IT7848042A0 - Apparecchio e procedimento per la determinazione interferometrica di deformazioni - Google Patents

Apparecchio e procedimento per la determinazione interferometrica di deformazioni

Info

Publication number
IT7848042A0
IT7848042A0 IT7848042A IT4804278A IT7848042A0 IT 7848042 A0 IT7848042 A0 IT 7848042A0 IT 7848042 A IT7848042 A IT 7848042A IT 4804278 A IT4804278 A IT 4804278A IT 7848042 A0 IT7848042 A0 IT 7848042A0
Authority
IT
Italy
Prior art keywords
deformations
procedure
interferometric determination
interferometric
determination
Prior art date
Application number
IT7848042A
Other languages
English (en)
Other versions
IT1102269B (it
Original Assignee
Ralph M Grant Engineering Cons
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ralph M Grant Engineering Cons filed Critical Ralph M Grant Engineering Cons
Publication of IT7848042A0 publication Critical patent/IT7848042A0/it
Application granted granted Critical
Publication of IT1102269B publication Critical patent/IT1102269B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
IT48042/78A 1977-02-17 1978-02-14 Apparecchio e procedimento per la determinazione interferometrica di deformazioni IT1102269B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/769,422 US4139302A (en) 1977-02-17 1977-02-17 Method and apparatus for interferometric deformation analysis

Publications (2)

Publication Number Publication Date
IT7848042A0 true IT7848042A0 (it) 1978-02-14
IT1102269B IT1102269B (it) 1985-10-07

Family

ID=25085394

Family Applications (1)

Application Number Title Priority Date Filing Date
IT48042/78A IT1102269B (it) 1977-02-17 1978-02-14 Apparecchio e procedimento per la determinazione interferometrica di deformazioni

Country Status (7)

