IN2014DN08719A - - Google Patents

Info

Publication number
IN2014DN08719A
IN2014DN08719A IN8719DEN2014A IN2014DN08719A IN 2014DN08719 A IN2014DN08719 A IN 2014DN08719A IN 8719DEN2014 A IN8719DEN2014 A IN 8719DEN2014A IN 2014DN08719 A IN2014DN08719 A IN 2014DN08719A
Authority
IN
India
Prior art keywords
feature
analogue probe
traverse
finding
motion
Prior art date
Application number
Inventor
John Ould
Kevin Tett
Original Assignee
Renishaw Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw Plc filed Critical Renishaw Plc
Publication of IN2014DN08719A publication Critical patent/IN2014DN08719A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G01B7/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

A method of finding a feature of an object using an analogue probe mounted on a machine tool. The method comprises the analogue probe and/or object following a course of motion which causes the analogue probe s surface sensing region to traverse across the feature to be found a plurality of times whilst approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.
IN8719DEN2014 2012-04-18 2013-04-16 IN2014DN08719A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP12250095 2012-04-18
US201261720307P 2012-10-30 2012-10-30
PCT/GB2013/050966 WO2013156767A1 (en) 2012-04-18 2013-04-16 A method of finding a feature using a machine tool

Publications (1)

Publication Number Publication Date
IN2014DN08719A true IN2014DN08719A (en) 2015-05-22

Family

ID=49382987

Family Applications (1)

Application Number Title Priority Date Filing Date
IN8719DEN2014 IN2014DN08719A (en) 2012-04-18 2013-04-16

Country Status (7)

Country Link
US (2) US9733060B2 (en)
EP (1) EP2839241B1 (en)
JP (1) JP6242856B2 (en)
CN (1) CN104995481B (en)
IN (1) IN2014DN08719A (en)
TW (1) TWI503522B (en)
WO (1) WO2013156767A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3144632B1 (en) 2015-09-18 2021-08-11 Hexagon Technology Center GmbH Coordinate measuring machine having a camera
WO2013156767A1 (en) 2012-04-18 2013-10-24 Renishaw Plc A method of finding a feature using a machine tool
US10037017B2 (en) 2012-04-18 2018-07-31 Renishaw Plc Method of measurement on a machine tool and corresponding machine tool apparatus
US9726481B2 (en) * 2012-04-18 2017-08-08 Renishaw Plc Method of analogue measurement scanning on a machine tool
US9250055B2 (en) * 2014-05-09 2016-02-02 Mitutoyo Corporation High speed contact detector for measurement sensors
GB201505999D0 (en) 2015-04-09 2015-05-27 Renishaw Plc Measurement method and apparatus
GB201615307D0 (en) * 2016-09-09 2016-10-26 Renishaw Plc Measurement method and apparatus
JP6474439B2 (en) 2017-02-22 2019-02-27 ファナック株式会社 Data collection device and data collection program
EP3460384A1 (en) * 2017-09-26 2019-03-27 Renishaw PLC Measurement probe
EP3623883B1 (en) * 2018-09-17 2024-07-24 Adelbert Haas GmbH Method and machine tool for machining workpieces with unknown workpiece geometry
EP3685961A1 (en) * 2019-01-25 2020-07-29 Renishaw PLC Measurement device for a machine tool
CN118204908B (en) * 2024-05-21 2024-07-30 西安汉沣精密机械有限公司 Method for processing full closed loop of workpiece

