ITMI912445A1 - Sistema di visione ad alta risoluzione per il controllo di pezzi - Google Patents

Sistema di visione ad alta risoluzione per il controllo di pezzi

Info

Publication number
ITMI912445A1
ITMI912445A1 IT002445A ITMI912445A ITMI912445A1 IT MI912445 A1 ITMI912445 A1 IT MI912445A1 IT 002445 A IT002445 A IT 002445A IT MI912445 A ITMI912445 A IT MI912445A IT MI912445 A1 ITMI912445 A1 IT MI912445A1
Authority
IT
Italy
Prior art keywords
high resolution
vision system
piece control
resolution vision
piece
Prior art date
Application number
IT002445A
Other languages
English (en)
Inventor
Randy K Baird
James P Martin
Stanley P Turcheck Jr
Original Assignee
Fmc Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fmc Corp filed Critical Fmc Corp
Publication of ITMI912445A0 publication Critical patent/ITMI912445A0/it
Publication of ITMI912445A1 publication Critical patent/ITMI912445A1/it
Application granted granted Critical
Publication of IT1251478B publication Critical patent/IT1251478B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
ITMI912445A 1990-09-17 1991-09-17 Sistema di visione ad alta risoluzione per il controllo di pezzi IT1251478B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/583,256 US5103304A (en) 1990-09-17 1990-09-17 High-resolution vision system for part inspection

Publications (3)

Publication Number Publication Date
ITMI912445A0 ITMI912445A0 (it) 1991-09-17
ITMI912445A1 true ITMI912445A1 (it) 1993-03-17
IT1251478B IT1251478B (it) 1995-05-15

Family

ID=24332341

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI912445A IT1251478B (it) 1990-09-17 1991-09-17 Sistema di visione ad alta risoluzione per il controllo di pezzi

Country Status (9)

Country Link
US (1) US5103304A (it)
JP (1) JPH04305774A (it)
AU (1) AU644466B2 (it)
CA (1) CA2050568A1 (it)
CH (1) CH682984A5 (it)
DE (1) DE4128753A1 (it)
ES (1) ES2035793B1 (it)
FR (1) FR2666883B1 (it)
IT (1) IT1251478B (it)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU645123B2 (en) * 1990-09-24 1994-01-06 Fmc Corporation Automatic windowing for article recognition
IL99823A0 (en) * 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
US5287293A (en) * 1990-12-31 1994-02-15 Industrial Technology Research Institute Method and apparatus for inspecting the contours of a gear
US5954583A (en) * 1992-11-05 1999-09-21 Com21 Limited Secure access control system
US5732147A (en) * 1995-06-07 1998-03-24 Agri-Tech, Inc. Defective object inspection and separation system using image analysis and curvature transformation
DE19713521B4 (de) * 1997-04-02 2004-09-23 Festo Ag & Co Vorrichtung zur Erkennung falsch orientierter und/oder von einem vorgegebenen Muster abweichender Teile
US6330354B1 (en) 1997-05-01 2001-12-11 International Business Machines Corporation Method of analyzing visual inspection image data to find defects on a device
KR100533758B1 (ko) * 2003-02-25 2005-12-06 엘에스전선 주식회사 광소자 영상획득 유닛 배열을 이용한 영상정보 획득 장치
CN110940270B (zh) * 2019-10-30 2022-04-12 深圳市凯中精密技术股份有限公司 一种连接器pin针位置度的检测方法及检测装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4457434A (en) * 1982-02-01 1984-07-03 Fmc Corporation Apparatus for orienting, singulating and sizing mushrooms and like objects
US4608709A (en) * 1983-03-08 1986-08-26 Owens-Illinois, Inc. Method and apparatus for gauging containers
JPS60263807A (ja) * 1984-06-12 1985-12-27 Dainippon Screen Mfg Co Ltd プリント配線板のパタ−ン欠陥検査装置
US4619356A (en) * 1984-08-15 1986-10-28 Fmc Corporation Programmable parts feeder
GB2175396B (en) * 1985-05-22 1989-06-28 Filler Protection Developments Apparatus for examining objects
US4707734A (en) * 1985-06-17 1987-11-17 The Perkin-Elmer Corporation Coarse flaw detector for printed circuit board inspection
US4678920A (en) * 1985-06-17 1987-07-07 General Motors Corporation Machine vision method and apparatus
JPS62173731A (ja) * 1986-01-28 1987-07-30 Toshiba Corp 被検査物の表面検査装置
US4784493A (en) * 1986-06-11 1988-11-15 Fmc Corporation Element recognition and orientation
US4711579A (en) * 1986-08-12 1987-12-08 H. Fred Johnston System for automatically inspecting a flat workpiece for holes
JPH0671038B2 (ja) * 1987-03-31 1994-09-07 株式会社東芝 結晶欠陥認識処理方法
JP2512871B2 (ja) * 1987-04-23 1996-07-03 株式会社ニコン パタ−ン測定装置
US4845558A (en) * 1987-12-03 1989-07-04 Kla Instruments Corporation Method and apparatus for detecting defects in repeated microminiature patterns
GB8809455D0 (en) * 1988-04-21 1988-05-25 Bp Chem Int Ltd Ruminant animal feedstuffs
JPH0276081A (ja) * 1988-09-13 1990-03-15 Yokogawa Electric Corp パターン検査装置

Also Published As

Publication number Publication date
CA2050568A1 (en) 1992-03-18
AU644466B2 (en) 1993-12-09
JPH04305774A (ja) 1992-10-28
ES2035793B1 (es) 1994-04-16
FR2666883A1 (fr) 1992-03-20
FR2666883B1 (fr) 1995-11-17
ITMI912445A0 (it) 1991-09-17
AU8244091A (en) 1992-03-19
US5103304A (en) 1992-04-07
CH682984A5 (de) 1993-12-31
ES2035793A1 (es) 1993-04-16
DE4128753A1 (de) 1992-03-19
IT1251478B (it) 1995-05-15

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Legal Events

Date Code Title Description
0001 Granted
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19950929