IT1186005B - Procedimento per fomrare strutture di ordine sub-micronico ad alta risoluzione su un substrato - Google Patents
Procedimento per fomrare strutture di ordine sub-micronico ad alta risoluzione su un substratoInfo
- Publication number
- IT1186005B IT1186005B IT22396/85A IT2239685A IT1186005B IT 1186005 B IT1186005 B IT 1186005B IT 22396/85 A IT22396/85 A IT 22396/85A IT 2239685 A IT2239685 A IT 2239685A IT 1186005 B IT1186005 B IT 1186005B
- Authority
- IT
- Italy
- Prior art keywords
- micronic
- procedure
- substrate
- high resolution
- providing high
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2051—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
- G03F7/2059—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source using a scanning corpuscular radiation beam, e.g. an electron beam
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C8/00—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C8/06—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases
- C23C8/08—Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases only one element being applied
- C23C8/10—Oxidising
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F4/00—Processes for removing metallic material from surfaces, not provided for in group C23F1/00 or C23F3/00
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B11/00—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/10—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using electron beam; Record carriers therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/12—Diffusion of dopants within, into or out of semiconductor bodies or layers between a solid phase and a gaseous phase
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/14—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase
- H10P32/1408—Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase from or through or into an external applied layer, e.g. photoresist or nitride layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
- H10P32/10—Diffusion of dopants within, into or out of semiconductor bodies or layers
- H10P32/17—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material
- H10P32/171—Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material being group IV material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/90—Thermal treatments, e.g. annealing or sintering
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/056—Manufacture or treatment of conductive parts of the interconnections by filling conductive material into holes, grooves or trenches
- H10W20/057—Manufacture or treatment of conductive parts of the interconnections by filling conductive material into holes, grooves or trenches by selectively depositing, e.g. by using selective CVD or plating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6304—Formation by oxidation, e.g. oxidation of the substrate
- H10P14/6314—Formation by oxidation, e.g. oxidation of the substrate of a metallic layer
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6938—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides
- H10P14/6939—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides characterised by the metal
- H10P14/69391—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides characterised by the metal the material containing aluminium, e.g. Al2O3
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/942—Masking
- Y10S438/948—Radiation resist
- Y10S438/949—Energy beam treating radiation resist on semiconductor
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Toxicology (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Plasma & Fusion (AREA)
- Drying Of Semiconductors (AREA)
- Electron Beam Exposure (AREA)
- Formation Of Insulating Films (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/659,490 US4566937A (en) | 1984-10-10 | 1984-10-10 | Electron beam enhanced surface modification for making highly resolved structures |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IT8522396A0 IT8522396A0 (it) | 1985-10-09 |
| IT1186005B true IT1186005B (it) | 1987-11-18 |