Country Link
US (1) US4139302A (it)
JP (1) JPS53102775A (it)
CA (1) CA1112921A (it)
DE (1) DE2806845A1 (it)
FR (1) FR2381280A1 (it)
GB (1) GB1600955A (it)
IT (1) IT1102269B (it)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4392745A (en) * 1981-04-06 1983-07-12 Industrial Holographics, Inc. Tilt head camera for interferometric analysis of tires
US4682892A (en) * 1982-08-13 1987-07-28 The Goodyear Tire & Rubber Company Method and apparatus for speckle-shearing interferometric deformation analysis
US4702594A (en) * 1982-11-15 1987-10-27 Industrial Holographics, Inc. Double exposure interferometric analysis of structures and employing ambient pressure stressing
DE3303876A1 (de) * 1983-02-05 1984-08-09 M.A.N. Maschinenfabrik Augsburg-Nürnberg AG, 8000 München Holografisches differenzverfahren
US4887899A (en) * 1987-12-07 1989-12-19 Hung Yau Y Apparatus and method for electronic analysis of test objects
US5011280A (en) * 1987-12-07 1991-04-30 Hung Yau Y Method of measuring displacement between points on a test object
US5004345A (en) * 1988-12-05 1991-04-02 Hung Yau Y Dual-lens shearing interferometer
US4890914A (en) * 1989-01-11 1990-01-02 The United States Of America As Represented By The Secretary Of The Army Hybrid lens apparatus used for shearographic analysis
US4969106A (en) * 1989-02-27 1990-11-06 Camsys, Inc. Computerized method of determining surface strain distributions in a deformed body
US5121286A (en) * 1989-05-04 1992-06-09 Collins Nelson H Air ionizing cell
US5094528A (en) * 1990-05-25 1992-03-10 Laser Technology, Inc. Apparatus and method for performing electronic shearography
DE4036120C2 (de) * 1990-11-13 1994-06-23 Steinbichler Hans Verfahren zur Bestimmung der Wegänderung von Strahlen, insbesondere von Lichtstrahlen, und Vorrichtung zur Durchführung des Verfahrens
CA2098852A1 (en) * 1990-12-20 1992-06-21 John Patrick Baird Structural examination using holographic interferometry
US5121148A (en) * 1991-01-09 1992-06-09 Grant Engineering, Incorporated Single lens reflex camera
US5097516A (en) * 1991-02-28 1992-03-17 At&T Bell Laboratories Technique for illuminating a surface with a gradient intensity line of light to achieve enhanced two-dimensional imaging
US5414512A (en) * 1993-03-10 1995-05-09 Grant Engineering, Inc. Method and apparatus for viewing a shearographic image
US5528370A (en) * 1993-06-09 1996-06-18 The Perkin-Elmer Corporation Apparatus and method for measuring variations in thickness of an optical interference element
US5432595A (en) * 1993-07-13 1995-07-11 Pechersky; Martin J. Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison
US5786533A (en) * 1996-04-17 1998-07-28 Michelin North America, Inc. Method for analyzing a separation in a deformable structure
US6043870A (en) * 1996-07-01 2000-03-28 Cybernet Systems Corporation Compact fiber optic electronic laser speckle pattern interferometer
US6040900A (en) * 1996-07-01 2000-03-21 Cybernet Systems Corporation Compact fiber-optic electronic laser speckle pattern shearography
US6094260A (en) * 1998-08-12 2000-07-25 General Electric Company Holographic interferometry for monitoring and controlling laser shock peening
US5948293A (en) * 1998-12-03 1999-09-07 General Electric Company Laser shock peening quality assurance by volumetric analysis of laser shock peened dimple
DE19856400B4 (de) * 1998-12-07 2009-04-09 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur direkten Phasenmessung von Strahlung
EP1099947A3 (en) * 1999-11-12 2003-01-29 Laser Technology Inc. Apparatus and method for performing optical tyre testing
DE60111151T2 (de) * 2001-07-13 2005-10-20 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Prüfanordnung für optische Vorrichtungen
DE10245085A1 (de) * 2002-09-27 2004-04-01 Automotive Distance Control Systems Gmbh Optisches System für eine Kamera
DE10261323B3 (de) * 2002-12-27 2004-10-07 Infineon Technologies Ag Vorrichtung und Verfahren zur Bestimmung struktureller und/oder geometrischer Eigenschaften eines Maskenblanks
DE10319099B4 (de) 2003-04-28 2005-09-08 Steinbichler Optotechnik Gmbh Verfahren zur Interferenzmessung eines Objektes, insbesondere eines Reifens
DE10336347A1 (de) * 2003-08-08 2005-03-03 Bayerische Motoren Werke Ag Verfahren, Vorrichtung und Rad zur Untersuchung von Reifen
DE102004047624A1 (de) * 2004-09-30 2006-04-20 Infineon Technologies Ag Verfahren zur Korrektur der Überdeckungsgenauigkeit bei der photolithographischen Strukturierung eines Halbleiterwafers
US7956988B1 (en) 2007-02-06 2011-06-07 Alpha Technology, LLC Light detection and ranging systems and related methods
CN101033949B (zh) * 2007-04-27 2010-05-26 清华大学 一种基于错位相关原理的物体应变测量方法及装置
US7911618B2 (en) * 2007-05-17 2011-03-22 Enerize Corporation Holographic interferometry for non-destructive testing of power sources
DE102007037726B4 (de) * 2007-08-09 2010-07-08 Lavision Gmbh Verfahren zur berührungslosen Messung von Verformungen einer Oberfläche eines Messobjektes
US8875579B2 (en) 2012-03-26 2014-11-04 GM Global Technology Operations LLC Method and apparatus for non-destructive weld testing
US20150015889A1 (en) * 2013-07-15 2015-01-15 Michael J. Berman Apparatus and method to improve coatings of a moving surface
US9597839B2 (en) 2015-06-16 2017-03-21 Xerox Corporation System for adjusting operation of a printer during three-dimensional object printing to compensate for errors in object formation
US10656078B2 (en) * 2016-02-17 2020-05-19 Ev Group E. Thallner Gmbh Metrology device and metrology method
US10488176B2 (en) * 2016-06-17 2019-11-26 Corning Incorporated Edge registration for interferometry
JP7362382B2 (ja) 2019-09-17 2023-10-17 キヤノン株式会社 現像剤補給カートリッジ、トナー搬送装置、及び画像形成装置
CN121207062B (zh) * 2025-10-24 2026-03-10 盐城奥凯明通阀门有限公司 硬密封平板闸阀密封面微变形激光干涉在线检测系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3545259A (en) * 1967-06-19 1970-12-08 G C Optronics Inc Holographic method of determining properties of materials
US3860346A (en) * 1970-02-18 1975-01-14 Gco Method of compensating for gross object motion in real time holographic interferometry
US3767308A (en) * 1972-01-12 1973-10-23 Gen Electric Method and apparatus for sensing surface displacement orthogonal to the line of sight

Also Published As

Publication number Publication date
DE2806845C2 (it) 1992-06-17
US4139302A (en) 1979-02-13
JPS53102775A (en) 1978-09-07
FR2381280A1 (fr) 1978-09-15
FR2381280B1 (it) 1984-02-24
GB1600955A (en) 1981-10-21
DE2806845A1 (de) 1978-09-07
JPS647322B2 (it) 1989-02-08
CA1112921A (en) 1981-11-24
IT1102269B (it) 1985-10-07

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TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19940225