Family Cites Families (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4153998A (en) 1972-09-21 1979-05-15 Rolls-Royce (1971) Limited Probes
US4166323A (en) * 1973-09-14 1979-09-04 Maag Gear-Wheel & Machine Co. Ltd. Gear tester for profile and lead testing
GB1551218A (en) 1975-05-13 1979-08-22 Rolls Royce Probe for use in displacement measuring apparatus
GB2174216B (en) 1985-03-19 1988-10-26 Mitutoyo Mfg Co Ltd Method of operating a coordinate measuring instrument
CN85105480A (en) 1985-07-17 1987-01-14 通用电气公司 Tip Touch Probing System
GB8713715D0 (en) 1987-06-11 1987-07-15 Renishaw Plc Workpiece inspection method
JPH02145908A (en) 1988-11-28 1990-06-05 Okuma Mach Works Ltd Automatic setting for correcting deflection of stylus in digitizing device
GB8908854D0 (en) 1989-04-19 1989-06-07 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
US5189806A (en) * 1988-12-19 1993-03-02 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
GB9110818D0 (en) 1991-05-21 1991-07-10 Renishaw Metrology Ltd A method of measuring workpieces using a surface contacting measuring probe
DE4245012B4 (en) 1992-04-14 2004-09-23 Carl Zeiss Method for measuring shaped elements on a coordinate measuring machine
EP0588512B1 (en) 1992-09-12 1997-04-09 RENISHAW plc Method of and apparatus for scanning the surface of a workpiece
US5948972A (en) 1994-12-22 1999-09-07 Kla-Tencor Corporation Dual stage instrument for scanning a specimen
GB2302589B (en) 1995-06-21 1998-11-11 Zeiss Stiftung Probe head for coordinate measuring machines with a clamping device for clamping the deflectable part of the probe head
DE19730471C5 (en) 1997-07-16 2009-02-19 Hexagon Metrology Gmbh Method for scanning with a coordinate measuring machine
US6580964B2 (en) * 1998-10-24 2003-06-17 Renishaw Plc Calibrations of an analogue probe and error mapping
JP4660779B2 (en) 2000-08-18 2011-03-30 学校法人 中央大学 Method for evaluating position error of moving device and method for improving moving accuracy based on the evaluation result
JP3905771B2 (en) 2001-03-02 2007-04-18 株式会社ミツトヨ Calibration method and apparatus for measuring machine
GB0118492D0 (en) 2001-07-30 2001-09-19 Renishaw Plc A machine tool control process and apparatus therfor
GB0126232D0 (en) 2001-11-01 2002-01-02 Renishaw Plc Calibration of an analogue probe
GB0210990D0 (en) * 2002-05-14 2002-06-19 Rolls Royce Plc Method of generating an inspection program and method of generating a visual display
GB0215152D0 (en) 2002-07-01 2002-08-07 Renishaw Plc Probe or stylus orientation
GB0215478D0 (en) * 2002-07-04 2002-08-14 Renishaw Plc Method of scanning a calibrating system
GB0220158D0 (en) 2002-08-30 2002-10-09 Renishaw Plc Method of scanning
CN1297796C (en) 2003-07-02 2007-01-31 西安交通大学 Chromatographic scanning three-dimension measuring method and device linear array photoelectric sensor
GB0322115D0 (en) 2003-09-22 2003-10-22 Renishaw Plc Method of error compensation
GB0322362D0 (en) 2003-09-24 2003-10-22 Renishaw Plc Measuring methods for use on machine tools
US7543393B2 (en) * 2003-12-16 2009-06-09 Renishaw Plc Method of calibrating a scanning system
GB0329098D0 (en) 2003-12-16 2004-01-21 Renishaw Plc Method of calibrating a scanning system
GB0400144D0 (en) 2004-01-06 2004-02-11 Renishaw Plc Inspection system
EP1555676A3 (en) 2004-01-14 2006-09-13 FEI Company Method of operating a probe microscope
CN1727871A (en) 2004-01-14 2006-02-01 Fei公司 Method of operating a probe microscope
US20080021672A1 (en) 2004-03-18 2008-01-24 Renishaw Plc Scanning an Object
