IT1162677B - Apparecchio per la analisi di gas - Google Patents

Apparecchio per la analisi di gas

Info

Publication number
IT1162677B
IT1162677B IT50419/79A IT5041979A IT1162677B IT 1162677 B IT1162677 B IT 1162677B IT 50419/79 A IT50419/79 A IT 50419/79A IT 5041979 A IT5041979 A IT 5041979A IT 1162677 B IT1162677 B IT 1162677B
Authority
IT
Italy
Prior art keywords
analysis apparatus
gas analysis
gas
analysis
Prior art date
Application number
IT50419/79A
Other languages
English (en)
Other versions
IT7950419A0 (it
Inventor
William W Bursack
Erik T Tromborg
Original Assignee
Honeywell Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Inc filed Critical Honeywell Inc
Publication of IT7950419A0 publication Critical patent/IT7950419A0/it
Application granted granted Critical
Publication of IT1162677B publication Critical patent/IT1162677B/it

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
IT50419/79A 1978-10-06 1979-10-01 Apparecchio per la analisi di gas IT1162677B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/949,295 US4201913A (en) 1978-10-06 1978-10-06 Sampling system for mass spectrometer

Publications (2)

Publication Number Publication Date
IT7950419A0 IT7950419A0 (it) 1979-10-01
IT1162677B true IT1162677B (it) 1987-04-01

Family

ID=25488866

Family Applications (1)

Application Number Title Priority Date Filing Date
IT50419/79A IT1162677B (it) 1978-10-06 1979-10-01 Apparecchio per la analisi di gas

Country Status (6)

Country Link
US (1) US4201913A (it)
JP (1) JPS5551333A (it)
CA (1) CA1117225A (it)
DE (1) DE2939893A1 (it)
FR (1) FR2438267A1 (it)
IT (1) IT1162677B (it)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2937794C2 (de) * 1979-09-19 1983-02-10 geb. Layher Ruth 7129 Güglingen Langer Keilverbindung für koaxial angeordnete Gerüstrohre
FR2485201A1 (fr) * 1980-06-20 1981-12-24 Rech Geolog Miniere Procede de mesure de grande precision des concentrations de gaz et produits volatils en situ et en continu et appareil in situ en oeuvre
US4583710A (en) * 1982-05-10 1986-04-22 Cornell Research Foundation, Inc. Electromagnetic valve for pulsed molecular beam
US4791291A (en) * 1986-07-14 1988-12-13 The Dow Chemical Company Mass spectrometer sampling system for a liquid stream
US4996423A (en) * 1990-06-04 1991-02-26 Paradygm Science & Technologies, Inc. Chop mode operated mass spectrometer for reducing the effect of line signals
US5355214A (en) * 1990-08-31 1994-10-11 Varian Associates, Inc. Flow control device
US5311016A (en) * 1992-08-21 1994-05-10 The United States Of America As Represented By The United State Department Of Energy Apparatus for preparing a sample for mass spectrometry
US5438205A (en) * 1994-04-08 1995-08-01 National Electrostatics Corp. Ion source gaseous discharge initiation impulse valve
DE29605650U1 (de) * 1996-03-27 1996-07-25 Balzers Prozess Systeme Vertriebs- und Service GmbH, 81245 München Anordnung zum Verbinden eines Tiefdruckeinganges eines Gasanalysegerätes
US6232599B1 (en) * 1998-10-16 2001-05-15 Siemens Aktiengesellschaft Ion pump relay control
US6465776B1 (en) 2000-06-02 2002-10-15 Board Of Regents, The University Of Texas System Mass spectrometer apparatus for analyzing multiple fluid samples concurrently
US6864487B1 (en) 2002-01-21 2005-03-08 Mcmurtry Gary M Environmental sampler for mass spectrometer
JP3530942B2 (ja) * 2002-03-05 2004-05-24 独立行政法人通信総合研究所 分子ビーム発生方法及び装置
GB2411046B (en) * 2004-02-12 2006-10-25 Microsaic Systems Ltd Mass spectrometer system
GB0612503D0 (en) * 2006-06-23 2006-08-02 Micromass Ltd Mass spectrometer
US7552620B2 (en) * 2006-09-07 2009-06-30 3M Innovative Properties Company Fluid permeation testing method employing mass spectrometry
US7555934B2 (en) * 2006-09-07 2009-07-07 3M Innovative Properties Company Fluid permeation testing apparatus employing mass spectrometry
WO2012162036A1 (en) 2011-05-20 2012-11-29 Purdue Research Foundation (Prf) Systems and methods for analyzing a sample
NL2009999C2 (en) * 2012-12-17 2014-06-19 Leiden Probe Microscopy B V Gas analyser and valve assembly for a gas analyser.
JP6547843B2 (ja) * 2015-12-17 2019-07-24 株式会社島津製作所 イオン分析装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3801788A (en) * 1972-11-16 1974-04-02 Midwest Research Inst Mass marking for spectrometry using programmed molecule clusters
US3992626A (en) * 1973-02-23 1976-11-16 Honeywell Inc. Test instrument
US3895231A (en) * 1973-04-30 1975-07-15 Univ Colorado Method and inlet control system for controlling a gas flow sample to an evacuated chamber
US4023398A (en) * 1975-03-03 1977-05-17 John Barry French Apparatus for analyzing trace components

Also Published As

Publication number Publication date
FR2438267A1 (fr) 1980-04-30
FR2438267B1 (it) 1982-02-19
JPS5551333A (en) 1980-04-15
CA1117225A (en) 1982-01-26
US4201913A (en) 1980-05-06
DE2939893A1 (de) 1980-04-17
IT7950419A0 (it) 1979-10-01

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