ITTO20000527A0 - Procedimento per il modellamento elettromagnetico di componenti e sistemi elettronici. - Google Patents

Procedimento per il modellamento elettromagnetico di componenti e sistemi elettronici.

Info

Publication number
ITTO20000527A0
ITTO20000527A0 IT2000TO000527A ITTO20000527A ITTO20000527A0 IT TO20000527 A0 ITTO20000527 A0 IT TO20000527A0 IT 2000TO000527 A IT2000TO000527 A IT 2000TO000527A IT TO20000527 A ITTO20000527 A IT TO20000527A IT TO20000527 A0 ITTO20000527 A0 IT TO20000527A0
Authority
IT
Italy
Prior art keywords
procedure
systems
electronic components
electromagnetic modeling
modeling
Prior art date
Application number
IT2000TO000527A
Other languages
English (en)
Inventor
Giovanni Ghigo
Piero Belforte
Flavio Maggioni
Original Assignee
Cselt Ct Studi E Lab T Lecomun
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cselt Ct Studi E Lab T Lecomun filed Critical Cselt Ct Studi E Lab T Lecomun
Priority to IT2000TO000527A priority Critical patent/IT1320393B1/it
Publication of ITTO20000527A0 publication Critical patent/ITTO20000527A0/it
Priority to EP01956451A priority patent/EP1287368A2/en
Priority to CA002411349A priority patent/CA2411349A1/en
Priority to PCT/EP2001/006176 priority patent/WO2001094958A2/en
Priority to US10/297,634 priority patent/US20050177328A1/en
Publication of ITTO20000527A1 publication Critical patent/ITTO20000527A1/it
Application granted granted Critical
Publication of IT1320393B1 publication Critical patent/IT1320393B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Filters And Equalizers (AREA)
IT2000TO000527A 2000-06-05 2000-06-05 Procedimento per il modellamento elettromagnetico di componenti esistemi elettronici. IT1320393B1 (it)

Priority Applications (5)

Application Number Priority Date Filing Date Title
IT2000TO000527A IT1320393B1 (it) 2000-06-05 2000-06-05 Procedimento per il modellamento elettromagnetico di componenti esistemi elettronici.
EP01956451A EP1287368A2 (en) 2000-06-05 2001-05-31 Process for the electromagnetic modelling of electronic components and systems
CA002411349A CA2411349A1 (en) 2000-06-05 2001-05-31 Process for the electromagnetic modelling of electronic components and systems
PCT/EP2001/006176 WO2001094958A2 (en) 2000-06-05 2001-05-31 Process for the electromagnetic modelling of electronic components and systems
US10/297,634 US20050177328A1 (en) 2000-06-05 2001-05-31 Process for the electromagnetic modelling of electronic components and systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT2000TO000527A IT1320393B1 (it) 2000-06-05 2000-06-05 Procedimento per il modellamento elettromagnetico di componenti esistemi elettronici.

Publications (3)

Publication Number Publication Date
ITTO20000527A0 true ITTO20000527A0 (it) 2000-06-05
ITTO20000527A1 ITTO20000527A1 (it) 2001-12-05
IT1320393B1 IT1320393B1 (it) 2003-11-26

Family

ID=11457783

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2000TO000527A IT1320393B1 (it) 2000-06-05 2000-06-05 Procedimento per il modellamento elettromagnetico di componenti esistemi elettronici.

Country Status (5)

Country Link
US (1) US20050177328A1 (it)
EP (1) EP1287368A2 (it)
CA (1) CA2411349A1 (it)
IT (1) IT1320393B1 (it)
WO (1) WO2001094958A2 (it)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040254775A1 (en) * 2003-06-13 2004-12-16 Arpad Muranyi Method and apparatus to characterize an electronic device
US20050267765A1 (en) * 2004-05-26 2005-12-01 Jun-Jang Jeng Apparatus and method for policy-driven business process exception handling
US7844408B2 (en) * 2007-10-19 2010-11-30 Nvidia Corporation System and method for time domain reflectometry testing
CN101685124B (zh) * 2008-09-22 2014-01-01 北京航空航天大学 直升机线缆布局电磁兼容快速检测平台
US10628624B1 (en) * 2018-08-14 2020-04-21 Cadence Design Systems, Inc. System and method for simulating channels using true strobe timing
CN110672981A (zh) * 2019-10-28 2020-01-10 东南大学 一种基于mmc的直流配电网故障测距方法
CN116359659B (zh) * 2023-05-31 2023-07-28 北京煜邦电力技术股份有限公司 一种基于载波通信单元的便携式电磁兼容测试设备及其测试方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5543264A (en) * 1990-06-29 1996-08-06 Associated Universities, Inc. Co-factor activated recombinant adenovirus proteinases
US5321365A (en) * 1993-03-03 1994-06-14 Tektronix, Inc. Reduced noise sensitivity in inverse scattering through filtering
US5550139A (en) * 1994-01-03 1996-08-27 The Wichita State University Serine protease inhibitors
US6159748A (en) * 1995-03-13 2000-12-12 Affinitech, Ltd Evaluation of autoimmune diseases using a multiple parameter latex bead suspension and flow cytometry
US5889789A (en) * 1995-06-30 1999-03-30 Nec Coporation Fault mode estimating system using abnormal current and V-I characteristics
US5621312A (en) * 1995-07-05 1997-04-15 Altera Corporation Method and apparatus for checking the integrity of a device tester-handler setup
CA2224666C (en) * 1995-07-21 2008-11-18 University Of Nebraska Board Of Regents Assay methods and kits for diagnosing autoimmune disease
US5847573A (en) * 1995-10-13 1998-12-08 Massachusetts Technological Laboratory, Inc. Method and apparatus for structure characterization of layered semiconductors
US6033915A (en) * 1996-10-18 2000-03-07 University Of Florida Materials and method for the detection and treatment of Wegener's granulomatosis
US6226599B1 (en) * 1997-03-05 2001-05-01 Fujitsu Limted Electromagnetic wave analyzer apparatus
JPH1115814A (ja) * 1997-06-26 1999-01-22 Fujitsu Ltd モーメント法を用いたシミュレーション装置及び方法並びにプログラム記憶媒体
JP3633765B2 (ja) * 1997-11-19 2005-03-30 富士通株式会社 シミュレーション装置及びシミュレーションプログラムを記録したコンピュータ読み取り可能な記録媒体
US6144894A (en) * 1998-02-13 2000-11-07 Applied Materials, Inc. Method of activating a magnetron generator within a remote plasma source of a semiconductor wafer processing system
US6532439B2 (en) * 1998-06-18 2003-03-11 Sun Microsystems, Inc. Method for determining the desired decoupling components for power distribution systems
US6294648B1 (en) * 1999-07-20 2001-09-25 Bayer Corporation Protein having proteinase inhibitor activity
US6180607B1 (en) * 1999-08-05 2001-01-30 Christopher Davies Protein having proteinase inhibitor activity

Also Published As

Publication number Publication date
ITTO20000527A1 (it) 2001-12-05
EP1287368A2 (en) 2003-03-05
IT1320393B1 (it) 2003-11-26
WO2001094958A2 (en) 2001-12-13
US20050177328A1 (en) 2005-08-11
CA2411349A1 (en) 2001-12-13
WO2001094958A3 (en) 2002-05-23

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