IL64830A - Automatic test system - Google Patents

Automatic test system

Info

Publication number
IL64830A
IL64830A IL64830A IL6483082A IL64830A IL 64830 A IL64830 A IL 64830A IL 64830 A IL64830 A IL 64830A IL 6483082 A IL6483082 A IL 6483082A IL 64830 A IL64830 A IL 64830A
Authority
IL
Israel
Prior art keywords
test system
automatic test
automatic
test
Prior art date
Application number
IL64830A
Other languages
English (en)
Other versions
IL64830A0 (en
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of IL64830A0 publication Critical patent/IL64830A0/xx
Publication of IL64830A publication Critical patent/IL64830A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/865—Monitoring of software

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Human Computer Interaction (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
IL64830A 1981-06-15 1982-01-21 Automatic test system IL64830A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/273,720 US4397021A (en) 1981-06-15 1981-06-15 Multi-processor automatic test system

Publications (2)

Publication Number Publication Date
IL64830A0 IL64830A0 (en) 1982-03-31
IL64830A true IL64830A (en) 1985-04-30

Family

ID=23045118

Family Applications (1)

Application Number Title Priority Date Filing Date
IL64830A IL64830A (en) 1981-06-15 1982-01-21 Automatic test system

Country Status (8)

Country Link
US (1) US4397021A (fr)
EP (1) EP0067496B1 (fr)
JP (1) JPS57208411A (fr)
AU (1) AU7977182A (fr)
CA (1) CA1173165A (fr)
DE (1) DE3278545D1 (fr)
IE (1) IE53976B1 (fr)
IL (1) IL64830A (fr)

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USD939307S1 (en) * 2018-09-10 2021-12-28 Tsung-Yi Chang Seat for socket

