IT1396723B1 - Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo. - Google Patents
Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo.Info
- Publication number
- IT1396723B1 IT1396723B1 ITRM2009A000567A ITRM20090567A IT1396723B1 IT 1396723 B1 IT1396723 B1 IT 1396723B1 IT RM2009A000567 A ITRM2009A000567 A IT RM2009A000567A IT RM20090567 A ITRM20090567 A IT RM20090567A IT 1396723 B1 IT1396723 B1 IT 1396723B1
- Authority
- IT
- Italy
- Prior art keywords
- defects
- examined
- detection
- elements
- particular metallic
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8812—Diffuse illumination, e.g. "sky"
- G01N2021/8816—Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8845—Multiple wavelengths of illumination or detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/909—Investigating the presence of flaws or contamination in a container or its contents in opaque containers or opaque container parts, e.g. cans, tins, caps, labels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06146—Multisources for homogeneisation, as well sequential as simultaneous operation
- G01N2201/06153—Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| ITRM2009A000567A IT1396723B1 (it) | 2009-11-04 | 2009-11-04 | Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo. |
| EP10790679.4A EP2496933B1 (en) | 2009-11-04 | 2010-10-25 | Apparatus, system and method for detecting defects of metallic lids |
| PCT/IT2010/000427 WO2011055397A1 (en) | 2009-11-04 | 2010-10-25 | Apparatus, system and method for detecting defects of metallic lids |
| KR1020127009330A KR101844079B1 (ko) | 2009-11-04 | 2010-10-25 | 금속 뚜껑의 결함을 검출하는 장치, 시스템 그리고 방법 |
| CN201080049544.7A CN102725625B (zh) | 2009-11-04 | 2010-10-25 | 用于检测金属盖的缺陷的设备、系统和方法 |
| US13/508,038 US8792094B2 (en) | 2009-11-04 | 2010-10-25 | Apparatus, system and method for detecting defects of metallic lids |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| ITRM2009A000567A IT1396723B1 (it) | 2009-11-04 | 2009-11-04 | Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| ITRM20090567A1 ITRM20090567A1 (it) | 2011-05-05 |
| IT1396723B1 true IT1396723B1 (it) | 2012-12-14 |
Family
ID=42235580
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ITRM2009A000567A IT1396723B1 (it) | 2009-11-04 | 2009-11-04 | Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo. |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8792094B2 (it) |
| EP (1) | EP2496933B1 (it) |
| KR (1) | KR101844079B1 (it) |
| CN (1) | CN102725625B (it) |
| IT (1) | IT1396723B1 (it) |
| WO (1) | WO2011055397A1 (it) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ITMI20121299A1 (it) * | 2012-07-25 | 2014-01-26 | Mondial Marmi S R L | Apparato per acquisire una pluralita' di immagini superficiali di almeno un corpo e relativo metodo |
| CN103076336A (zh) * | 2012-12-28 | 2013-05-01 | 罗炳军 | 一种物体表面质量检测仪 |
| JP2015055569A (ja) * | 2013-09-12 | 2015-03-23 | 株式会社Ｆｄｋエンジニアリング | 画像外観検査装置 |
| ITBO20150180A1 (it) * | 2015-04-14 | 2016-10-14 | Sacmi Cooperativa Mecc Imola Soc Coop A R L | Apparato e metodo di ispezione ottica di oggetti, in particolare coperchi metallici. |
| ITBO20150203A1 (it) * | 2015-04-21 | 2016-10-21 | Sacmi | Apparato e metodo di ispezione ottica di preforme. |
| DE102015008409A1 (de) * | 2015-07-02 | 2017-01-05 | Eisenmann Se | Anlage zur optischen Überprüfung von Oberflächenbereichen von Gegenständen |
