IL78524A - Compositions containing perfluoropolyethers for carrying out tests in the electronic field - Google Patents

Compositions containing perfluoropolyethers for carrying out tests in the electronic field

Info

Publication number
IL78524A
IL78524A IL78524A IL7852486A IL78524A IL 78524 A IL78524 A IL 78524A IL 78524 A IL78524 A IL 78524A IL 7852486 A IL7852486 A IL 7852486A IL 78524 A IL78524 A IL 78524A
Authority
IL
Israel
Prior art keywords
temperatures
carrying
compositions containing
electronic field
out tests
Prior art date
Application number
IL78524A
Other languages
English (en)
Other versions
IL78524A0 (en
Original Assignee
Montedison Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Montedison Spa filed Critical Montedison Spa
Publication of IL78524A0 publication Critical patent/IL78524A0/xx
Publication of IL78524A publication Critical patent/IL78524A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/22—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
    • G01M3/226—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Lubricants (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Solid-Sorbent Or Filter-Aiding Compositions (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Polyethers (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Sealing Material Composition (AREA)
  • Developing Agents For Electrophotography (AREA)
  • Detergent Compositions (AREA)
IL78524A 1985-04-24 1986-04-16 Compositions containing perfluoropolyethers for carrying out tests in the electronic field IL78524A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT20477/85A IT1201416B (it) 1985-04-24 1985-04-24 Perfluoropolieteri impiegati come fluidi per il testing nell'elettronica

Publications (2)

Publication Number Publication Date
IL78524A0 IL78524A0 (en) 1986-08-31
IL78524A true IL78524A (en) 1990-03-19

Family

ID=11167529

Family Applications (1)

Application Number Title Priority Date Filing Date
IL78524A IL78524A (en) 1985-04-24 1986-04-16 Compositions containing perfluoropolyethers for carrying out tests in the electronic field

Country Status (13)

Country Link
US (2) US4955726A (fr)
EP (1) EP0203348B1 (fr)
JP (1) JPH0713236B2 (fr)
KR (1) KR950007523B1 (fr)
AT (1) ATE85117T1 (fr)
AU (1) AU594049B2 (fr)
CA (1) CA1272944A (fr)
CS (1) CS273174B2 (fr)
DE (1) DE3687593T2 (fr)
ES (1) ES8900089A1 (fr)
IL (1) IL78524A (fr)
IT (1) IT1201416B (fr)
ZA (1) ZA862863B (fr)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6288561B1 (en) 1988-05-16 2001-09-11 Elm Technology Corporation Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
US5506309A (en) * 1988-09-28 1996-04-09 Exfluor Research Corporation Perfluorinates polyethers
US5539059A (en) * 1988-09-28 1996-07-23 Exfluor Research Corporation Perfluorinated polyethers
JPH04503946A (ja) * 1988-09-28 1992-07-16 ミネソタ・マイニング・アンド・マニュフアクチャリング・カンパニー（“３アエム　カンパニー”） ペルフルオロアセタール及びペルフルオロケタール化合物並びに熱衝撃試験におけるそれらの使用
US5362919A (en) * 1988-12-02 1994-11-08 Minnesota Mining And Manufacturing Company Direct fluorination process for making perfluorinated organic substances
US5039228A (en) * 1989-11-02 1991-08-13 The United States Of America As Represented By The Secretary Of The Navy Fixtureless environmental stress screening apparatus
IT1237887B (it) * 1989-12-12 1993-06-18 Ausimont Spa Lubrificanti perfluoropolieterei aventi proprieta' antiusura
DE4025348A1 (de) * 1990-08-10 1992-02-13 Hoechst Ag Verfahren und vorrichtung fuer die thermoschock-pruefung
EP0522357A1 (fr) * 1991-06-28 1993-01-13 Hoechst Aktiengesellschaft Méthode qualitative et quantitative pour tester l'étanchéité des pièces creuses
US5369983A (en) * 1992-04-17 1994-12-06 Minnesota Mining And Manufacturing Company Detection medium and method for use in hermetic seal testing
DE59500865D1 (de) * 1994-04-15 1997-11-27 Siemens Ag Verwendung einer prüfflüssigkeit zur kontrolle der funktionsfähigkeit elektrischer kraftwerkskomponenten
EP1021696B1 (fr) * 1997-10-15 2002-01-23 Minnesota Mining And Manufacturing Company Utilisation d'hydrofluoroethers comme liquide de test lors du test d'un composant electronique
US20020151527A1 (en) * 2000-12-20 2002-10-17 Benjamin Wiegand Method for reducing acne or improving skin tone
US20050079620A1 (en) * 2003-10-10 2005-04-14 Eberhard Douglas P. Leak testing of hermetic enclosures for implantable energy storage devices
JP4881051B2 (ja) * 2005-09-16 2012-02-22 株式会社アドバンテスト 導電性流体検出装置用のフィルタユニット及びそれを用いた導電性流体検出装置
CN102224216B (zh) * 2008-09-26 2015-01-28 索尔维索莱克西斯公司 传热方法
EP2614125B1 (fr) 2010-09-10 2015-11-25 Solvay Specialty Polymers Italy S.p.A. Procédé pour transférer de la chaleur
DE102020112333A1 (de) 2020-05-07 2021-11-11 Bayerische Motoren Werke Aktiengesellschaft Verfahren zur Alterung einer elektronischen Baugruppe, Bewertungsverfahren zur Bewertung der Dauerhaltbarkeit von elektronischen Baugruppen sowie elektronische Baugruppe
CN115612464B (zh) * 2021-07-16 2026-03-31 浙江省化工研究院有限公司 一种适用于高温环境的液冷介质组合物及其应用
WO2025105430A1 (fr) * 2023-11-17 2025-05-22 Ａｇｃ株式会社 Solution pour essai destinée à un essai de fiabilité de dispositif électronique, et procédé d'essai

