ID19530A - Sel memori feroelektrik bebas platinum dengan lapisan penghalang interlogam dan metoda pembuatannya - Google Patents
Sel memori feroelektrik bebas platinum dengan lapisan penghalang interlogam dan metoda pembuatannyaInfo
- Publication number
- ID19530A ID19530A IDP970005A ID970005A ID19530A ID 19530 A ID19530 A ID 19530A ID P970005 A IDP970005 A ID P970005A ID 970005 A ID970005 A ID 970005A ID 19530 A ID19530 A ID 19530A
- Authority
- ID
- Indonesia
- Prior art keywords
- interlogam
- feroelectric
- platinum
- free
- memory cells
- Prior art date
Links
- 230000004888 barrier function Effects 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/30—Devices controlled by electric currents or voltages
- H10D48/32—Devices controlled by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H10D48/36—Unipolar devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
- H10D1/692—Electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
- H10D1/692—Electrodes
- H10D1/696—Electrodes comprising multiple layers, e.g. comprising a barrier layer and a metal layer
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
- H10D1/682—Capacitors having no potential barriers having dielectrics comprising perovskite structures
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/582,545 US5777356A (en) | 1996-01-03 | 1996-01-03 | Platinum-free ferroelectric memory cell with intermetallic barrier layer and method of making same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ID19530A true ID19530A (id) | 1998-07-16 |
Family
ID=24329555
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IDP970005A ID19530A (id) | 1996-01-03 | 1997-01-02 | Sel memori feroelektrik bebas platinum dengan lapisan penghalang interlogam dan metoda pembuatannya |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US5777356A (id) |
| EP (1) | EP0956595A1 (id) |
| JP (1) | JP3285036B2 (id) |
| KR (1) | KR100329040B1 (id) |
| CA (1) | CA2241676C (id) |
| ID (1) | ID19530A (id) |
| IL (1) | IL119889A (id) |
| MY (1) | MY121282A (id) |
| TW (1) | TW336318B (id) |
| WO (1) | WO1997025745A1 (id) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3585674B2 (ja) * | 1996-11-21 | 2004-11-04 | ローム株式会社 | 半導体記憶装置 |
| CN1259227A (zh) * | 1997-06-09 | 2000-07-05 | 特尔科迪亚技术股份有限公司 | 晶体钙钛矿铁电单元的退火和呈现阻挡层特性改善的单元 |
| US6115281A (en) | 1997-06-09 | 2000-09-05 | Telcordia Technologies, Inc. | Methods and structures to cure the effects of hydrogen annealing on ferroelectric capacitors |
| US6303952B1 (en) * | 1998-01-14 | 2001-10-16 | Texas Instruments Incorporated | Contact structure with an oxide silicidation barrier |
| AU6161599A (en) * | 1998-09-24 | 2000-04-10 | Telcordia Technologies, Inc. | Ferroelectric thin films of reduced tetragonality |
| US6075264A (en) * | 1999-01-25 | 2000-06-13 | Samsung Electronics Co., Ltd. | Structure of a ferroelectric memory cell and method of fabricating it |
| US6194754B1 (en) * | 1999-03-05 | 2001-02-27 | Telcordia Technologies, Inc. | Amorphous barrier layer in a ferroelectric memory cell |
| US6688729B1 (en) | 1999-06-04 | 2004-02-10 | Canon Kabushiki Kaisha | Liquid discharge head substrate, liquid discharge head, liquid discharge apparatus having these elements, manufacturing method of liquid discharge head, and driving method of the same |
