως, τα ζεύγη εκείνα που δεν είναι βραχυκυκλωμένα στο σώμα του πακέτου, εμφανίζουν υψηλό Q. ω
GR890100112A 1988-04-04 1989-02-23 Συστημα ελεγχου βραχυκυκλωματων πλαισιου αγωγων. GR1000643B (el)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/177,249 US4833396A (en) 1988-04-04 1988-04-04 Lead frame short tester

Publications (2)

Publication Number Publication Date
GR890100112A GR890100112A (en) 1990-01-31
GR1000643B true GR1000643B (el) 1992-09-11

Family

ID=22647832

Family Applications (1)

Application Number Title Priority Date Filing Date
GR890100112A GR1000643B (el) 1988-04-04 1989-02-23 Συστημα ελεγχου βραχυκυκλωματων πλαισιου αγωγων.

Country Status (4)

Country Link
US (1) US4833396A (el)
ES (1) ES2011542A6 (el)
GR (1) GR1000643B (el)
IL (1) IL89211A0 (el)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2623291B1 (fr) * 1987-11-17 1990-03-16 France Etat Dispositif de caracterisation electrique d'echantillons et application a la cartographie electrique d'echantillons semi-conducteurs de grande surface
US4973948A (en) * 1990-01-26 1990-11-27 Micron Technology, Inc. Reversed or missing lead frame detector
US5424633A (en) * 1991-01-22 1995-06-13 Advanced Test Technologies Inc. Contactless test method and system for testing printed circuit boards
US5485080A (en) * 1993-09-08 1996-01-16 The United States Of America As Represented By The Secretary Of Commerce Non-contact measurement of linewidths of conductors in semiconductor device structures
WO1995007469A1 (en) * 1993-09-08 1995-03-16 THE UNITED STATES OF AMERICA, represented by THE SECRETARY, DEPARTMENT OF COMMERCE Non-contact linewidth measurement of semiconductor conductors
US5420518A (en) * 1993-09-23 1995-05-30 Schafer, Jr.; Kenneth L. Sensor and method for the in situ monitoring and control of microstructure during rapid metal forming processes
US6891388B2 (en) * 2002-08-28 2005-05-10 Delphi Technologies, Inc. Lead protrusion tester
US8305179B2 (en) * 2008-09-26 2012-11-06 Mitsubishi Electric Corporation Oil immersed electrical apparatus
US12282053B1 (en) 2022-10-10 2025-04-22 Cobham Advanced Electronic Solutions Inc. Hybrid circuit board
US12282041B1 (en) * 2022-10-10 2025-04-22 Cobham Advanced Electronic Solutions Inc. Non-contact circuit testing systems and methods

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB692659A (en) * 1951-03-14 1953-06-10 Electrical & Auto Products 193 Improvements relating to electrical testing apparatus
US3155897A (en) * 1960-10-17 1964-11-03 Wheland Company Fault detection system having a portable radio signal generator and stationary radio receiver for detecting open circuits in an electrical conductor
US3303400A (en) * 1961-07-25 1967-02-07 Fairchild Camera Instr Co Semiconductor device complex
US3348147A (en) * 1965-04-01 1967-10-17 Test Equipment Corp High frequency semi-conductor device test fixture having inductive loop signal injection means
US3719883A (en) * 1970-09-28 1973-03-06 North American Rockwell Magnetic core circuit for testing electrical short circuits between leads of a multi-lead circuit package
US4023102A (en) * 1975-05-01 1977-05-10 Sun Oil Company Of Pennsylvania Test fixture
GB1537870A (en) * 1975-09-05 1979-01-04 Ericsson L M Pty Ltd Printed circuit board testing method and apparatus
US4377782A (en) * 1979-06-23 1983-03-22 Membrain Limited Fault location methods and apparatus using current pulse injection
JPS61120067A (ja) * 1984-11-16 1986-06-07 Toshiba Corp ガス絶縁機器の地絡故障位置検出器
JPS61138181A (ja) * 1984-12-11 1986-06-25 Toshiba Corp 半導体搬送装置

Also Published As

Publication number Publication date
US4833396A (en) 1989-05-23
ES2011542A6 (es) 1990-01-16
IL89211A0 (en) 1989-09-10
GR890100112A (en) 1990-01-31

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