Family
ID=24645620
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT22396/85A IT1186005B (it) | 1984-10-10 | 1985-10-09 | Procedimento per fomrare strutture di ordine sub-micronico ad alta risoluzione su un substrato |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4566937A (it) |
| JP (1) | JPS61154031A (it) |
| CA (1) | CA1226376A (it) |
| DE (1) | DE3535890A1 (it) |
| FR (1) | FR2577714B1 (it) |
| GB (1) | GB2165494B (it) |
| IT (1) | IT1186005B (it) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0642456B2 (ja) * | 1984-11-21 | 1994-06-01 | 株式会社日立製作所 | 表面光処理方法 |
| GB2172427A (en) * | 1985-03-13 | 1986-09-17 | Philips Electronic Associated | Semiconductor device manufacture using a deflected ion beam |
| JPS6318541A (ja) * | 1986-07-11 | 1988-01-26 | Hitachi Ltd | 電子線記録再生方法及びその装置 |
| EP0265245A3 (en) * | 1986-10-21 | 1992-07-01 | Matsushita Electric Industrial Co., Ltd. | Method of erasable recording and reading of information |
| US4834834A (en) * | 1987-11-20 | 1989-05-30 | Massachusetts Institute Of Technology | Laser photochemical etching using surface halogenation |
| US5171718A (en) * | 1987-11-27 | 1992-12-15 | Sony Corporation | Method for forming a fine pattern by using a patterned resist layer |
| EP0318037A3 (en) * | 1987-11-27 | 1990-07-25 | Sony Corporation | Method for forming a fine pattern by using a patterned resist layer |
| JP2920922B2 (ja) * | 1988-10-21 | 1999-07-19 | ソニー株式会社 | パターン形成方法 |
| EP0361460A3 (en) * | 1988-09-29 | 1990-08-01 | Sony Corporation | A method for forming a pattern |
| US4983250A (en) * | 1989-06-16 | 1991-01-08 | Microelectronics And Computer Technology | Method of laser patterning an electrical interconnect |
| GB2282480B (en) * | 1990-07-05 | 1995-07-26 | Olivetti Systems & Networks S | Integrated circuit structure analysis |
| US5244538A (en) * | 1991-07-26 | 1993-09-14 | Microelectronics And Computer Technology Corporation | Method of patterning metal on a substrate using direct-write deposition of a mask |
| US5312514A (en) * | 1991-11-07 | 1994-05-17 | Microelectronics And Computer Technology Corporation | Method of making a field emitter device using randomly located nuclei as an etch mask |
| US5382315A (en) * | 1991-02-11 | 1995-01-17 | Microelectronics And Computer Technology Corporation | Method of forming etch mask using particle beam deposition |
| EP0501278B1 (en) * | 1991-02-28 | 1998-09-30 | Texas Instruments Incorporated | Method to produce masking |
| US5399238A (en) * | 1991-11-07 | 1995-03-21 | Microelectronics And Computer Technology Corporation | Method of making field emission tips using physical vapor deposition of random nuclei as etch mask |
| JP2771472B2 (ja) * | 1994-05-16 | 1998-07-02 | 松下電器産業株式会社 | 半導体装置の製造方法 |
| US6652922B1 (en) * | 1995-06-15 | 2003-11-25 | Alliedsignal Inc. | Electron-beam processed films for microelectronics structures |
| US6878417B2 (en) * | 1997-11-12 | 2005-04-12 | John C. Polanyi | Method of molecular-scale pattern imprinting at surfaces |
| TW473834B (en) | 1998-05-01 | 2002-01-21 | Ibm | Method of doping a gate and creating a very shallow source/drain extension and resulting semiconductor |
| US6300622B1 (en) | 1999-01-27 | 2001-10-09 | Gtp, Inc. | Method and device for charged particle ray information storage |
| US6434678B1 (en) | 1999-02-12 | 2002-08-13 | Gtp, Inc. | Method for data storage organization |
| US6251755B1 (en) | 1999-04-22 | 2001-06-26 | International Business Machines Corporation | High resolution dopant/impurity incorporation in semiconductors via a scanned atomic force probe |
| US6730370B1 (en) * | 2000-09-26 | 2004-05-04 | Sveinn Olafsson | Method and apparatus for processing materials by applying a controlled succession of thermal spikes or shockwaves through a growth medium |
| DE10353591A1 (de) * | 2003-11-17 | 2005-06-02 | Infineon Technologies Ag | Verfahren zum lokal begrenzten Ätzen einer Chromschicht |
| US7800014B2 (en) * | 2004-01-09 | 2010-09-21 | General Lasertronics Corporation | Color sensing for laser decoating |