| US6518609B1 (en) * | 2000-08-31 | 2003-02-11 | University Of Maryland | Niobium or vanadium substituted strontium titanate barrier intermediate a silicon underlayer and a functional metal oxide film |
| US6756620B2 (en) * | 2001-06-29 | 2004-06-29 | Intel Corporation | Low-voltage and interface damage-free polymer memory device |
| US6858862B2 (en) | 2001-06-29 | 2005-02-22 | Intel Corporation | Discrete polymer memory array and method of making same |
| US6624457B2 (en) | 2001-07-20 | 2003-09-23 | Intel Corporation | Stepped structure for a multi-rank, stacked polymer memory device and method of making same |
| US6960479B2 (en) * | 2001-07-20 | 2005-11-01 | Intel Corporation | Stacked ferroelectric memory device and method of making same |
| KR100561839B1 (ko) * | 2001-11-10 | 2006-03-16 | 삼성전자주식회사 | 강유전체 커패시터 및 그 제조방법 |
| US6936301B2 (en) * | 2002-05-06 | 2005-08-30 | North Carolina State University | Methods of controlling oxygen partial pressure during annealing of a perovskite dielectric layer |
| WO2004055876A1 (en) * | 2002-12-17 | 2004-07-01 | Ibule Photonics Inc. | Method for preparation of ferroelectric single crystal film structure using deposition method |
| US7297602B2 (en) * | 2003-09-09 | 2007-11-20 | Sharp Laboratories Of America, Inc. | Conductive metal oxide gate ferroelectric memory transistor |
| US7378286B2 (en) * | 2004-08-20 | 2008-05-27 | Sharp Laboratories Of America, Inc. | Semiconductive metal oxide thin film ferroelectric memory transistor |
| US7696549B2 (en) * | 2005-08-04 | 2010-04-13 | University Of Maryland | Bismuth ferrite films and devices grown on silicon |
| US20070029592A1 (en) * | 2005-08-04 | 2007-02-08 | Ramamoorthy Ramesh | Oriented bismuth ferrite films grown on silicon and devices formed thereby |
| JP4996113B2 (ja) * | 2006-03-08 | 2012-08-08 | セイコーエプソン株式会社 | 強誘電体キャパシタ及び強誘電体メモリ |
| US20100001371A1 (en) * | 2007-12-05 | 2010-01-07 | Rohm Co., Ltd. | Semiconductor device having capacitor including a high dielectric film and manufacture method of the same |
| US20100135061A1 (en) * | 2008-12-02 | 2010-06-03 | Shaoping Li | Non-Volatile Memory Cell with Ferroelectric Layer Configurations |
| US8026111B2 (en) * | 2009-02-24 | 2011-09-27 | Oracle America, Inc. | Dielectric enhancements to chip-to-chip capacitive proximity communication |
| FR2993705B1 (fr) * | 2012-07-20 | 2015-05-29 | Thales Sa | Dispositif comportant une pluralite de couches minces |
| US10861992B2 (en) | 2016-11-25 | 2020-12-08 | The Boeing Company | Perovskite solar cells for space |
| US20180151301A1 (en) * | 2016-11-25 | 2018-05-31 | The Boeing Company | Epitaxial perovskite materials for optoelectronics |
| US10937783B2 (en) * | 2016-11-29 | 2021-03-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor device and manufacturing method thereof |
| WO2020210257A1 (en) | 2019-04-08 | 2020-10-15 | Kepler Computing Inc. | Doped polar layers and semiconductor device incorporating same |
| US11482528B2 (en) | 2019-12-27 | 2022-10-25 | Kepler Computing Inc. | Pillar capacitor and method of fabricating such |
| US11289497B2 (en) | 2019-12-27 | 2022-03-29 | Kepler Computing Inc. | Integration method of ferroelectric memory array |
| US11430861B2 (en) | 2019-12-27 | 2022-08-30 | Kepler Computing Inc. | Ferroelectric capacitor and method of patterning such |
| US11792998B1 (en) | 2021-06-11 | 2023-10-17 | Kepler Computing Inc. | Process integration flow for embedded memory with multi-pocket masks for decoupling processing of memory areas from non-memory areas |