| KR20170046918A (ko) * | 2015-10-22 | 2017-05-04 | (주)테크윙 | 물품 검사용 촬영기 |
| CN105891218A (zh) * | 2016-05-09 | 2016-08-24 | 成都慧信实验设备有限公司 | 检测电子元件表面缺陷的装置 |
| JP6622679B2 (ja) * | 2016-10-26 | 2019-12-18 | 川崎重工業株式会社 | サークルスクラッチ検査装置 |
| IT201800002782A1 (it) * | 2018-02-16 | 2019-08-16 | Salva Daniel Oscar | Sistema di analisi dimensionale di difetti |
| CN109870463B (zh) * | 2019-04-09 | 2020-01-14 | 深圳市阿赛姆电子有限公司 | 一种电子芯片故障检测装置 |
| US11282187B2 (en) | 2019-08-19 | 2022-03-22 | Ricoh Company, Ltd. | Inspection system, inspection apparatus, and method using multiple angle illumination |
| CN112540454B (zh) * | 2020-11-11 | 2022-08-02 | 中国航发贵州黎阳航空动力有限公司 | 一种晶粒取向成像图的获取方法 |
| CN114264658B (zh) * | 2021-03-12 | 2024-01-26 | 青岛昇瑞光电科技有限公司 | Led芯片检测装置及设备 |
| CN113390890A (zh) * | 2021-06-18 | 2021-09-14 | 杭州思元智能科技有限公司 | 一种基于多角度光路照明的电子元件外观检测装置 |
| DE102021210370A1 (de) * | 2021-09-17 | 2023-03-23 | QUISS Qualitäts-Inspektionssysteme und Service GmbH | Vorrichtung und Verfahren zum automatischen Überwachen von Getränke- und Lebensmitteldosen-Deckeln |
| IT202200006344A1 (it) | 2022-03-31 | 2023-10-01 | Antares Vision S P A | Sistema di ispezione di oggetti |
| CN115954291B (zh) * | 2023-03-04 | 2023-11-14 | 天合光能(宿迁)光电有限公司 | 一种TOPCon结构光伏电池板的裂纹监测系统 |
| IT202300020598A1 (it) | 2023-10-04 | 2025-04-04 | Antares Vision S P A | Sistema perfezionato per l’ispezione di oggetti |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0498811B1 (en) * | 1989-08-15 | 1997-04-09 | Pressco Technology Inc. | Engineered video inspection lighting array |
| US5365084A (en) | 1991-02-20 | 1994-11-15 | Pressco Technology, Inc. | Video inspection system employing multiple spectrum LED illumination |
| US5461417A (en) * | 1993-02-16 | 1995-10-24 | Northeast Robotics, Inc. | Continuous diffuse illumination method and apparatus |
| JPH11295047A (ja) * | 1998-04-06 | 1999-10-29 | Omron Corp | 照明装置 |
| EP1455179A1 (en) * | 2003-03-07 | 2004-09-08 | MV Research Limited | A machine vision inspection system and method |
| JP4139743B2 (ja) * | 2003-06-12 | 2008-08-27 | 日本軽金属株式会社 | アルミニウムにおける非金属介在物の測定装置 |
| DE102004034160A1 (de) | 2004-07-15 | 2006-02-09 | Byk Gardner Gmbh | Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften |
| CN2867100Y (zh) * | 2005-07-13 | 2007-02-07 | 王锦峰 | 在线光源发生装置 |
| JP2008216180A (ja) | 2007-03-07 | 2008-09-18 | Omron Corp | 表面状態検査方法および表面状態検査装置 |
| JP2009192544A (ja) | 2009-06-01 | 2009-08-27 | Hitachi Chem Co Ltd | 分光装置及び全反射ラマン分光装置 |
-
2009
- 2009-11-04 IT ITRM2009A000567A patent/IT1396723B1/it active
-
2010
- 2010-10-25 WO PCT/IT2010/000427 patent/WO2011055397A1/en not_active Ceased
- 2010-10-25 CN CN201080049544.7A patent/CN102725625B/zh not_active Expired - Fee Related
- 2010-10-25 US US13/508,038 patent/US8792094B2/en active Active
- 2010-10-25 EP EP10790679.4A patent/EP2496933B1/en active Active
- 2010-10-25 KR KR1020127009330A patent/KR101844079B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP2496933B1 (en) | 2020-02-19 |
| CN102725625B (zh) | 2015-05-06 |
| ITRM20090567A1 (it) | 2011-05-05 |
| EP2496933A1 (en) | 2012-09-12 |
| US20120268733A1 (en) | 2012-10-25 |
| KR101844079B1 (ko) | 2018-05-14 |
| WO2011055397A1 (en) | 2011-05-12 |
| US8792094B2 (en) | 2014-07-29 |
| WO2011055397A4 (en) | 2011-06-30 |
| KR20120109473A (ko) | 2012-10-08 |
| CN102725625A (zh) | 2012-10-10 |
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