JP4782990B2 (en) 2004-05-31 2011-09-28 株式会社ミツトヨ Surface scanning measuring device, surface scanning measuring method, surface scanning measuring program, and recording medium
JP4510520B2 (en) 2004-06-01 2010-07-28 キヤノン株式会社 Shape measuring method and shape measuring apparatus
GB0414649D0 (en) 2004-06-30 2004-08-04 Renishaw Plc Generation of a CNC machine tool control program
GB0417536D0 (en) 2004-08-06 2004-09-08 Renishaw Plc The use of surface measurement probes
GB0508273D0 (en) 2005-04-25 2005-06-01 Renishaw Plc Method for scanning the surface of a workpiece
GB0508395D0 (en) 2005-04-26 2005-06-01 Renishaw Plc Method for scanning the surface of a workpiece
US20070050089A1 (en) 2005-09-01 2007-03-01 Yunquan Sun Method for detecting the position and orientation of holes using robotic vision system
GB0608235D0 (en) * 2006-04-26 2006-06-07 Renishaw Plc Differential calibration
GB0611109D0 (en) 2006-06-06 2006-07-19 Renishaw Plc A method for measuring workpieces
GB0625260D0 (en) 2006-12-19 2007-01-24 Renishaw Plc A method for measuring a workpiece using a machine tool
GB0703423D0 (en) 2007-02-22 2007-04-04 Renishaw Plc Calibration method and apparatus
EP1978328B1 (en) 2007-04-03 2015-02-18 Hexagon Metrology AB Oscillating scanning probe with constant contact force
GB0707921D0 (en) 2007-04-24 2007-05-30 Renishaw Plc Apparatus and method for surface measurement
US8919005B2 (en) 2007-04-30 2014-12-30 Renishaw Plc Analogue probe and method of operation
EP1988357B1 (en) 2007-05-04 2018-10-17 Hexagon Technology Center GmbH Coordinate measuring method and device
GB0713639D0 (en) 2007-07-13 2007-08-22 Renishaw Plc Error correction
GB0716218D0 (en) 2007-08-20 2007-09-26 Renishaw Plc Measurement path generation
JP5091702B2 (en) 2008-02-04 2012-12-05 株式会社ミツトヨ Probe straightness measurement method
US7752000B2 (en) 2008-05-02 2010-07-06 Qcept Technologies, Inc. Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motion
JP4611403B2 (en) * 2008-06-03 2011-01-12 パナソニック株式会社 Shape measuring apparatus and shape measuring method
US9689655B2 (en) 2008-10-29 2017-06-27 Renishaw Plc Measurement method
GB0900878D0 (en) * 2009-01-20 2009-03-04 Renishaw Plc Method for optimising a measurement cycle
EP2290486A1 (en) 2009-08-28 2011-03-02 Renishaw plc Machine tool calibration method
JP5281992B2 (en) 2009-08-28 2013-09-04 株式会社日立製作所 Scanning probe microscope and measuring method using the same
JP5439157B2 (en) * 2009-12-22 2014-03-12 三菱重工業株式会社 Gear measurement method
WO2012037059A1 (en) 2010-09-13 2012-03-22 Hexagon Technology Center Gmbh Method and apparatus for controlling a surface scanning coordinate measuring machine
TWI458938B (en) 2011-01-19 2014-11-01 Renishaw Plc Analogue measurement probe for a machine tool apparatus
JP6199870B2 (en) * 2011-10-06 2017-09-20 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ Measuring method
WO2013156767A1 (en) 2012-04-18 2013-10-24 Renishaw Plc A method of finding a feature using a machine tool
US9726481B2 (en) * 2012-04-18 2017-08-08 Renishaw Plc Method of analogue measurement scanning on a machine tool

Also Published As

Publication number Publication date
US9733060B2 (en) 2017-08-15
US20170261305A1 (en) 2017-09-14
CN104995481A (en) 2015-10-21
EP2839241A1 (en) 2015-02-25
TWI503522B (en) 2015-10-11
JP6242856B2 (en) 2017-12-06
EP2839241B1 (en) 2018-08-08
TW201350790A (en) 2013-12-16
CN104995481B (en) 2018-05-01
JP2015531853A (en) 2015-11-05
US9952028B2 (en) 2018-04-24
US20150101204A1 (en) 2015-04-16
WO2013156767A1 (en) 2013-10-24

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