ITTO20080687A1 - Sistema e procedimento per la misurazione della permettivita' dielettrica e della permeabilita' magnetica di un materiale in riflessione/trasmissione. - Google Patents

Sistema e procedimento per la misurazione della permettivita' dielettrica e della permeabilita' magnetica di un materiale in riflessione/trasmissione.

Info

Publication number
ITTO20080687A1
ITTO20080687A1 IT000687A ITTO20080687A ITTO20080687A1 IT TO20080687 A1 ITTO20080687 A1 IT TO20080687A1 IT 000687 A IT000687 A IT 000687A IT TO20080687 A ITTO20080687 A IT TO20080687A IT TO20080687 A1 ITTO20080687 A1 IT TO20080687A1
Authority
IT
Italy
Prior art keywords
permettivity
reflection
procedure
transmission
magnetic permeability
Prior art date
Application number
IT000687A
Other languages
English (en)
Inventor
Claudio Amabile
Filippo Costa
Agostino Monorchio
Enrico Prati
Original Assignee
Consiglio Naz Delle Ricerche Infm Istituto
Univ Pisa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consiglio Naz Delle Ricerche Infm Istituto, Univ Pisa filed Critical Consiglio Naz Delle Ricerche Infm Istituto
Priority to IT000687A priority Critical patent/ITTO20080687A1/it
Publication of ITTO20080687A1 publication Critical patent/ITTO20080687A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G01R27/2641—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells of plate type, i.e. with the sample sandwiched in the middle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G01R27/2647—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells of coaxial or concentric type, e.g. with the sample in a coaxial line
    • G01R27/2652—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells of coaxial or concentric type, e.g. with the sample in a coaxial line open-ended type, e.g. abutting against the sample

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
IT000687A 2008-09-19 2008-09-19 Sistema e procedimento per la misurazione della permettivita' dielettrica e della permeabilita' magnetica di un materiale in riflessione/trasmissione. ITTO20080687A1 (it)

Priority Applications (1)

Application Number Priority Date Filing Date Title
IT000687A ITTO20080687A1 (it) 2008-09-19 2008-09-19 Sistema e procedimento per la misurazione della permettivita' dielettrica e della permeabilita' magnetica di un materiale in riflessione/trasmissione.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT000687A ITTO20080687A1 (it) 2008-09-19 2008-09-19 Sistema e procedimento per la misurazione della permettivita' dielettrica e della permeabilita' magnetica di un materiale in riflessione/trasmissione.

Publications (1)

Publication Number Publication Date
ITTO20080687A1 true ITTO20080687A1 (it) 2010-03-20

Family

ID=40679268

Family Applications (1)

Application Number Title Priority Date Filing Date
IT000687A ITTO20080687A1 (it) 2008-09-19 2008-09-19 Sistema e procedimento per la misurazione della permettivita' dielettrica e della permeabilita' magnetica di un materiale in riflessione/trasmissione.

Country Status (1)

Country Link
IT (1) ITTO20080687A1 (it)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0405587A1 (en) * 1989-06-29 1991-01-02 TA Instruments, Inc. Planar interdigitated dielectric sensor
US5821410A (en) * 1996-09-20 1998-10-13 Regents Of The University Of California Scanning tip microwave near field microscope
US5900618A (en) * 1997-08-26 1999-05-04 University Of Maryland Near-field scanning microwave microscope having a transmission line with an open end
US6538454B1 (en) * 2000-09-08 2003-03-25 Yissum Research Development Company Of The Hebrew University Jerusalem Near field microwave resistivity microscope including a dielectric resonator
US6809533B1 (en) * 1999-09-10 2004-10-26 University Of Maryland, College Park Quantitative imaging of dielectric permittivity and tunability

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0405587A1 (en) * 1989-06-29 1991-01-02 TA Instruments, Inc. Planar interdigitated dielectric sensor
US5821410A (en) * 1996-09-20 1998-10-13 Regents Of The University Of California Scanning tip microwave near field microscope
US5900618A (en) * 1997-08-26 1999-05-04 University Of Maryland Near-field scanning microwave microscope having a transmission line with an open end
US6809533B1 (en) * 1999-09-10 2004-10-26 University Of Maryland, College Park Quantitative imaging of dielectric permittivity and tunability
US6538454B1 (en) * 2000-09-08 2003-03-25 Yissum Research Development Company Of The Hebrew University Jerusalem Near field microwave resistivity microscope including a dielectric resonator

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
LAURINAVICIUS A ET AL: "Non-Destructive Material Homogeneity Evaluation using Scanning Millimeter Wave Beam", PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WA VES AND WORKSHOP ON TERAHERTZ TECHNOLOGIES, THE SIXTH INTERNATIONAL KH ARKOV SYMPOSIUM ON, IEEE, PI, 1 June 2007 (2007-06-01), pages 893 - 895, XP031129615, ISBN: 978-1-4244-1237-2 *
TABIB-AZAR MASSOOD ET AL: "Novel physical sensors using evanescent microwave probes", REVIEW OF SCIENTIFIC INSTRUMENTS, AIP, MELVILLE, NY, US, vol. 70, no. 8, 1 August 1999 (1999-08-01), pages 3381 - 3386, XP012037607, ISSN: 0034-6748 *

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