IT1066861B - Dispositivo per determinare una dimensione di una superficie in un piano - Google Patents

Dispositivo per determinare una dimensione di una superficie in un piano

Info

Publication number
IT1066861B
IT1066861B IT22221/76A IT2222176A IT1066861B IT 1066861 B IT1066861 B IT 1066861B IT 22221/76 A IT22221/76 A IT 22221/76A IT 2222176 A IT2222176 A IT 2222176A IT 1066861 B IT1066861 B IT 1066861B
Authority
IT
Italy
Prior art keywords
floor
dimension
determining
Prior art date
Application number
IT22221/76A
Other languages
English (en)
Original Assignee
Betr Forsch Inst Angew Forsch
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Betr Forsch Inst Angew Forsch filed Critical Betr Forsch Inst Angew Forsch
Application granted granted Critical
Publication of IT1066861B publication Critical patent/IT1066861B/it

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT22221/76A 1975-04-16 1976-04-13 Dispositivo per determinare una dimensione di una superficie in un piano IT1066861B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19752516756 DE2516756A1 (de) 1975-04-16 1975-04-16 Verfahren und vorrichtung zur bestimmung einer flaechenabmessung in einer ebene

Publications (1)

Publication Number Publication Date
IT1066861B true IT1066861B (it) 1985-03-12

Family

ID=5944131

Family Applications (1)

Application Number Title Priority Date Filing Date
IT22221/76A IT1066861B (it) 1975-04-16 1976-04-13 Dispositivo per determinare una dimensione di una superficie in un piano

Country Status (8)

Country Link
US (1) US4067652A (it)
BE (1) BE840835A (it)
DE (1) DE2516756A1 (it)
FR (1) FR2308085A1 (it)
GB (2) GB1547185A (it)
IT (1) IT1066861B (it)
LU (1) LU74728A1 (it)
NL (1) NL7603785A (it)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE429163C (sv) * 1977-03-17 1985-11-18 Bethlehem Steel Corp Anordning och forfarande for kontinuerlig kompensering av felsignaler vid elektrooptisk metning av en i rorelse befintlig stangs tverdimensioner
CH617130A5 (it) * 1977-11-04 1980-05-14 Radioelectrique Comp Ind
DE2819395C2 (de) * 1978-05-03 1980-01-10 Hoesch Werke Ag, 4600 Dortmund Verfahren und Vorrichtung zum Bestimmen der Breite von Walzerzeugnissen
BE876124A (fr) * 1979-05-08 1979-09-03 Centre Rech Metallurgique Procede pour controler les dimensions de la section transversale des poutrelles
DE2920531B2 (de) * 1979-05-21 1981-04-16 Exatest Meßtechnik GmbH, 5090 Leverkusen Einrichtung zur Dimensionsmessung von eigenleuchtendem Meßgut
GB2052734B (en) * 1979-05-21 1983-10-19 Daystrom Ltd Position and dimension measuring apparaus
US5114230A (en) * 1979-09-07 1992-05-19 Diffracto Ltd. Electro-optical inspection
DE2945251A1 (de) * 1979-11-09 1981-05-14 Betriebsforschungsinstitut VDEh - Institut für angewandte Forschung GmbH, 4000 Düsseldorf Verfahren und vorrichtung zur bestimmung der lage einer oberflaeche
US4490617A (en) * 1979-11-26 1984-12-25 European Electronic Systems Limited Optical width measuring system using two cameras
EP0094522A3 (en) * 1980-03-19 1984-07-18 European Electronic Systems Limited Edge detection
DE3208527C2 (de) * 1981-04-11 1985-06-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Einrichtung zum Steuern von Arbeitsgeräten, insbesondere von Gebläsen, Bürsten, Düsen oder dgl. in einer automatischen Fahrzeugwaschanlage
DE3151384A1 (de) * 1981-12-24 1983-07-07 Thyssen AG vorm. August Thyssen-Hütte, 4100 Duisburg Verfahren zum messen der breite, insbesondere des kopfes, von selbstleuchtendem walzgut und verfahren zum schopfen des kopfes von selbstleuchtendem walzgut
DE3415043C1 (de) * 1984-04-21 1985-07-11 Eltro GmbH, Gesellschaft für Strahlungstechnik, 6900 Heidelberg Verfahren und Schaltungsanordnung zum entfernungs- und winkelunabhaengigen Messen gleicher Abstandspunkte von einem gemeinsamen Bezugspunkt aus
US5383021A (en) * 1993-04-19 1995-01-17 Mectron Engineering Company Optical part inspection system
US5994711A (en) * 1997-10-21 1999-11-30 Xerox Corporation Copy substrate edge electronic registration system for a reprographic system
US6313948B1 (en) 1999-08-02 2001-11-06 James I. Hanna Optical beam shaper
US6252661B1 (en) 1999-08-02 2001-06-26 James L. Hanna Optical sub-pixel parts inspection system

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3619626A (en) * 1969-03-17 1971-11-09 United States Steel Corp Digital edge position detector
US3694658A (en) * 1970-10-22 1972-09-26 Morvue Inc Veneer inspection system
DE2200324A1 (de) * 1971-01-08 1972-07-27 Valio Meijerien Eine Vorrichtung zum Feststellen der Breite einer bewegten Materialbahn od.dgl.
GB1379473A (en) * 1972-03-04 1975-01-02 Sensors Inc Inspection methods apparatus and systems
DE2211235C3 (de) * 1972-03-08 1975-04-17 Siemens Ag, 1000 Berlin Und 8000 Muenchen MeBmikroskop mit einer Auswertelogik und einer Anzeigevorrichtung zur fotoelektrischen Messung linearer Größen
DE2220819B2 (de) * 1972-04-27 1978-09-28 Siemens Ag, 1000 Berlin Und 8000 Muenchen Vorrichtung zur Steuerung des Durchmessers eines Halbleiterstabes an der Erstarrungsfront der Schmelzzone beim tiegellosen Zonenschmelzen
SE378302B (it) * 1972-07-03 1975-08-25 Aga Ab
DE2244433A1 (de) * 1972-09-06 1974-03-14 Licentia Gmbh Anordnung zur fotoelektrischen bestimmung der abmessung eines objektes

Also Published As

Publication number Publication date
GB1547186A (en) 1979-06-06
GB1547185A (en) 1979-06-06
LU74728A1 (it) 1977-02-04
NL7603785A (nl) 1976-10-19
BE840835A (fr) 1976-10-15
FR2308085B1 (it) 1981-12-11
FR2308085A1 (fr) 1976-11-12
US4067652A (en) 1978-01-10
DE2516756A1 (de) 1976-10-28

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