ITPI20060067A1 - Sistema per il controllo della bisellatura di un oggetto piano - Google Patents

Sistema per il controllo della bisellatura di un oggetto piano

Info

Publication number
ITPI20060067A1
ITPI20060067A1 ITPI20060067A ITPI20060067A1 IT PI20060067 A1 ITPI20060067 A1 IT PI20060067A1 IT PI20060067 A ITPI20060067 A IT PI20060067A IT PI20060067 A1 ITPI20060067 A1 IT PI20060067A1
Authority
IT
Italy
Prior art keywords
bevel
checking
piano object
piano
Prior art date
Application number
Other languages
English (en)
Inventor
Roberto Giovannelli
Giuseppe Marazzi
Original Assignee
Examina Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Examina Spa filed Critical Examina Spa
Priority to ITPI20060067 priority Critical patent/ITPI20060067A1/it
Priority to PCT/IT2007/000397 priority patent/WO2007141820A1/en
Publication of ITPI20060067A1 publication Critical patent/ITPI20060067A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
ITPI20060067 2006-06-06 2006-06-06 Sistema per il controllo della bisellatura di un oggetto piano ITPI20060067A1 (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ITPI20060067 ITPI20060067A1 (it) 2006-06-06 2006-06-06 Sistema per il controllo della bisellatura di un oggetto piano
PCT/IT2007/000397 WO2007141820A1 (en) 2006-06-06 2007-06-05 A device and a method for controlling the chamfering of a plane object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITPI20060067 ITPI20060067A1 (it) 2006-06-06 2006-06-06 Sistema per il controllo della bisellatura di un oggetto piano

Publications (1)

Publication Number Publication Date
ITPI20060067A1 true ITPI20060067A1 (it) 2007-12-07

Family

ID=38535391

Family Applications (1)

Application Number Title Priority Date Filing Date
ITPI20060067 ITPI20060067A1 (it) 2006-06-06 2006-06-06 Sistema per il controllo della bisellatura di un oggetto piano

Country Status (2)

Country Link
IT (1) ITPI20060067A1 (it)
WO (1) WO2007141820A1 (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI629132B (zh) * 2013-02-13 2018-07-11 日商住友化學股份有限公司 光學部件貼合體之製造裝置
JP6654813B2 (ja) * 2015-06-02 2020-02-26 川崎重工業株式会社 面取り加工装置および面取り加工方法
CN106705883B (zh) * 2016-12-29 2019-12-31 苏州逸美德科技有限公司 一种圆孔倒角弧度测量装置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0195161B1 (en) * 1985-03-14 1993-09-15 Nikon Corporation Apparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like and method
US4872757A (en) * 1988-04-20 1989-10-10 Ball Corporation Optical convex surface profiling and gauging apparatus and method therefor
JP2000084811A (ja) * 1998-09-16 2000-03-28 Tokyo Seimitsu Co Ltd ウェーハ面取り装置
US6792140B2 (en) * 2001-04-26 2004-09-14 Mitsubish Electric Research Laboratories, Inc. Image-based 3D digitizer
GB0319677D0 (en) * 2003-08-21 2003-09-24 Canon Res Ct Europ Ltd Photographic apparatus for use in creating three-dimensional models

Also Published As

Publication number Publication date
WO2007141820A1 (en) 2007-12-13

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