| US7633033B2 (en) * | 2004-01-09 | 2009-12-15 | General Lasertronics Corporation | Color sensing for laser decoating |
| US20060196853A1 (en) * | 2005-03-04 | 2006-09-07 | The Regents Of The University Of California | Micro-joining using electron beams |
| DE102006046503A1 (de) * | 2006-08-18 | 2008-02-21 | Mg-Micro Galva Gmbh | Laseroxidieren von Magnesium-, Titan- oder Aluminiumwerkstoffen |
| US8536483B2 (en) | 2007-03-22 | 2013-09-17 | General Lasertronics Corporation | Methods for stripping and modifying surfaces with laser-induced ablation |
| WO2009005840A1 (en) * | 2007-07-05 | 2009-01-08 | General Lasertronics Corporation | Aperture adapters for laser-based coating removal end-effector |
| US10112257B1 (en) | 2010-07-09 | 2018-10-30 | General Lasertronics Corporation | Coating ablating apparatus with coating removal detection |
| US9895771B2 (en) | 2012-02-28 | 2018-02-20 | General Lasertronics Corporation | Laser ablation for the environmentally beneficial removal of surface coatings |
| US10086597B2 (en) | 2014-01-21 | 2018-10-02 | General Lasertronics Corporation | Laser film debonding method |
| RU2706265C1 (ru) * | 2019-04-02 | 2019-11-15 | Российская Федерация, от имени которой выступает ФОНД ПЕРСПЕКТИВНЫХ ИССЛЕДОВАНИЙ | Способ изготовления массивов регулярных субмикронных металлических структур на оптически прозрачных подложках |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3814975A (en) * | 1969-08-06 | 1974-06-04 | Gen Electric | Electron emission system |
| CH631743A5 (de) * | 1977-06-01 | 1982-08-31 | Balzers Hochvakuum | Verfahren zum aufdampfen von material in einer vakuumaufdampfanlage. |
| US4212082A (en) * | 1978-04-21 | 1980-07-08 | General Electric Company | Method for fabrication of improved storage target and target produced thereby |
| US4213192A (en) * | 1979-01-15 | 1980-07-15 | Christensen Alton O Sr | Electron beam accessed read-write-erase random access memory |
| US4377437A (en) * | 1981-05-22 | 1983-03-22 | Bell Telephone Laboratories, Incorporated | Device lithography by selective ion implantation |
| US4407933A (en) * | 1981-06-11 | 1983-10-04 | Bell Telephone Laboratories, Incorporated | Alignment marks for electron beam lithography |
| US4370195A (en) * | 1982-03-25 | 1983-01-25 | Rca Corporation | Removal of plasma etching residues |
| US4412885A (en) * | 1982-11-03 | 1983-11-01 | Applied Materials, Inc. | Materials and methods for plasma etching of aluminum and aluminum alloys |
| FR2537777A1 (fr) * | 1982-12-10 | 1984-06-15 | Commissariat Energie Atomique | Procede et dispositif d'implantation de particules dans un solide |
| JPS59135730A (ja) * | 1983-01-24 | 1984-08-04 | Hitachi Ltd | 表面改質装置 |
| DD221201A1 (de) * | 1983-12-09 | 1985-04-17 | Univ Magdeburg Tech | Verfahren zur maskenlosen herstellung von kohlenstoffschichten auf substraten |
| US4490211A (en) * | 1984-01-24 | 1984-12-25 | International Business Machines Corporation | Laser induced chemical etching of metals with excimer lasers |
| US4550257A (en) * | 1984-06-29 | 1985-10-29 | International Business Machines Corporation | Narrow line width pattern fabrication |
-
1984
- 1984-10-10 US US06/659,490 patent/US4566937A/en not_active Expired - Fee Related
-
1985
- 1985-09-27 CA CA000491759A patent/CA1226376A/en not_active Expired
- 1985-10-08 DE DE19853535890 patent/DE3535890A1/de not_active Withdrawn
- 1985-10-09 JP JP60225913A patent/JPS61154031A/ja active Pending
- 1985-10-09 IT IT22396/85A patent/IT1186005B/it active
- 1985-10-10 FR FR858515024A patent/FR2577714B1/fr not_active Expired - Lifetime
- 1985-10-10 GB GB08523452A patent/GB2165494B/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| CA1226376A (en) | 1987-09-01 |
| US4566937A (en) | 1986-01-28 |
| FR2577714A1 (fr) | 1986-08-22 |
| DE3535890A1 (de) | 1986-04-10 |
| IT8522396A0 (it) | 1985-10-09 |
| GB2165494A (en) | 1986-04-16 |
| FR2577714B1 (fr) | 1990-10-05 |
| GB8523452D0 (en) | 1985-10-30 |
| GB2165494B (en) | 1987-11-18 |
| JPS61154031A (ja) | 1986-07-12 |
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