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3242218A (en) * 1961-03-29 1966-03-22 Du Pont Process for preparing fluorocarbon polyethers
DE1249247B (de) * 1961-04-25 1967-09-07 E. I. Du Pont De Nemours And Company, Wilmington, Del. (V. St. A.) Verfahren zur Herstellung von Perfluorolefinpolyäthern
US3665041A (en) * 1967-04-04 1972-05-23 Montedison Spa Perfluorinated polyethers and process for their preparation
GB1226566A (fr) * 1967-04-04 1971-03-31
US3761808A (en) * 1970-07-08 1973-09-25 Aai Corp Testing arrangement
JPS4945719A (en) * 1972-09-04 1974-05-01 Fuji Photo Film Co Ltd Ichiganrefukamera no miraakaido nyoru shogekikanshosochi
JPS51132778A (en) * 1975-05-14 1976-11-18 Hitachi Ltd Inspection method of semiconductor apparatus
US4523039A (en) * 1980-04-11 1985-06-11 The University Of Texas Method for forming perfluorocarbon ethers
DE3486428T2 (de) * 1983-12-26 1996-10-10 Daikin Ind Ltd Halogen enthaltendes Polyether

Also Published As

Publication number Publication date
DE3687593D1 (de) 1993-03-11
CS298986A2 (en) 1990-07-12
EP0203348A3 (en) 1987-01-28
IT8520477A0 (it) 1985-04-24
EP0203348A2 (fr) 1986-12-03
AU594049B2 (en) 1990-03-01
ES8900089A1 (es) 1988-12-01
EP0203348B1 (fr) 1993-01-27
CA1272944A (fr) 1990-08-21
US5083082A (en) 1992-01-21
ATE85117T1 (de) 1993-02-15
US4955726A (en) 1990-09-11
JPS626184A (ja) 1987-01-13
IL78524A0 (en) 1986-08-31
ZA862863B (en) 1986-12-30
IT1201416B (it) 1989-02-02
DE3687593T2 (de) 1993-07-15
ES554257A0 (es) 1988-12-01
KR860008457A (ko) 1986-11-15
JPH0713236B2 (ja) 1995-02-15
AU5632786A (en) 1986-10-30
CS273174B2 (en) 1991-03-12
KR950007523B1 (ko) 1995-07-11

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