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DE3374723D1 (en) * 1982-02-17 1988-01-07 British Aerospace Aircraft data instrumentation and acquisition system
US4617642A (en) * 1982-05-06 1986-10-14 Data General Corporation Select switch responsive to a break code
FR2531651B1 (fr) * 1982-08-12 1985-05-24 Manurhin
US4539645A (en) * 1982-08-23 1985-09-03 Conoco Inc. Automated sample analyzer for induction furnace analysis
US4620304A (en) * 1982-09-13 1986-10-28 Gen Rad, Inc. Method of and apparatus for multiplexed automatic testing of electronic circuits and the like
JPS59111597A (ja) * 1982-12-16 1984-06-27 横河電機株式会社 テストシステム
JPS59163695A (ja) * 1983-03-07 1984-09-14 横河電機株式会社 テストシステム
US4617663A (en) * 1983-04-13 1986-10-14 At&T Information Systems Inc. Interface testing of software systems
JPS59194292A (ja) * 1983-04-18 1984-11-05 横河電機株式会社 テストシステム
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GB2195028B (en) * 1983-11-25 1988-09-01 Mars Inc Automatic test equipment
EP0143623A3 (fr) * 1983-11-25 1987-09-23 Mars Incorporated Equipement de test automatique
GB2195029B (en) * 1983-11-25 1988-09-01 Mars Inc Automatic test equipment
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JPS60235275A (ja) * 1984-05-08 1985-11-21 Kontetsuku:Kk コンピユ−タ援用計測システム
US4937827A (en) * 1985-03-01 1990-06-26 Mentor Graphics Corporation Circuit verification accessory
JPS61239165A (ja) * 1985-04-16 1986-10-24 Yokogawa Electric Corp 測定システム
IE851998L (en) * 1985-08-14 1987-05-11 Francis Anthony Purcell Test apparatus for electronic equipment
USH241H (en) 1985-09-16 1987-03-03 The United States Of America As Represented By The Secretary Of The Navy Programmable telemetry word selector
US4707834A (en) * 1985-09-17 1987-11-17 Tektronix, Inc. Computer-based instrument system
US4692298A (en) * 1985-10-18 1987-09-08 Westinghouse Electric Corp. Analog process control system testing
US4744084A (en) * 1986-02-27 1988-05-10 Mentor Graphics Corporation Hardware modeling system and method for simulating portions of electrical circuits
US4763124A (en) * 1986-03-06 1988-08-09 Grumman Aerospace Corporation Signal distribution system hybrid relay controller/driver
US4719459A (en) * 1986-03-06 1988-01-12 Grumman Aerospace Corporation Signal distribution system switching module
US4760330A (en) * 1986-06-06 1988-07-26 Northern Telecom Limited Test system with shared test instruments
DE3752280T2 (de) * 1986-07-30 2000-02-03 Hitachi, Ltd. Mustergenerator
US4760329A (en) * 1987-04-23 1988-07-26 Grumman Aerospace Corporation Programmable tester with bubble memory
US5426767A (en) * 1987-08-03 1995-06-20 Compaq Computer Corporation Method for distinguishing between a 286-type central processing unit and a 386-type central processing unit
US5293374A (en) * 1989-03-29 1994-03-08 Hewlett-Packard Company Measurement system control using real-time clocks and data buffers
US5029166A (en) * 1989-05-31 1991-07-02 At&T Bell Laboratories Method and apparatus for testing circuit boards
US5025205A (en) * 1989-06-22 1991-06-18 Texas Instruments Incorporated Reconfigurable architecture for logic test system
US5131272A (en) * 1990-03-15 1992-07-21 Harris Corporation Portable deployable automatic test system
GB9106758D0 (en) * 1991-03-28 1991-05-15 Genrad Ltd A system for determining the operations of an integrated circuit and processor for use therein
US5774377A (en) * 1991-07-30 1998-06-30 Hewlett-Packard Company Method and apparatus for monitoring a subsystem within a distributed system for providing an archive of events within a certain time of a trap condition
US5223788A (en) * 1991-09-12 1993-06-29 Grumman Aerospace Corporation Functional avionic core tester
US5349682A (en) * 1992-01-31 1994-09-20 Parallel Pcs, Inc. Dynamic fault-tolerant parallel processing system for performing an application function with increased efficiency using heterogeneous processors
US5638383A (en) * 1992-07-24 1997-06-10 Trw Inc. Advanced integrated avionics testing system
JPH06167362A (ja) * 1992-11-27 1994-06-14 Matsushita Electric Ind Co Ltd マスタ・スレーブ切り替え式計測装置
US5390325A (en) * 1992-12-23 1995-02-14 Taligent, Inc. Automated testing system
US5696772A (en) * 1994-05-06 1997-12-09 Credence Systems Corporation Test vector compression/decompression system for parallel processing integrated circuit tester
US5748642A (en) * 1995-09-25 1998-05-05 Credence Systems Corporation Parallel processing integrated circuit tester
US5740353A (en) * 1995-12-14 1998-04-14 International Business Machines Corporation Method and apparatus for creating a multiprocessor verification environment
EP0827368B1 (fr) * 1996-08-05 2001-05-30 Harness System Technologies Research, Ltd. Système de contrôle des charges
US6021261A (en) * 1996-12-05 2000-02-01 International Business Machines Corporation Method and system for testing a multiprocessor data processing system utilizing a plurality of event tracers
FR2812958B1 (fr) * 2000-08-11 2002-11-08 Thomson Csf Systeme de maintenance pour un ensemble d'equipements
DE10050546B4 (de) * 2000-10-12 2008-07-24 Rohde & Schwarz Gmbh & Co. Kg Verfahren zum Verteilen eines Messgeräte-Firmware Programmcodes auf mehrere Meßgeräte
US6590644B1 (en) * 2001-01-12 2003-07-08 Ciena Corporation Optical module calibration system
JP2003066099A (ja) * 2001-08-23 2003-03-05 Advantest Corp 測定制御装置、方法、プログラムおよび該プログラムを記録した記録媒体
US20040066794A1 (en) * 2002-10-08 2004-04-08 Hill Gregory S. Instrument module locator
US7171587B2 (en) * 2003-04-28 2007-01-30 Teradyne, Inc. Automatic test system with easily modified software
US7188044B1 (en) * 2004-07-29 2007-03-06 National Semiconductor Corporation World-wide distributed testing for integrated circuits
WO2006064551A1 (fr) * 2004-12-14 2006-06-22 Atsunori Shibuya Appareil de test
US7627456B2 (en) * 2005-02-03 2009-12-01 Raytheon Company Dynamically tasking one or more surveillance resources
US7849362B2 (en) * 2005-12-09 2010-12-07 International Business Machines Corporation Method and system of coherent design verification of inter-cluster interactions
US7552028B2 (en) * 2006-12-01 2009-06-23 Advantest Corporation Recording medium, test apparatus and diagnostic method
US7707000B2 (en) * 2007-04-19 2010-04-27 Agilent Technologies, Inc. Test instrument and system responsive to execution time data
US20120242357A1 (en) * 2011-03-23 2012-09-27 Hamilton Sundstrand Corporation Automatic fault insertion, calibration and test system
US9336108B2 (en) 2013-01-24 2016-05-10 Xcerra Corporation Scalable test platform
US9430348B2 (en) 2013-01-24 2016-08-30 Xcerra Corporation Scalable test platform in a PCI express environment with direct memory access
US9213616B2 (en) * 2013-01-24 2015-12-15 Xcerra Corporation Automated test platform utilizing status register polling with temporal ID
US9459978B2 (en) 2013-01-24 2016-10-04 Xcerra Corporation Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under test
US9430349B2 (en) 2013-01-24 2016-08-30 Xcerra Corporation Scalable test platform in a PCI express environment with direct memory access
CN110927502A (zh) * 2019-12-12 2020-03-27 北京格润海泰科技有限公司 一种射频组件的自动化测试系统和方法

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US3694632A (en) * 1969-12-31 1972-09-26 Hawker Siddeley Dynamics Ltd Automatic test equipment utilizing a matrix of digital differential analyzer integrators to generate interrogation signals
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
US4125763A (en) * 1977-07-15 1978-11-14 Fluke Trendar Corporation Automatic tester for microprocessor board
US4313200A (en) * 1978-08-28 1982-01-26 Takeda Riken Kogyo Kabushikikaisha Logic test system permitting test pattern changes without dummy cycles
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US4300207A (en) * 1979-09-25 1981-11-10 Grumman Aerospace Corporation Multiple matrix switching system
US4348759A (en) * 1979-12-17 1982-09-07 International Business Machines Corporation Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test
US4339819A (en) * 1980-06-17 1982-07-13 Zehntel, Inc. Programmable sequence generator for in-circuit digital testing
US4402055A (en) * 1981-01-27 1983-08-30 Westinghouse Electric Corp. Automatic test system utilizing interchangeable test devices

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD939307S1 (en) * 2018-09-10 2021-12-28 Tsung-Yi Chang Seat for socket

Also Published As

Publication number Publication date
EP0067496A3 (en) 1985-04-03
CA1173165A (fr) 1984-08-21
IE53976B1 (en) 1989-05-10
EP0067496A2 (fr) 1982-12-22
US4397021A (en) 1983-08-02
IL64830A0 (en) 1982-03-31
DE3278545D1 (en) 1988-06-30
JPS57208411A (en) 1982-12-21
AU7977182A (en) 1982-12-23
IE820219L (en) 1982-12-15
EP0067496B1 (fr) 1988-05-25

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