IT1223737B - Metodo per il rilevamento di difetti su superfici speculari e dispositivo operante secondo tale metodo - Google Patents

Metodo per il rilevamento di difetti su superfici speculari e dispositivo operante secondo tale metodo

Info

Publication number
IT1223737B
IT1223737B IT67720/88A IT6772088A IT1223737B IT 1223737 B IT1223737 B IT 1223737B IT 67720/88 A IT67720/88 A IT 67720/88A IT 6772088 A IT6772088 A IT 6772088A IT 1223737 B IT1223737 B IT 1223737B
Authority
IT
Italy
Prior art keywords
defects
detection
device operating
operating according
mirror surfaces
Prior art date
Application number
IT67720/88A
Other languages
English (en)
Other versions
IT8867720A0 (it
Inventor
Sergio Damiani
Pier Giorgio Varrone
Original Assignee
Fiat Ricerche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fiat Ricerche filed Critical Fiat Ricerche
Priority to IT67720/88A priority Critical patent/IT1223737B/it
Publication of IT8867720A0 publication Critical patent/IT8867720A0/it
Priority to EP19890113896 priority patent/EP0352797A3/en
Priority to BR898903871A priority patent/BR8903871A/pt
Application granted granted Critical
Publication of IT1223737B publication Critical patent/IT1223737B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N2021/8908—Strip illuminator, e.g. light tube
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT67720/88A 1988-07-29 1988-07-29 Metodo per il rilevamento di difetti su superfici speculari e dispositivo operante secondo tale metodo IT1223737B (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT67720/88A IT1223737B (it) 1988-07-29 1988-07-29 Metodo per il rilevamento di difetti su superfici speculari e dispositivo operante secondo tale metodo
EP19890113896 EP0352797A3 (en) 1988-07-29 1989-07-27 A method for detecting defects on specular surfaces and device operating according to this method
BR898903871A BR8903871A (pt) 1988-07-29 1989-07-27 Metodo para a deteccao de defeitos em superficies espelhadas e dispositivo que opera segundo tal metodo

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT67720/88A IT1223737B (it) 1988-07-29 1988-07-29 Metodo per il rilevamento di difetti su superfici speculari e dispositivo operante secondo tale metodo

Publications (2)

Publication Number Publication Date
IT8867720A0 IT8867720A0 (it) 1988-07-29
IT1223737B true IT1223737B (it) 1990-09-29

Family

ID=11304774

Family Applications (1)

Application Number Title Priority Date Filing Date
IT67720/88A IT1223737B (it) 1988-07-29 1988-07-29 Metodo per il rilevamento di difetti su superfici speculari e dispositivo operante secondo tale metodo

Country Status (3)

Country Link
EP (1) EP0352797A3 (it)
BR (1) BR8903871A (it)
IT (1) IT1223737B (it)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AUPN800796A0 (en) * 1996-02-09 1996-03-07 Unisearch Limited Visual inspection system for leather hide
FR2785990B1 (fr) * 1998-11-17 2003-09-26 Rexam Beaute Metallisation Dispositif de detection de defauts de surface sur des pieces reflechissantes
US9176070B2 (en) * 2014-04-07 2015-11-03 Hseb Dresden Gmbh Inspection assembly
EP3346229B1 (en) * 2017-01-09 2022-03-30 Unity Semiconductor GmbH Method and assembly for determining the thickness of layers in a sample stack

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2133871A (en) * 1982-12-23 1984-08-01 Austin Rover Group Apparatus for a method of inspecting automotive components
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
JPS60198436A (ja) * 1984-03-23 1985-10-07 Hitachi Electronics Eng Co Ltd レ−ザ光を用いた表面検査装置
DE3411578A1 (de) * 1984-03-29 1985-10-10 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zur ermittlung von lackfehlern und vorrichtung zur durchfuehrung des verfahrens

Also Published As

Publication number Publication date
EP0352797A2 (en) 1990-01-31
IT8867720A0 (it) 1988-07-29
BR8903871A (pt) 1990-03-20
EP0352797A3 (en) 1990-09-05

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Legal Events

Date Code Title Description
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19950731