| WO2023079631A1 (ja) * | 2021-11-04 | 2023-05-11 | 三菱電機株式会社 | 半導体装置及びその製造方法 |
| US12200943B2 (en) | 2022-03-11 | 2025-01-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory device structure and manufacturing method thereof |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4017890A (en) * | 1975-10-24 | 1977-04-12 | International Business Machines Corporation | Intermetallic compound layer in thin films for improved electromigration resistance |
| US5051792A (en) * | 1987-10-20 | 1991-09-24 | Bell Communications Research, Inc. | Epitaxial intermetallic contact for compound for compound semiconductors |
| US5075755A (en) * | 1987-10-20 | 1991-12-24 | Bell Communications Research, Inc. | Epitaxial intermetallic contact for compound semiconductors |
| JP2847680B2 (ja) * | 1990-03-26 | 1999-01-20 | 株式会社村田製作所 | セラミック電子部品及びその製造方法 |
| US5169485A (en) * | 1991-03-07 | 1992-12-08 | Bell Communications Research, Inc. | Method for the preparation of epitaxial ferromagnetic manganese aluminum magnetic memory element |
| JPH0555514A (ja) * | 1991-08-28 | 1993-03-05 | Hitachi Ltd | 半導体装置およびその製造方法 |
| JPH05283756A (ja) * | 1992-03-31 | 1993-10-29 | Murata Mfg Co Ltd | 強誘電体薄膜素子 |
| US5187638A (en) * | 1992-07-27 | 1993-02-16 | Micron Technology, Inc. | Barrier layers for ferroelectric and pzt dielectric on silicon |
| US5371699A (en) * | 1992-11-17 | 1994-12-06 | Ramtron International Corporation | Non-volatile ferroelectric memory with folded bit lines and method of making the same |
| US5406445A (en) * | 1993-03-25 | 1995-04-11 | Matsushita Electric Industrial Co., Ltd. | Thin film capacitor and method of manufacturing the same |
| US5479317A (en) * | 1994-10-05 | 1995-12-26 | Bell Communications Research, Inc. | Ferroelectric capacitor heterostructure and method of making same |
| WO1997001854A1 (en) * | 1995-06-28 | 1997-01-16 | Bell Communication Research, Inc. | Barrier layer for ferroelectric capacitor integrated on silicon |
-
1996
- 1996-01-03 US US08/582,545 patent/US5777356A/en not_active Expired - Fee Related
- 1996-12-17 WO PCT/US1996/020164 patent/WO1997025745A1/en not_active Ceased
- 1996-12-17 KR KR1019980705122A patent/KR100329040B1/ko not_active Expired - Fee Related
- 1996-12-17 EP EP96944449A patent/EP0956595A1/en not_active Withdrawn
- 1996-12-17 CA CA002241676A patent/CA2241676C/en not_active Expired - Fee Related
- 1996-12-17 JP JP52522297A patent/JP3285036B2/ja not_active Expired - Fee Related
- 1996-12-24 IL IL11988996A patent/IL119889A/xx not_active IP Right Cessation
-
1997
- 1997-01-02 ID IDP970005A patent/ID19530A/id unknown
- 1997-01-03 MY MYPI97000012A patent/MY121282A/en unknown
- 1997-01-08 TW TW086100136A patent/TW336318B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| IL119889A0 (en) | 1997-03-18 |
| CA2241676A1 (en) | 1997-07-17 |
| TW336318B (en) | 1998-07-11 |
| JPH11508412A (ja) | 1999-07-21 |
| EP0956595A4 (id) | 1999-11-17 |
| MY121282A (en) | 2006-01-28 |
| KR100329040B1 (ko) | 2002-06-20 |
| WO1997025745A1 (en) | 1997-07-17 |
| IL119889A (en) | 1999-12-31 |
| KR19990076992A (ko) | 1999-10-25 |
| CA2241676C (en) | 2002-04-02 |
| US5777356A (en) | 1998-07-07 |
| EP0956595A1 (en) | 1999-11-17 |
| JP3285036B2 (ja) | 2002-05-27 |
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