IN2014DN07350A - - Google Patents

Info

Publication number
IN2014DN07350A
IN2014DN07350A IN7350DEN2014A IN2014DN07350A IN 2014DN07350 A IN2014DN07350 A IN 2014DN07350A IN 7350DEN2014 A IN7350DEN2014 A IN 7350DEN2014A IN 2014DN07350 A IN2014DN07350 A IN 2014DN07350A
Authority
IN
India
Prior art keywords
objects
criteria
user
storage
computerized system
Prior art date
Application number
Other languages
English (en)
Inventor
Yakov Faitelson
Ohad Korkus
KATZIR Ophir KRETZER
David Bass
Original Assignee
Varonis Sys Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varonis Sys Ltd filed Critical Varonis Sys Ltd
Publication of IN2014DN07350A publication Critical patent/IN2014DN07350A/en

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/20—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by the properties tested or measured, e.g. structural or electrical properties
    • H10P74/207—Electrical properties, e.g. testing or measuring of resistance, deep levels or capacitance-voltage characteristics

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
IN7350DEN2014 2012-08-08 2012-03-27 IN2014DN07350A (th)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IL2012/050296 WO2014024178A1 (en) 2012-08-08 2012-08-08 Method of improving wafer yield

Publications (1)

Publication Number Publication Date
IN2014DN07350A true IN2014DN07350A (th) 2015-04-24

Family

ID=46881113

Family Applications (1)

Application Number Title Priority Date Filing Date
IN7350DEN2014 IN2014DN07350A (th) 2012-08-08 2012-03-27

Country Status (2)

Country Link
IN (1) IN2014DN07350A (th)
WO (1) WO2014024178A1 (th)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111316412A (zh) * 2017-11-03 2020-06-19 东京毅力科创株式会社 功能性微电子装置的产出的提高
US11244873B2 (en) * 2018-10-31 2022-02-08 Tokyo Electron Limited Systems and methods for manufacturing microelectronic devices
CN114678284B (zh) * 2020-12-24 2025-04-29 紫光同芯微电子有限公司 一种晶圆组芯片潜在失效筛选方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3659981B2 (ja) * 1992-07-09 2005-06-15 アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド ダイ特定情報に特徴付けられるダイ上の集積回路を含む装置
US6477685B1 (en) * 1999-09-22 2002-11-05 Texas Instruments Incorporated Method and apparatus for yield and failure analysis in the manufacturing of semiconductors

Also Published As

Publication number Publication date
WO2014024178A1 (en) 2014-02-13

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