IT8467457A1 - Procedimento ed apparecchiatura per determinare la presenza di discontinuità in un elemento conduttore associato ad una lastra di vetro, mediante rivelazione di un campo magnetico. - Google Patents

Procedimento ed apparecchiatura per determinare la presenza di discontinuità in un elemento conduttore associato ad una lastra di vetro, mediante rivelazione di un campo magnetico.

Info

Publication number
IT8467457A1
IT8467457A1 IT1984A67457A IT6745784A IT8467457A1 IT 8467457 A1 IT8467457 A1 IT 8467457A1 IT 1984A67457 A IT1984A67457 A IT 1984A67457A IT 6745784 A IT6745784 A IT 6745784A IT 8467457 A1 IT8467457 A1 IT 8467457A1
Authority
IT
Italy
Prior art keywords
discontinuity
detecting
determining
magnetic field
glass plate
Prior art date
Application number
IT1984A67457A
Other languages
English (en)
Other versions
IT8467457A0 (it
IT1179641B (it
Original Assignee
Ppg Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ppg Industries Inc filed Critical Ppg Industries Inc
Publication of IT8467457A0 publication Critical patent/IT8467457A0/it
Publication of IT8467457A1 publication Critical patent/IT8467457A1/it
Application granted granted Critical
Publication of IT1179641B publication Critical patent/IT1179641B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measuring Magnetic Variables (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
IT67457/84A 1983-05-05 1984-05-04 Procedimento ed apparecchiatura per determinare la presenza di discontinuita in un elemento conduttore associato ad una lastra di vetro mediante rivelazione di un campo magnetico IT1179641B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/491,683 US4542333A (en) 1983-05-05 1983-05-05 Method and apparatus utilizing magnetic field sensing for detecting discontinuities in a conductor member associated with a glass sheet

Publications (3)

Publication Number Publication Date
IT8467457A0 IT8467457A0 (it) 1984-05-04
IT8467457A1 true IT8467457A1 (it) 1985-11-04
IT1179641B IT1179641B (it) 1987-09-16

Family

ID=23953216

Family Applications (1)

Application Number Title Priority Date Filing Date
IT67457/84A IT1179641B (it) 1983-05-05 1984-05-04 Procedimento ed apparecchiatura per determinare la presenza di discontinuita in un elemento conduttore associato ad una lastra di vetro mediante rivelazione di un campo magnetico

Country Status (4)

Country Link
US (1) US4542333A (it)
CA (1) CA1210451A (it)
FR (1) FR2545611B1 (it)
IT (1) IT1179641B (it)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0290522B1 (de) * 1986-11-24 1991-03-27 Lasarray Holding Ag Vorrichtung zur erzeugung und detektion von magnetischen materialstrukturen im bereich atomarer dimensionen
US4849690A (en) * 1987-10-30 1989-07-18 Westinghouse Electric Corp. Detection of transposition group short circuits in machine windings
US4894514A (en) * 1988-07-05 1990-01-16 Ppg Industries, Inc. Heated transparency with malfunction detection means
US5073754A (en) * 1990-07-24 1991-12-17 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array using a magnetic field sensor
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
DE4120653C1 (it) * 1991-06-22 1993-01-28 Vegla Vereinigte Glaswerke Gmbh, 5100 Aachen, De
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5465052A (en) * 1991-09-10 1995-11-07 Photon Dynamics, Inc. Method of testing liquid crystal display substrates
US5504438A (en) * 1991-09-10 1996-04-02 Photon Dynamics, Inc. Testing method for imaging defects in a liquid crystal display substrate
US5459409A (en) * 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
US5444385A (en) * 1991-09-10 1995-08-22 Photon Dynamics, Inc. Testing apparatus for liquid crystal display substrates
US5406213A (en) * 1991-09-10 1995-04-11 Photon Dynamics, Inc. Instrument for testing liquid crystal display base plates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
KR100766913B1 (ko) * 1997-07-30 2007-10-16 캐논 가부시끼가이샤 평판 구조체에서의 자기 전류검지 및 단락회로 검출 방법및 장치
US6118279A (en) 1997-07-30 2000-09-12 Candescent Technologies Corporation Magnetic detection of short circuit defects in plate structure
US6107806A (en) 1997-07-30 2000-08-22 Candescent Technologies Corporation Device for magnetically sensing current in plate structure
JP3285568B2 (ja) * 1999-05-24 2002-05-27 日本電産リード株式会社 基板の配線検査装置および配線検査方法
US6288552B1 (en) 1999-10-29 2001-09-11 Daimlerchrysler Corporation GMR sensor tester for heated window grids
US9523729B2 (en) * 2013-09-13 2016-12-20 Infineon Technologies Ag Apparatus and method for testing electric conductors
JP6138659B2 (ja) * 2013-10-21 2017-05-31 日置電機株式会社 回路基板検査装置
DE102015108233A1 (de) * 2015-05-26 2016-12-01 Rheinisch-Westfälische Technische Hochschule (Rwth) Aachen Verfahren und Vorrichtung zur Identifikation von fehlerhaften Leitern
JP6618826B2 (ja) * 2016-02-24 2019-12-11 日置電機株式会社 回路基板検査装置
CN109491319B (zh) * 2019-01-22 2023-11-28 蓝思智能机器人(长沙)有限公司 玻璃面板检测方法及玻璃面板取料检测装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1521169A (fr) * 1967-04-28 1968-04-12 Schloemann Ag Procédé de chargement de dispositifs de contrôle de l'état de surfaces de laminés et appareillage pour la mise en oeuvre de ce procédé
US3590371A (en) * 1969-12-31 1971-06-29 Ppg Industries Inc A method utilizing the color change with temperature of a material for detecting discontinuities in a conductor member embedded within a windshield
US4362991A (en) * 1980-12-12 1982-12-07 Burroughs Corporation Integrated circuit test probe assembly
US4395677A (en) * 1981-02-13 1983-07-26 Chrysler Corporation Hall Effect tester for heated window grids

Also Published As

Publication number Publication date
FR2545611B1 (fr) 1988-10-14
CA1210451A (en) 1986-08-26
IT8467457A0 (it) 1984-05-04
FR2545611A1 (fr) 1984-11-09
US4542333A (en) 1985-09-17
IT1179641B (it) 1987-09-16

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Legal Events

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TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19970528